Granted Patent B2

US 12,659,757 · App. 18/427,904 · Granted Jun 16, 2026

Inventors: Wan-Chi Lee (Hsinchu City, TW); Gyu Bum Kyung (San Jose, CA)

Assignee: MediaTek Inc.

H04W16/28H04B7/06952H04W24/10

Abstract

Claims (33)

1 . A method, comprising:

determining, by a processor of an apparatus, a beam pattern according to at least one of an optimal beam in a previous inference, a beam in use, a previous measurement result and a condition of a channel between the apparatus and a network node;

providing, by the processor, information regarding the beam pattern to the network node;

receiving, by the processor, a measurement configuration from the network node, wherein the measurement configuration comprises information regarding one or more configured beams configured based on the beam pattern;

measuring, by the processor, the configured beams to obtain a measurement result;

providing, by the processor, the measurement result as an input of an artificial intelligence or machine learning model; and

obtaining, by the processor, an output of the artificial intelligence or machine learning model as one or more new optimal beams,

wherein the determining of the beam pattern further comprises selecting more beams close to the optimal beam in the previous inference or close to the beam in use as a part of the beam pattern in an event that a confidence estimation of the optimal beam is higher than a predetermined threshold.

2 . The method of claim 1 , wherein the determining of the beam pattern further comprises:

selecting orthogonal or uncorrelated beams in a direction far away from the optimal beam in the previous inference or the beam in use as a part of the beam pattern.

3 . The method of claim 1 , wherein the determining of the beam pattern further comprises:

concentratedly selecting more beams close to a direction with a received power higher than a predetermined threshold as a part of the beam pattern.

4 . The method of claim 1 , wherein the determining of the beam pattern further comprises:

evenly selecting beams in a spatial domain as a part of the beam pattern in an event that a difference between received power measured in different directions in the spatial domain is less than a predetermined threshold.

5 . The method of claim 1 , wherein the determining of the beam pattern further comprises:

reducing a number of beams in the beam pattern in an event that an indicator value of a channel quality is better than a predetermined threshold.

6 . The method of claim 1 , further comprising:

dynamically adjusting, by the processor, a determination basis for the determining of the beam pattern, wherein the determination basis comprises at least one of the optimal beam in the previous inference, the beam in use, the previous measurement result and the condition of the channel.

7 . A method, comprising:

determining, by a processor of an apparatus, a beam pattern according to at least one of an optimal beam in a previous inference, a transmission beam in use, a measurement result obtained from a user equipment (UE) and a condition of a channel between the apparatus and the UE;

transmitting, by the processor, a measurement configuration comprising information regarding the beam pattern to the UE; receiving, by the processor, a measurement result of one or more transmission beams comprised in the beam pattern from the UE;

providing, by the processor, the measurement result as an input of an artificial intelligence or machine learning model; obtaining, by the processor, an output of the artificial intelligence or learning model as one or more new optimal beams; and

configuring, by the processor, the one or more new optimal beams to the UE, wherein the determining of the beam pattern further comprises selecting more transmission beams close to the optimal beam in the previous inference or close to the transmission beam in use as a part of the beam pattern in an event that a confidence estimation of the optimal beam is higher than a predetermined threshold.

8 . The method of claim 7 , wherein the determining of the beam pattern further comprises:

selecting orthogonal or uncorrelated transmission beams in a direction far away from the optimal beam in the previous inference or the transmission beam in use as a part of the beam pattern.

9 . The method of claim 7 , wherein the determining of the beam pattern further comprises:

concentratedly selecting more transmission beams close to a direction with a measured power higher than a predetermined threshold as a part of the beam pattern.

10 . The method of claim 7 , wherein the determining of the beam pattern further comprises:

evenly selecting transmission beams in a spatial domain as a part of the beam pattern in an event that a difference between received power measured in different directions in the spatial domain is less than a predetermined threshold.

11 . The method of claim 7 , wherein the determining of the beam pattern further comprises:

reducing a number of transmission beams in the beam pattern in an event that an indicator value of a channel quality is better than a predetermined threshold.

12 . The method of claim 7 , further comprising:

dynamically adjusting, by the processor, a determination basis for the determining of the beam pattern, wherein the determination basis comprises at least one of the optimal beam in the previous inference, the transmission beam in use, the measurement result obtained from the UE and the condition of the channel.

Assignments (1)

Continuity (2)

References Cited (18)