METHOD AND APPARATUS FOR AN IMAGING SYSTEM
The present invention provides apparatus for an imaging system including artificial intelligence algorithmic processing components. Imaging systems may include elements that emit electrons, photons or molecules in different examples. Artificial intelligence algorithms may be used to optimize operating parameters of the imaging systems through use of training databases and feedback of metrology obtained during processing.
1 . An imaging apparatus comprising:
a first apparatus comprising a first substrate with a multitude of imaging elements arrayed thereupon, wherein the imaging elements are capable of emitting an imaging signal from their structure to a material sensitive to their emissions on a second surface in a vicinity of the first apparatus,
the second surface to be processed by the imaging apparatus;
an alignment feature and alignment apparatus to measure the alignment feature;
a processor, comprising artificial intelligence algorithms, operant to collect data from imaging apparatus components, process the data and control imaging apparatus components based on the data.
2 . The imaging apparatus of claim 1 wherein the artificial intelligence algorithms are implemented by loading the algorithms into the processor from a data storage component associated with the processor.
3 . The imaging apparatus of claim 1 wherein the artificial intelligence algorithms are implemented at least in part through circuitry of an artificial intelligence chip comprised within the imaging apparatus.
4 . The imaging apparatus of claim 3 wherein the artificial intelligence algorithms, implemented in part through circuitry of an artificial intelligence chip, comprise a convolutional neural network.
5 . The imaging apparatus of claim 3 wherein the artificial intelligence algorithms, implemented in part through circuitry of an artificial intelligence chip, comprise a generational adversarial network.
6 . The imaging apparatus of claim 4 wherein the output of the convolutional neural network is provided to a controlling element that alters a current flowing in one or more of the imaging elements.
7 . The imaging apparatus of claim 6 wherein the multitude of imaging elements emit electrons.
8 . The imaging apparatus of claim 3 wherein the multitude of imaging elements emit photons.
9 . The imaging apparatus of claim 3 wherein the multitude of imaging elements emit molecules.
10 . A method of forming an imaging system comprising:
forming an individual imaging system element;
testing the individual imaging system element;
selecting the individual imaging system element based on compliance to desired specifications;
forming a receiving substrate with electrical interconnect features thereon;
placing selected individual imaging system elements upon the receiving substrate; and
processing the placed selected individual imaging elements to electrically connect them upon the receiving substrate;
testing the imaging system to form test structures;
measuring the test structures;
calculating correction values utilizing result of the measuring;
training an artificial intelligence algorithm utilizing the test structure measuring and correction value experience.
11 . The method of claim 10 wherein the artificial intelligence algorithm processes at least in part on an artificial intelligence integrated circuit.
12 . The method of claim 11 wherein the artificial intelligence algorithm utilizes a convolutional neural network.
13 . The method of claim 12 wherein the convolutional neural network interacts with a generative adversarial network to simulate an imaging result for a set of operating parameters simulated for operation of the imaging system.
14 . The method of claim 12 wherein the imaging system comprises more than 10,000 individual imaging elements.
15 . The method of claim 12 additionally comprising the step of:
including the imaging elements into a toolPod.
16 . The method of claim 15 additionally comprising steps of:
placing the toolPod upon a chassis, wherein the chassis is part of a cleanspace fabricator;
placing a second substrate into the cleanspace fabricator;
placing an imaging sensitive film upon the second substrate; and
performing an imaging process upon the imaging sensitive film upon the second substrate.
17 . The method of claim 12 wherein the imaging elements emit electrons.
18 . The method of claim 12 wherein the imaging elements emit photons.
19 . The method of claim 12 wherein the imaging elements emit molecules.
20 . A method of forming a product comprising:
obtaining an imaging apparatus comprising:
a first apparatus comprising a first substrate with a multitude of imaging elements arrayed thereupon, wherein the imaging elements are capable of emitting an imaging signal from their structure to a material sensitive to their emissions on a second surface in a vicinity of the first apparatus,
the second surface to be processed by the imaging apparatus;
an alignment feature and alignment apparatus to measure the alignment feature;
a processor, comprising an artificial intelligence integrated circuit comprising artificial intelligence algorithms, operant to collect data from imaging apparatus components, process the data and control imaging apparatus components based on the data;
processing a substrate with the imaging apparatus;
measuring a result of the processing of the substrate with the imaging apparatus;
training the artificial intelligence algorithms with the measurement result; and
processing a second substrate with the imaging apparatus as a part of processing steps to form a product.