Shielded detector for charged particle microscopy
Systems, components, and methods for detecting characteristic signals are described. A detector includes a detector cell. The detector cell can be configured to generate an electrical signal in response to a particle incident on an active layer of the detector cell, The active layer can define an absorption surface. The detector can include a filter. The filter can include a membrane of carbon material. The filter can be disposed relative to the detector cell to shield the absorption surface from a subset of the incident particles. The subset of the incident particles can include electrons, ions, and photons. The photons can have an energy less than about 40 eV.
1 . A detector, comprising: a detector cell, configured to generate an electrical signal in response to a particle incident on an active layer of the detector cell, the active layer defining an absorption surface; and
a filter, comprising a membrane of carbon material comprising a layer of nonwoven carbon nanotube felt, the filter being disposed relative to the detector cell to shield the absorption surface from a subset of the incident particles, the subset comprising electrons, ions, and photons, the photons having an energy less than about 40 eV.
2 . The detector of claim 1 , wherein the membrane comprises multiple substantially planar layers of carbon nanotube felt.
3 . The detector of claim 2 , wherein the multiple layers together define a spatially variant transmissivity of the filter.
4 . The detector of claim 1 , wherein the filter comprises a frame in which the layer is disposed.
5 . The detector of claim 4 , further comprising multiple frames including the frame, the multiple frames being individually addressable and individually movable relative to the detector cell.
6 . The detector of claim 1 , defining an aperture substantially parallel with the absorption surface, wherein the detector cell and the filter are configured to accommodate the aperture.
7 . The detector of claim 6 , wherein the detector comprises segments arranged about the aperture, and wherein the filter comprises one or more filter sections disposed to shield one or more of the segments from the subset of incident particles.
8 . The detector of claim 1 , further comprising a shield, moveable relative to the detector cell and the filter and disposed such that the filter is between the detector and the shield.
9 . The detector of claim 1 , further comprising a retaining element, configured to dispose the detector and the filter in a vacuum chamber of a charged particle microscope and to orient the detector relative to a sample stage of the charged particle microscope such that the filter is disposed between the sample stage and the detector.
10 . The detector of claim 1 , wherein the detector comprises a silicon drift detector.
11 . A charged particle beam system, comprising:
a vacuum chamber;
a charged particle beam column, operably coupled with the vacuum chamber and configured to direct a beam of charged particles into the vacuum chamber; a sample stage, disposed in the vacuum chamber; and
a detector, comprising:
a detector, configured to generate an electrical signal in response to a particle incident on an active layer of the detector, the active layer defining an absorption surface oriented toward the sample stage; and
a filter, comprising a membrane of carbon material comprising carbon nanotubes, the filter being disposed between the sample stage and the detector to shield the absorption surface from a subset of the incident particles, the subset comprising electrons, ions, and photons having an energy less than about 40 eV.
12 . The system of claim 11 , wherein the carbon material comprises a layer of nonwoven carbon nanotube felt.
13 . The system of claim 12 , wherein the membrane comprises multiple substantially planar layers of nonwoven carbon nanotube felt.
14 . The system of claim 13 , wherein the multiple layers together define a spatially variant transmissivity of the filter.
15 . The system of claim 11 , wherein the charged particle beam column defines a beam axis, A, and wherein the detector defines an aperture substantially parallel with the absorption surface and substantially aligned with the beam axis, wherein the detector and the filter are configured to accommodate the aperture.
16 . The system of claim 15 , wherein the detector comprises segments arranged about the aperture, and wherein the filter comprises one or more filter sections disposed to shield one or more of the segments from the subset of incident particles.
17 . The system of claim 11 , further comprising a shield, moveable relative to the detector and the filter and disposed such that the filter is between the detector and the shield with respect to the sample stage.