IP Library Granted Patent US 12,676,599
Granted Patent B2
US 12,676,599 · App. 18/478,605 · Granted Jul 7, 2026

Solidly-mounted transversely-excited bulk acoustic resonator split ladder filter

Inventors: Sean McHugh (Santa Barbara, CA); Gregory L. Hey-Shipton (Santa Barbara, CA); Garrett Williams (San Mateo, CA)
Assignee: MURATA MANUFACTURING CO., LTD.
H03H9/6483H03H9/02559H03H9/605H03H9/725
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,676,599
App. No.
18/478,605
Filed
Sep 29, 2023
Granted
Jul 7, 2026
Kind
B2
Art Unit
2843
USPC
333/133
Abstract

Filter devices. A first chip includes a first base, a first piezoelectric membrane having a first thickness, and a first acoustic Bragg reflector sandwiched between the first piezoelectric membrane and the first base. A first interdigital transducer (IDT) of a first solidly-mounted membrane resonator is formed on a surface of the first piezoelectric membrane. A second chip includes a second base, a second piezoelectric membrane having a second thickness less than the first thickness, and a second acoustic Bragg reflector sandwiched between the second piezoelectric membrane and the second base. A second IDT of a second solidly-mounted membrane resonator is formed on a surface of the second piezoelectric membrane. A circuit card is coupled to the first chip and the second chip, the circuit card including at least one conductor for making an electrical connection between the first IDT and the second IDT.

Claims (68)

1 . A filter device, comprising:

a first chip comprising:

a first interdigital transducer (IDT) of a first solidly-mounted resonator on a surface of a first piezoelectric layer,

a first acoustic reflector sandwiched between the first piezoelectric layer and a first base, and

a first dielectric layer having a first thickness on the surface of the first piezoelectric layer;

a second chip comprising:

a second IDT of a second solidly-mounted resonator on a surface of a second piezoelectric layer,

a second acoustic reflector sandwiched between the second piezoelectric layer and a second base, and

a second dielectric layer having a second thickness on the surface of the second piezoelectric layer, wherein the second thickness of the second dielectric layer is different from the first thickness of the first dielectric layer; and

an electrical connection between the first IDT and the second IDT.

2 . The filter device of claim 1 , wherein at least one of the first piezoelectric layer and the second piezoelectric layer are respectively a single-crystal piezoelectric material.

3 . The filter device of claim 1 , wherein a thickness of interleaved fingers of the first IDT is different from a thickness of interleaved fingers of the second IDT.

4 . The filter device of claim 1 , wherein the first piezoelectric layer has a first thickness and the second piezoelectric layer has a second thickness different from the first thickness.

5 . The filter device of claim 1 , wherein the first and second acoustic reflectors each comprise alternating low acoustic impedance and high acoustic impedance layers respectively.

6 . The filter device of claim 5 , wherein the first acoustic reflector and the second acoustic reflector differ in one or more of: a number of layers, a thickness of one or more layers, an ordered sequence of the high and low acoustic impedance layers, a material of the high acoustic impedance layers, and a material of the low acoustic impedance layers.

7 . The filter device of claim 1 , wherein the first chip, the second chip, and the electrical connection collectively form components of a ladder filter circuit.

8 . The filter device of claim 7 , wherein the electrical connection is one of one or more electrical connections and wherein an inductance of one or more of the electrical connections lowers a frequency of a shunt resonator in the ladder filter circuit.

9 . The filter device of claim 7 , wherein:

the first solidly-mounted resonator is a shunt resonator in the ladder filter circuit, and

the second solidly-mounted resonator is a series resonator in the ladder filter circuit.

10 . The filter device of claim 9 , wherein:

the first chip comprises one or more additional shunt resonators of the ladder filter circuit, and

the second chip comprises one or more additional series resonators of the ladder filter circuit.

11 . The filter device of claim 1 , wherein the first dielectric layer is disposed over and between interleaved fingers of the first IDT and the second dielectric layer is disposed over and between interleaved fingers of the second IDT.

12 . The filter device of claim 1 , wherein at least one of the first and second solidly-mounted resonators is a solidly-mounted transversely-excited film bulk acoustic resonator.

13 . The filter device of claim 1 , wherein a pitch between adjacent fingers of the first IDT is different than the pitch between adjacent fingers of the second IDT.

14 . The filter device of claim 1 , wherein a first ordered sequence of the first chip is different from a second ordered sequence of the second chip.

15 . The filter device of claim 1 , wherein an orientation of a crystalline axes of the first piezoelectric layer is different from an orientation of a crystalline axes of the second piezoelectric layer.

16 . The filter device of claim 1 , wherein the first solidly-mounted resonator is part of a transmit filter and the second solidly-mounted resonator is part of a receive filter.

17 . The filter device of claim 1 , wherein the first solidly-mounted resonator and the second solidly-mounted resonator are components of a transmit filter, and wherein the second chip further comprises a receive filter.

18 . The filter device of claim 1 , wherein the first solidly-mounted resonator and the second solidly-mounted resonator are components of a receive filter, and wherein the second chip further comprises a transmit filter.

19 . The filter device of claim 1 , further comprising a circuit card interconnecting the first chip and the second chip, and wherein the circuit card comprises the electrical connection between the first chip and the second chip.

20 . A filter device, comprising:

a first chip comprising:

a first interdigital transducer (IDT) of a first resonator on a surface of a first piezoelectric layer, wherein the first resonator is a first type of resonator comprising a solidly-mounted resonator, and

an acoustic reflector sandwiched between the first piezoelectric layer and a first base;

a second chip comprising:

a second IDT of a second resonator on a surface of a second piezoelectric layer, wherein the second resonator is a second type of resonator different from the first type; and

a circuit card interconnecting the first chip and the second chip, wherein the circuit card includes an electrical connection between the first IDT of the first chip and the second IDT of the second chip.

21 . The filter device of claim 20 , wherein at least one of the first piezoelectric layer and the second piezoelectric layer are respectively a single-crystal piezoelectric material.

22 . The filter device of claim 20 , wherein a thickness of interleaved fingers of the first IDT is different from a thickness of interleaved fingers of the second IDT.

23 . The filter device of claim 20 , wherein the first piezoelectric layer has a first thickness and the second piezoelectric layer has a second thickness different from the first thickness.

24 . The filter device of claim 20 , wherein the acoustic reflector comprises alternating low acoustic impedance and high acoustic impedance layers.

25 . The filter device of claim 20 , wherein the first resonator comprises a transversely excited solidly-mounted resonator and the second resonator comprises a floating-diaphragm transversely excited resonator.

26 . The filter device of claim 20 , wherein the first chip, the second chip, and the electrical connection collectively form components of a ladder filter circuit.

27 . The filter device of claim 26 , wherein the electrical connection is one of one or more electrical connections and wherein an inductance of one or more of the electrical connections lowers a frequency of a shunt resonator in the ladder filter circuit.

28 . The filter device of claim 26 , wherein:

the first resonator is a shunt resonator in the ladder filter circuit, and

the second resonator is a series resonator in the ladder filter circuit.

29 . The filter device of claim 28 , wherein:

the first chip comprises one or more additional shunt resonators of the ladder filter circuit, and

the second chip comprises one or more additional series resonators of the ladder filter circuit.

30 . The filter device of claim 20 , further comprising a first dielectric layer having a first thickness on the surface of the first piezoelectric layer and a second dielectric layer having a second thickness on the surface of the second piezoelectric layer, wherein the second thickness of the second dielectric layer is different from the first thickness of the first dielectric layer.

31 . The filter device of claim 30 , wherein the first dielectric layer is disposed over and between interleaved fingers of the first IDT and the second dielectric layer is disposed over and between interleaved fingers of the second IDT.

32 . The filter device of claim 20 , wherein a pitch between adjacent fingers of the first IDT is different than the pitch between adjacent fingers of the second IDT.

33 . The filter device of claim 20 , wherein a first ordered sequence of the first chip is different from a second ordered sequence of the second chip.

34 . The filter device of claim 20 , wherein an orientation of a crystalline axes of the first piezoelectric layer is different from an orientation of a crystalline axes of the second piezoelectric layer.

35 . The filter device of claim 20 , wherein the first resonator is part of a transmit filter and the second resonator is part of a receive filter.

36 . The filter device of claim 20 , wherein the first resonator and the second resonator are components of a transmit filter, and wherein the second chip further comprises a receive filter.

37 . The filter device of claim 20 , wherein the first resonator and the second resonator are components of a receive filter, and wherein the second chip further comprises a transmit filter.

38 . The filter device of claim 20 , wherein the resonators differ by type in terms of being series or shunt resonators, wherein the first resonator is a series resonator and the second resonator is a shunt resonator, the second resonator further comprising an acoustic reflector sandwiched between the second piezoelectric layer and a second base.

39 . A filter device comprising:

a first chip comprising:

a first interdigital transducer (IDT) of a first resonator on a surface of a first piezoelectric layer, wherein the first resonator is a transversely excited solidly-mounted resonator, and

an acoustic reflector sandwiched between the first piezoelectric layer and a first base;

a second chip comprising:

a second IDT of a second resonator on a surface of a second piezoelectric layer, wherein the second resonator is a floating-diaphragm transversely excited resonator; and

an electrical connection between the first IDT and the second IDT.

Continuity (4)
Continuation 17097238 · Nov 13, 2020
Continuation 16727304 · Dec 26, 2019
Provisional Application 62865798 · Jun 24, 2019
Related Publication 20240030896A1 · Jan 25, 2024
References Cited (223)
US 5705399A · Larue · 1998 [cited by applicant]
US 5853601A · Krishaswamy et al. · 1998 [cited by applicant]
US 6540827B1 · Levy et al. · 2003 [cited by applicant]
US 6707229B1 · Martin · 2004 [cited by applicant]
US 7135940B2 · Kawakubo et al. · 2006 [cited by applicant]
US 7312674B2 · Duwel et al. · 2007 [cited by applicant]
US 7463118B2 · Jacobsen · 2008 [cited by applicant]
US 7498904B2 · Ohara et al. · 2009 [cited by applicant]
US 7535152B2 · Ogami et al. · 2009 [cited by applicant]
US 7684109B2 · Godshalk et al. · 2010 [cited by applicant]
US 7802466B2 · Whalen et al. · 2010 [cited by applicant]
US 7868519B2 · Umeda · 2011 [cited by applicant]
US 8278802B1 · Lee et al. · 2012 [cited by applicant]
US 8344815B2 · Yamanaka · 2013 [cited by applicant]
US 8829766B2 · Milyutin et al. · 2014 [cited by applicant]
US 8932686B2 · Hayakawa et al. · 2015 [cited by applicant]
US 9130145B2 · Martin et al. · 2015 [cited by applicant]
US 9219466B2 · Meltaus et al. · 2015 [cited by applicant]
US 9276557B1 · Nordquist et al. · 2016 [cited by applicant]
US 9369105B1 · Li · 2016 [cited by applicant]
US 9425765B2 · Rinaldi · 2016 [cited by applicant]
US 9525398B1 · Olsson · 2016 [cited by applicant]
US 9748923B2 · Kando et al. · 2017 [cited by applicant]
US 9780759B2 · Kimura et al. · 2017 [cited by applicant]
US 10200013B2 · Bower et al. · 2019 [cited by applicant]
US 10284176B1 · Solal · 2019 [cited by applicant]
US 10305447B2 · Raihn et al. · 2019 [cited by applicant]
US 10491192B1 · Plesski et al. · 2019 [cited by applicant]
US 10601392B2 · Plesski et al. · 2020 [cited by applicant]
US 10637438B2 · Garcia et al. · 2020 [cited by applicant]
US 10756697B2 · Plesski et al. · 2020 [cited by applicant]
US 10790802B2 · Yantchev et al. · 2020 [cited by applicant]
US 10797675B2 · Plesski · 2020 [cited by applicant]
US 10826462B2 · Plesski et al. · 2020 [cited by applicant]
US 10868513B2 · Yantchev · 2020 [cited by applicant]
US 10917072B2 · McHugh · 2021 [cited by examiner]
US 11955952B2 · McHugh · 2024 [cited by examiner]
US 20020079986A1 · Ruby et al. · 2002 [cited by applicant]
US 20020158714A1 · Kaitila et al. · 2002 [cited by applicant]
US 20030199105A1 · Kub et al. · 2003 [cited by applicant]
US 20040041496A1 · Imai et al. · 2004 [cited by applicant]
US 20040090145A1 · Bauer et al. · 2004 [cited by applicant]
US 20040207033A1 · Koshido · 2004 [cited by applicant]
US 20040207485A1 · Kawachi et al. · 2004 [cited by applicant]
US 20040261250A1 · Kadota et al. · 2004 [cited by applicant]
US 20050280476A1 · Abe et al. · 2005 [cited by applicant]
US 20060072875A1 · Bhagavatula et al. · 2006 [cited by applicant]
US 20060125489A1 · Feucht et al. · 2006 [cited by applicant]
US 20060131731A1 · Sato · 2006 [cited by applicant]
US 20060152107A1 · Tanaka · 2006 [cited by applicant]
US 20060222568A1 · Wang et al. · 2006 [cited by applicant]
US 20070001549A1 · Kando et al. · 2007 [cited by applicant]
US 20070090898A1 · Kando · 2007 [cited by applicant]
US 20070170565A1 · Hong et al. · 2007 [cited by applicant]
US 20070188047A1 · Tanaka · 2007 [cited by applicant]
US 20070194863A1 · Shibata et al. · 2007 [cited by applicant]
US 20100064492A1 · Tanaka · 2010 [cited by applicant]
US 20100102669A1 · Yamanaka · 2010 [cited by applicant]
US 20100107388A1 · Iwamoto · 2010 [cited by applicant]
US 20100123367A1 · Tai et al. · 2010 [cited by applicant]
US 20100212127A1 · Heinze et al. · 2010 [cited by applicant]
US 20100223999A1 · Onoe · 2010 [cited by applicant]
US 20100301703A1 · Chen et al. · 2010 [cited by applicant]
US 20110109196A1 · Goto · 2011 [cited by applicant]
US 20110199163A1 · Yamanaka · 2011 [cited by applicant]
US 20110278993A1 · Iwamoto · 2011 [cited by applicant]
US 20130015353A1 · Tai et al. · 2013 [cited by applicant]
US 20130021116A1 · Sogoya et al. · 2013 [cited by applicant]
US 20130057360A1 · Meltaus et al. · 2013 [cited by applicant]
US 20130127565A1 · Nishihara et al. · 2013 [cited by applicant]
US 20130234805A1 · Takahashi · 2013 [cited by applicant]
US 20130321100A1 · Wang · 2013 [cited by applicant]
US 20140001919A1 · Komatsu · 2014 [cited by applicant]
US 20140009032A1 · Takahashi et al. · 2014 [cited by applicant]
US 20140113571A1 · Fujiwara · 2014 [cited by applicant]
US 20140145556A1 · Kadota · 2014 [cited by applicant]
US 20140151151A1 · Reinhardt · 2014 [cited by applicant]
US 20140152145A1 · Kando et al. · 2014 [cited by applicant]
US 20140173862A1 · Kando et al. · 2014 [cited by applicant]
US 20140218129A1 · Fujiwara · 2014 [cited by applicant]
US 20140225684A1 · Kando et al. · 2014 [cited by applicant]
US 20140312994A1 · Meltaus et al. · 2014 [cited by applicant]
US 20150033521A1 · Watanabe et al. · 2015 [cited by applicant]
US 20150070227A1 · Kishino et al. · 2015 [cited by applicant]
US 20150319537A1 · Perois et al. · 2015 [cited by applicant]
US 20150333730A1 · Meltaus · 2015 [cited by applicant]
US 20160028367A1 · Shealy · 2016 [cited by applicant]
US 20160182009A1 · Bhattacharjee · 2016 [cited by applicant]
US 20160285430A1 · Kikuchi et al. · 2016 [cited by applicant]
US 20170005638A1 · Otagawa et al. · 2017 [cited by applicant]
US 20170063332A1 · Gilbert et al. · 2017 [cited by applicant]
US 20170077902A1 · Daimon · 2017 [cited by applicant]
US 20170104470A1 · Koelle et al. · 2017 [cited by applicant]
US 20170170808A1 · Iwaki et al. · 2017 [cited by applicant]
US 20170179928A1 · Raihn et al. · 2017 [cited by applicant]
US 20170187352A1 · Omura · 2017 [cited by applicant]
US 20170214387A1 · Burak et al. · 2017 [cited by applicant]
US 20170222618A1 · Inoue et al. · 2017 [cited by applicant]
US 20170222622A1 · Solal et al. · 2017 [cited by applicant]
US 20170264263A1 · Huang et al. · 2017 [cited by applicant]
US 20170324394A1 · Ebner et al. · 2017 [cited by applicant]
US 20170359050A1 · Irieda et al. · 2017 [cited by applicant]
US 20170370791A1 · Nakamura et al. · 2017 [cited by applicant]
US 20180062604A1 · Koskela et al. · 2018 [cited by applicant]
US 20180123016A1 · Gong et al. · 2018 [cited by applicant]
US 20180152169A1 · Goto et al. · 2018 [cited by applicant]
US 20180191322A1 · Chang et al. · 2018 [cited by applicant]
US 20180262179A1 · Goto et al. · 2018 [cited by applicant]
US 20180269849A1 · Matsumoto · 2018 [cited by examiner]
US 20190068164A1 · Houlden et al. · 2019 [cited by applicant]
US 20190074813A1 · Zou et al. · 2019 [cited by applicant]
US 20190123721A1 · Takamine · 2019 [cited by applicant]
US 20190131953A1 · Gong · 2019 [cited by applicant]
US 20190148621A1 · Feldman et al. · 2019 [cited by applicant]
US 20190181833A1 · Nosaka · 2019 [cited by applicant]
US 20190245518A1 · Ito · 2019 [cited by applicant]
US 20190273480A1 · Lin · 2019 [cited by applicant]
US 20190273481A1 · Michigami · 2019 [cited by applicant]
US 20190386635A1 · Plesski et al. · 2019 [cited by applicant]
US 20190386637A1 · Plesski et al. · 2019 [cited by applicant]
US 20190386638A1 · Kimura et al. · 2019 [cited by applicant]
US 20200007110A1 · Konaka et al. · 2020 [cited by applicant]
US 20200021271A1 · Plesski et al. · 2020 [cited by applicant]
US 20200021272A1 · Segovia et al. · 2020 [cited by applicant]
US 20200091893A1 · Plesski et al. · 2020 [cited by applicant]
US 20200162052A1 · Matsuoka et al. · 2020 [cited by applicant]
US 20200220522A1 · Nosaka · 2020 [cited by applicant]
US 20200228087A1 · Michigami et al. · 2020 [cited by applicant]
US 20200304091A1 · Yantchev · 2020 [cited by applicant]
US 20200328728A1 · Nakagawa et al. · 2020 [cited by applicant]
US 20200336130A1 · Turner · 2020 [cited by applicant]
US 20200373907A1 · Garcia · 2020 [cited by applicant]
US 20210006228A1 · Garcia · 2021 [cited by applicant]
US 20210013859A1 · Turner et al. · 2021 [cited by applicant]
US 20210013868A1 · Plesski · 2021 [cited by applicant]
US 20210126619A1 · Wang et al. · 2021 [cited by applicant]
US 20210152154A1 · Tang et al. · 2021 [cited by applicant]
US 20210273631A1 · Jachowski et al. · 2021 [cited by applicant]
US 20210384885A1 · Daimon et al. · 2021 [cited by applicant]
US 20220052669A1 · Schãufele et al. · 2022 [cited by applicant]
US 20220103160A1 · Jachowski · 2022 [cited by applicant]
US 20220116014A1 · Poirel · 2022 [cited by applicant]
US 20220216842A1 · Nagatomo et al. · 2022 [cited by applicant]
US 20220231661A1 · McHugh · 2022 [cited by applicant]
CN 1926763A · 2007 [cited by applicant]
CN 201893487U · 2011 [cited by applicant]
CN 112352382A · 2021 [cited by applicant]
DE 112011100580T5 · 2013 [cited by applicant]
JP H0522074A · 1993 [cited by applicant]
JP H06152299A · 1994 [cited by applicant]
JP H10209804A · 1998 [cited by applicant]
JP 2001244785A · 2001 [cited by applicant]
JP 2002300003A · 2002 [cited by applicant]
JP 2003078389A · 2003 [cited by applicant]
JP 2004096677A · 2004 [cited by applicant]
JP 2004129222A · 2004 [cited by applicant]
JP 2004304622A · 2004 [cited by applicant]
JP 2005295496 · 2005 [cited by examiner]
JP 2006173557A · 2006 [cited by applicant]
JP 2007251910A · 2007 [cited by applicant]
JP 2010103803A · 2010 [cited by applicant]
JP 2010109949A · 2010 [cited by applicant]
JP 2010233210A · 2010 [cited by applicant]
JP 2012049758A · 2012 [cited by applicant]
JP 2013110655A · 2013 [cited by applicant]
JP 2013528996A · 2013 [cited by applicant]
JP 2013214954A · 2013 [cited by applicant]
JP 2015054986A · 2015 [cited by applicant]
JP 2016001923A · 2016 [cited by applicant]
JP 2017220910A · 2017 [cited by applicant]
JP 2018166259A · 2018 [cited by applicant]
JP 2018207144A · 2018 [cited by applicant]
JP 2019186655A · 2019 [cited by applicant]
JP 2020088459A · 2020 [cited by applicant]
JP 2020113939A · 2020 [cited by applicant]
WO 2010047114A1 · 2010 [cited by applicant]
WO 2013021948A1 · 2013 [cited by applicant]
WO 2013128636A1 · 2013 [cited by applicant]
WO 2015098694A1 · 2015 [cited by applicant]
WO 2015156232A1 · 2015 [cited by applicant]
WO 2015182521A1 · 2015 [cited by applicant]
WO 2016017104A1 · 2016 [cited by applicant]
WO 2016052129A1 · 2016 [cited by applicant]
WO 2016147687A1 · 2016 [cited by applicant]
WO 2018003273A1 · 2018 [cited by applicant]
WO 2018079522A1 · 2018 [cited by applicant]
WO 2018163860A1 · 2018 [cited by applicant]
WO 2019138810A1 · 2019 [cited by applicant]
WO 2019241174A1 · 2019 [cited by applicant]
WO 2020092414A2 · 2020 [cited by applicant]
WO 2020175234A1 · 2020 [cited by applicant]
WO 2021060523A1 · 2021 [cited by applicant]
WO 2023002858A1 · 2023 [cited by applicant]
Machine English Translation of JP2005295496 Published on Oct. 20, 2005 (Year: 2005). [cited by examiner]
T. Takai, H. Iwamoto, et al., “I.H.P. Saw Technology and its Application to Microacoustic Components (Invited).” 2017 IEEE International Ultrasonics Symposium, Sep. 6-9, 2017. pp. 1-8. [cited by applicant]
R. Olsson III, K. Hattar et al. “A high electromechanical coupling coefficient SH0 Lamb wave lithiumniobate micromechanical resonator and a method for fabrication” Sensors and Actuators A: Physical, vol. 209, Mar. 1, 20… [cited by applicant]
M. Kadota, S. Tanaka, “Wideband acoustic wave resonators composed of hetero acoustic layer structure,” Japanese Journal of Applied Physics, vol. 57, No. 7S1. Published Jun. 5, 2018. 5 pages. [cited by applicant]
Y. Yang, R. Lu et al. “Towards Ka Band Acoustics: Lithium Niobat Asymmetrical Mode Piezoelectric MEMS Resonators”, Department of Electrical and Computer Engineering University of Illinois at Urbana-Champaign, May 2018. … [cited by applicant]
Y. Yang, A. Gao et al. “5 GHZ Lithium Niobate MEMS Resonators With High Fom of 153”, 2017 IEEE 30th International Conference in Micro Electro Mechanical Systems (MEMS). Jan. 22-26, 2017. pp. 942-945. [cited by applicant]
USPTO/ISA, International Search Report and Written Opinion for PCT Application No. PCT/US2019/036433 dated Aug. 29, 2019. [cited by applicant]
USPTO/ISA, International Search Report and Written Opinion for PCT Application No. PCT/US2019/058632 dated Jan. 17, 2020. [cited by applicant]
G. Manohar, “Investigation of Various Surface Acoustic Wave Design Configurations for Improved Sensitivity.” Doctoral dissertation, University of South Florida, USA, Jan. 2012, 7 pages. [cited by applicant]
Ekeom, D. & Dubus, Bertrand & Volatier, A.. (2006). Solidly mounted resonator (SMR) FEM-BEM simulation. 1474-1477. 10.1109/ULTSYM.2006.371. [cited by applicant]
Mizutaui, K. and Toda, K., “Analysis of lamb wave propagation characteristics in rotated Y-cut X-propagation LiNbO3 plates.” Electron. Comm. Jpn. Pt. I, 69, No. 4 (1986): 47-55. doi:10.1002/ecja.4410690406. [cited by applicant]
Naumenko et al., “Optimal orientations of Lithium Niobate for resonator SAW filters”, 2003 IEEE Ultrasonics Symposium—pp. 2110-2113. (Year: 2003). [cited by applicant]
Webster Dictionary “Meaning of diaphragm” Merriam Webster since 1828. [cited by applicant]
Safari et al. “Piezoelectric for Transducer Applications” published by Elsevier Science Ltd., pp. 4 (Year: 2000). [cited by applicant]
Moussa et al. Review on Triggered Liposomal Drug Delivery with a Focus on Ultrasound 2015, Bentham Science Publishers, pp. 16 (Year 2005). [cited by applicant]
“Acoustic Properties of Solids” ONDA Corporation, 592 Weddell Drive, Sunnyvale, CA 94089, Apr. 11, 2003, pp. 5 (Year 2003). [cited by applicant]
Bahreynl, B., “Fabrication and Design of Resonant Microdevices” Andrew William, Inc. 2018, NY (Year 2008). [cited by applicant]
Material Properties of Tibtech Innovations, © 2018 Tibtech Innovations (Year 2018). [cited by applicant]
Bousquet, Marie e al. “Single-mode high frequency LiNbO3 Film Bulk Acoustic Resonator,” 2019 IEEE International Ultrasonics Symposium (IUS), Glasgow, Scotland, Oct. 6-9, 2019, pp. 84-87. [cited by applicant]
Wikipedia contributors, “Quartz crystal microbalance,” Wikipedia, The Free Encyclopedia, https://en.wikipedia.org/w/index.php?title=Quartz_crystal_microbalance&oldid=1009990186 (accessed Apr. 9, 2021). [cited by applicant]
Yantchev, Ventsislav & Katardjiev, Ilia. (2013). Thin film Lamb wave resonators in frequency control and sensing applications: A review. Journal of Micromechanics and Microengineering. 23. 043001.10.1088/0960-1317/23/4/… [cited by applicant]
Wei Pang et al. “Analytical and experimental study on the second harmonic mode response of a bulk acoustic wave resonator” 2010 J. Micromech. Microeng. 20 115015; doi:10.1088/0960-1317/20/11/115015. [cited by applicant]
Durmus et al. “Acoustic-Based Biosensors” Encyclopedia of Microfluidics and Nanofluidics. DOI 10.1007/978-3-642-27758-0_10-2 Springer Science+Business Media New York 2014. [cited by applicant]
USPTO/ISA, International Search Report and Written Opinion for PCT Application No. PCT/US2023/017732 dated Jul. 27, 2023. [cited by applicant]
USPTO/ISA, International Search Report and Written Opinion for PCT Application No. PCT/US2022/082421 dated May 3, 2023. [cited by applicant]
USPTO/ISA, International Search Report and Written Opinion for PCT Application No. PCT/US2022/081095 dated May 30, 2023. [cited by applicant]
USPTO/ISA, International Search Report and Written Opinion for PCT Application No. PCT/US2022/079236 dated Mar. 10, 2023. [cited by applicant]
USPTO/ISA, International Search Report and Written Opinion for PCT Application No. PCT/US2022/081068 dated Apr. 18, 2023. [cited by applicant]
USPTO/ISA, International Search Report and Written Opinion for PCT Application No. PCT/US2022/080246 dated Mar. 30, 2023. [cited by applicant]
Gong et al.,“Design and Analysis of Lithium-Niobate-Based High Electromechanical Coupling RF-MEMS Resonators for Wideband Filtering”, IEEE Transactions on Microwave Theory and Techniques, vol. 61, No. 1, Jan. 2013, pp. … [cited by applicant]