Granted Patent B2

US 12,301,204 · App. 18/487,751 · Granted May 13, 2025

Inventors: Ventsislav Yantchev (Sofia, BG); Bryant Garcia (Mississauga, CA); Viktor Plesski (Gorgier, CH); Soumya Yandrapalli (Lausanne, CH); Robert B. Hammond (Rockville, MD); Patrick Turner (Portola Valley, CA); Jesson John (Dublin, CA)

Assignee: MURATA MANUFACTURING CO., LTD.

H03H9/02228H03H3/02H03H9/02031H03H9/132H03H9/175H03H9/176H03H9/562H03H9/564H03H9/568H03H2003/025

Abstract

Claims (31)

1. An acoustic resonator comprising:

an acoustic mirror;

a piezoelectric layer on the acoustic mirror, the piezoelectric layer having a thickness between 100 nanometers and 1500 nanometers; and

an interdigital transducer (IDT) on the piezoelectric layer, the IDT configured to laterally excite a bulk acoustic wave.

2. The acoustic resonator of claim 1 , wherein a ratio of a pitch of the interleaved fingers is between 2 and 20 times a width of the interleaved fingers.

3. The acoustic resonator of claim 1 , wherein the acoustic mirror is a Bragg reflector.

4. The acoustic resonator of claim 1 , wherein the acoustic mirror comprises a plurality of dielectric layers alternating between high acoustic impedance layers and low acoustic impedance layers.

5. The acoustic resonator of claim 1 , wherein each of the plurality of dielectric layers of the acoustic mirror has a thickness that is approximately one-quarter of a wavelength of the bulk acoustic wave.

6. The acoustic resonator of claim 4 , wherein:

the high acoustic impedance layers are one of silicon nitride and aluminum nitride, and

the low acoustic impedance layers are silicon oxycarbide.

7. The acoustic resonator of claim 6 , wherein the plurality of layers includes at least four layers and not more than seven layers.

8. The acoustic resonator of claim 1 , wherein the piezoelectric layer has a thickness of 200 nanometers to 500 nanometers.

9. The acoustic resonator of claim 1 , wherein the piezoelectric layer comprises one of lithium niobate, lithium tantalate, lanthanum gallium silicate, gallium nitride, and aluminum nitride.

10. The acoustic resonator of claim 1 , wherein the lateral excitation is based on the direction of an electric field excited by the IDT in the piezoelectric layer, the electric field being predominantly lateral, while a wave propagation is substantially orthogonal to a surface of the piezoelectric layer and orthogonal to the direction of the electric field.

11. The acoustic resonator of claim 1 , wherein at least a portion of the piezoelectric layer that is overlapped by the IDT is directly coupled to the acoustic mirror.

12. The acoustic resonator of claim 1 , wherein a z-axis of the piezoelectric layer is normal to the front and back surfaces, and wherein the IDT is oriented such that the interleaved fingers of the IDT are parallel to an x-axis of the piezoelectric layer.

13. The acoustic resonator of claim 1 , wherein a pitch of the interleaved fingers of the IDT is greater than or equal to 2 times the thickness of the piezoelectric layer and less than or equal to 25 times the thickness of the piezoelectric layer.

14. The acoustic resonator of claim 1 , wherein the acoustic mirror is either directly attached to the piezoelectric layer or via one or more intermediate layers.

15. A laterally excited bulk acoustic wave resonator comprising:

an acoustic mirror;

a piezoelectric layer coupled to the acoustic mirror, the piezoelectric layer comprising a thickness that is between 200 nanometers and 500 nanometers; and

an interdigital transducer (IDT) on the piezoelectric layer opposite the acoustic mirror and having a plurality of interleaved fingers,

wherein the piezoelectric layer is configured such that a predominantly lateral atomic motion is generated in response to a radio frequency signal applied to the IDT.

16. The laterally excited bulk acoustic wave resonator of claim 15 , wherein a ratio of a pitch of the interleaved fingers is between 2 and 20 times a width of the interleaved fingers.

17. The laterally excited bulk acoustic wave resonator of claim 15 ,

wherein the acoustic mirror is a Bragg reflector that comprises a plurality of dielectric layers alternating between high acoustic impedance layers and low acoustic impedance layers, and

wherein each of the plurality of dielectric layers of the Bragg reflector has a thickness that is approximately one-quarter of a wavelength of a bulk acoustic wave excited by the IDT when the radio frequency signal is applied thereto.

18. The laterally excited bulk acoustic wave resonator of claim 15 , wherein the piezoelectric layer comprises one of lithium niobate, lithium tantalate, lanthanum gallium silicate, gallium nitride, and aluminum nitride.

19. The laterally excited bulk acoustic wave resonator of claim 15 , wherein at least a portion of the piezoelectric layer that is overlapped by the IDT is directly coupled to the acoustic mirror.

20. The laterally excited bulk acoustic wave resonator of claim 15 , wherein the acoustic mirror is configured to at least partially reflect acoustic waves introduced by the predominantly lateral atomic motion.

Assignments (2)

Continuity (12)

References Cited (216)