IP Library › Granted Patent US 12,287,366
Granted Patent B2
US 12,287,366 · App. 18/500,127 · Granted Apr 29, 2025

Automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback

Inventor: Andreas Hantsch (Heidelberg, DE)
Assignee: Advantest Corporation
G01R31/2834G01R31/2822G01R31/2844G01R31/31716
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Quick Facts
Patent No.
US 12,287,366
App. No.
18/500,127
Granted
Apr 29, 2025
Kind
B2
Abstract

An embodiment is an automated test equipment (ATE) for testing a device under test (DUT) which is connected to the ATE via a load board. The ATE includes a stimulus module, a measurement module, a loopback, a first switch, a second switch, and a load board interface. The load board interface includes a first radio frequency port and a second radio frequency port. The first and second radio frequency ports are configured to be coupled to the respective ports of the load board. The first switch is configured to couple the first radio frequency port to the stimulus module in a first switching state of the first switch and the second switch is configured to couple the second radio frequency port to the measurement module in a first switching state of the second switch. Further, the first switch is configured to couple the first radio frequency port to a first end of the loopback in a second switching state of the first switch and the second switch is configured to couple the second radio frequency port to a second end of the loopback in a second switching state of the second switch. When the first and second switches are in their respective second switching state, a loopback signal path is formed between the first and second radio frequency ports.

Claims (42)

1. An automated test equipment comprising:

first and second switches;

first and second radio frequency ports operable to couple to a device under test (DUT) comprising a transmitter and a receiver; and

a loopback comprising a terminal, an opposite terminal disposed opposite the terminal, and a loopback transmission line disposed between the terminal and the opposite terminal,

wherein the first and second switches are configurable to include:

a first state, wherein a loopback signal path is formed and comprises the first switch coupled to the first radio frequency port and coupled to the terminal, the loopback transmission line, and the second switch coupled to the opposite terminal and coupled to the second radio frequency port.

2. The automated test equipment of claim 1 , wherein the loopback signal path allows a DUT self-test.

3. The automated test equipment of claim 2 , wherein the DUT self-test comprises transmission of a signal by the transmitter to the receiver via the loopback signal path.

4. The automated test equipment of claim 2 , wherein the DUT self-test comprises a DUT mission mode self-test.

5. The automated test equipment of claim 2 , wherein the DUT self-test comprises a DUT built-in self-test.

6. The automated test equipment of claim 2 , further comprising:

a stimulus module; and

a measurement module.

7. The automated test equipment of claim 6 , wherein in a second state, a first and a second signal path are formed, wherein the first signal path comprises the first switch coupled to the first radio frequency port and coupled to the stimulus module, wherein the second signal path comprises the second switch coupled to the measurement module and coupled to the second radio frequency port, wherein the receiver is operable to receive first test signals from the stimulus module via the first signal path, and wherein the transmitter is operable to provide second test signals to the measurement module via the second signal path.

8. An automated test equipment comprising:

a stimulus module and a measurement module;

a plurality of signal paths, wherein individual ones of the signal paths comprise a plurality of switches coupled to multiple of the signal paths;

first and second radio frequency ports operable to couple to a device under test (DUT) comprising a transmitter and a receiver; and

a plurality of loopbacks, wherein a first signal direction of at least one of the loopbacks is opposite a second signal direction of at least one of the loopbacks, wherein a switch state of the plurality of switches implements which one of the stimulus module, the measurement module, or one of the loopbacks is coupled to the first radio frequency port and determines which one of the stimulus module, the measurement module, or one of the loopbacks is coupled to the second radio frequency port.

9. The automated test equipment of claim 8 , wherein at least one of the loopbacks comprises at least one power adjusting element.

10. The automated test equipment of claim 9 , wherein the at least one power adjusting element comprises at least one of an attenuator or an amplifier.

11. The automated test equipment of claim 9 , further comprising:

a coupler switch; and

a coupler operable to couple a first portion of a signal from a first portion of a loopback signal path to the measurement module via the coupler switch and at least one of the plurality of switches, wherein the loopback signal path comprises one of the loopbacks, and wherein the loopback signal path is disposed between the first radio frequency port and the second radio frequency port.

12. The automated test equipment of claim 11 , wherein the first portion of the loopback signal path is between the at least one power adjusting element and the first radio frequency, further comprising:

a second coupler operable to couple a second portion of the signal from a second portion of the loopback signal path between the at least one power adjusting element and the second radio frequency port to the measurement module via the coupler switch and the at least one of the plurality of switches.

13. The automated test equipment of claim 12 , wherein the coupler switch is operable to couple one of the coupler or the second coupler to the measurement module via the at least one of the switches.

14. The automated test equipment of claim 13 , wherein the switch state of the plurality of switches determines which one of the first radio frequency port or the second radio frequency port is coupled to the stimulus module and determines which one of the first radio frequency port, the second radio frequency port, or the coupler switch is coupled to the measurement module.

15. The automated test equipment of claim 14 , wherein the receiver is operable to receive first test signals from the stimulus module, and wherein the transmitter is operable to provide second test signals to the measurement module.

16. An automated test system comprising:

an automated test equipment (ATE) comprising

first and second switches,

a load board interface including first and second radio frequency ports, and

a loopback comprising a terminal, an opposite terminal disposed opposite the terminal, and a loopback transmission line disposed between the terminal and the opposite terminal; and

a load board operable to dock with the load board interface, wherein the load board comprises respective ports operable to respectively couple to the first and second radio frequency ports, and

at least one socket configured to receive a first type of device under test (DUT) comprising a transmitter and a receiver, wherein the first type of DUT is operable to receive and to provide test signals between the load board interface and respective ports of the load board,

wherein in a first state, a loopback signal path is formed and comprises the first switch coupled to the first radio frequency port and coupled to the terminal, the loopback transmission line, and the second switch coupled to the opposite terminal and coupled to the second radio frequency port.

17. The automated test system of claim 16 , further comprising:

a different load board operable to replace the load board and to dock with the load board interface, wherein the different load board comprises at least one socket configured to receive a second type of device under test (DUT).

18. The automated test system of claim 16 , wherein the at least one socket comprises a plurality of connectors operable to couple to the first type of DUT and operable to couple to the first and second radio frequency ports via the load board.

19. The automated test system of claim 16 , wherein the loopback signal path allows a DUT self-test.

20. The automated test system of claim 16 , wherein in a second sate state, first and second signal paths are formed, wherein the first signal path comprises the first switch coupled to the first radio frequency port and coupled to a stimulus module, wherein the second signal path comprises the second switch coupled to a measurement module and coupled to the second radio frequency port, wherein the receiver is operable to receive first test signals from the stimulus module via the first signal path and the load board, and wherein the transmitter is operable to provide second test signals to the measurement module via the second signal path and the load board.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2025
From: HANTSCH, ANDREAS
To: ADVANTEST CORPORATION
Reel/Frame 070331/0798 →
Continuity (3)
Continuation 17720980 · Apr 14, 2022
Continuation PCTEP2020083412 · Nov 25, 2020
Related Publication 20240061034A1 · Feb 22, 2024
References Cited (15)
US 4646299A · Schinabeck et al. · 1987 [cited by applicant]
US 6268735B1 · Craig · 2001 [cited by examiner]
US 7313496B2 · Ishida et al. · 2007 [cited by applicant]
US 9041421B2 · Peng · 2015 [cited by examiner]
US 9588173B2 · Isaac · 2017 [cited by examiner]
US 9806828B2 · Wilson · 2017 [cited by applicant]
US 9863976B2 · Sarhad · 2018 [cited by examiner]
US 9985733B1 · Lee · 2018 [cited by examiner]
US 10110325B2 · Chen · 2018 [cited by examiner]
US 10320494B2 · Chung · 2019 [cited by examiner]
US 11334459B2 · Bautista · 2022 [cited by applicant]
US 11913987B2 · Hantsch · 2024 [cited by examiner]
US 20060146318A1 · Adam et al. · 2006 [cited by applicant]
US 20060184332A1 · Ishida et al. · 2006 [cited by applicant]
US 20160204881A1 · Chung et al. · 2016 [cited by applicant]