IP Library Granted Patent US 12,470,209
Granted Patent B2
US 12,470,209 · App. 18/502,502 · Granted Nov 11, 2025

Clock-speed control circuit and methods for a dynamic comparator

Inventors: Mukul Agarwal (Bengaluru, IN); Subodh Prakash Taigor (Bengaluru, IN)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H03K5/249H03K5/00006H03K19/20
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Quick Facts
Patent No.
US 12,470,209
App. No.
18/502,502
Granted
Nov 11, 2025
Kind
B2
Abstract

A method to control a clock speed of a dynamic comparator may include sensing, by a clock speed control circuit, an output of the dynamic comparator to determine at least one failure in the dynamic comparator. Thereafter, the method may include reducing, by the clock speed control circuit, a frequency of a clock signal used to control the clock speed of the dynamic comparator, based on the determined at least one failure in the dynamic comparator.

Claims (32)

1 . A method of controlling a clock speed of a dynamic comparator, comprising:

sensing, by a clock speed control circuit, an output of the dynamic comparator to determine at least one failure in the dynamic comparator; and

reducing, by the clock speed control circuit, a frequency of a clock signal used to control the dynamic comparator, based on the determined at least one failure in the dynamic comparator.

2 . The method as claimed in claim 1 , further comprising determining the at least one failure when an operating speed of the dynamic comparator is slower than a threshold speed.

3 . The method as claimed in claim 2 , further comprising determining, by an AND gate of the clock speed control circuit, the operating speed as slower than the threshold speed when all outputs of the dynamic comparator remain at a pre-charged value in a comparison phase.

4 . The method as claimed in claim 3 , further comprising:

receiving, by a Finite State Machine (FSM) of the clock speed control circuit, an output from the AND gate;

changing, by the FSM of the clock speed control circuit, a time-period state of the clock signal, when the received operating speed is slower than the threshold speed; and

generating, by the FSM of the clock speed control circuit, at least one control signal for controlling the clock speed of the dynamic comparator, based on the change of the time-period state of the clock signal.

5 . The method as claimed in claim 4 , further comprising:

receiving, by an oscillator (OSC) of the clock speed control circuit, the generated at least one control signal from the FSM; and

reducing, by the OSC of the clock speed control circuit, the frequency of the clock signal to increase the clock time period according to the operating speed of the dynamic comparator, based on the received at least one control signal.

6 . A clock speed control circuit for a dynamic comparator, comprising:

an AND gate configured for sensing an output of the dynamic comparator for determining at least one failure in the dynamic comparator; and

a Finite State Machine (FSM) configured for generating at least one control signal for controlling a clock speed of a clock signal of the dynamic comparator, based on the determined at least one failure in the dynamic comparator.

7 . The clock speed control circuit as claimed in claim 6 , wherein the AND gate determines the at least one failure when an operating speed of the dynamic comparator is slower than a threshold speed.

8 . The clock speed control circuit as claimed in claim 7 , wherein the AND gate determines the operating speed as slower than the threshold speed when all outputs of the dynamic comparator remain at a pre-charged value in a comparison phase.

9 . The clock speed control circuit as claimed in claim 6 , wherein the FSM changes a time-period state of a clock signal and generates the at least one control signal based on the change of the time-period state.

10 . The clock speed control circuit as claimed in claim 6 , wherein the clock speed control circuit comprises an oscillator (OSC) for reducing a frequency of the clock signal for controlling the dynamic comparator based on the generated at least one control signal.

11 . The clock speed control circuit as claimed in claim 10 , wherein the OSC reduces the frequency of the clock signal when the operating speed of the dynamic comparator is below a threshold speed.

12 . A method of controlling a clock speed of a dynamic comparator, comprising:

receiving, by a clock speed control circuit, an output of the dynamic comparator to determine a failure in the dynamic comparator; and

changing, by the clock speed control circuit, a frequency of a clock signal used to control the dynamic comparator, based on the determined failure in the dynamic comparator.

13 . The method as claimed in claim 12 , further comprising determining the failure based on an operating speed of the dynamic comparator being slower than a threshold speed.

14 . The method as claimed in claim 13 , further comprising determining, by an AND gate of the clock speed control circuit, the operating speed as slower than the threshold speed when all outputs of the dynamic comparator remain at a pre-charged value in a comparison phase.

15 . The method as claimed in claim 14 , further comprising:

receiving, by a Finite State Machine (FSM) of the clock speed control circuit, an output from the AND gate;

changing, by the FSM of the clock speed control circuit, a time-period state of the clock signal, when the received operating speed is slower than the threshold speed; and

generating, by the FSM of the clock speed control circuit, at least one control signal for controlling the clock speed of the dynamic comparator, based on the change of the time-period state of the clock signal.

16 . The method as claimed in claim 15 , further comprising:

receiving, by an oscillator (OSC) of the clock speed control circuit, the generated at least one control signal from the FSM; and

reducing, by the OSC of the clock speed control circuit, the frequency of the clock signal to increase the clock time period according to the operating speed of the dynamic comparator, based on the received at least one control signal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2023
From: AGARWAL, MUKUL; TAIGOR, SUBODH PRAKASH
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 065625/0218 →
Priority Claims (1)
IN 202341021250 · Mar 24, 2023 · national
Continuity (1)
Related Publication 20240322807A1 · Sep 26, 2024
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