Systems and methods to perform electroluminescence and photoluminescence characterization in the field on photovoltaic modules, strings, and arrays
View Patent ↗Photoluminescence and electroluminescence are essential characterization techniques for photovoltaics cells and modules. For electroluminescence, the main technical challenge is easily injecting current into the photovoltaic to cause luminescence. The technique described herein enables daylight electroluminescence imaging without the need for external power sources. For photoluminescence, characterization is performed on photovoltaic cells, modules, strings, and arrays in daylight and without temporary mounting of LED modulators. Instead, the modulation is performed using a permanent electronic module installed within the electric circuit on the DC side. This enables automation or triggering of modulation on demand, 100% inspection without changes in hardware configuration because the cells are never shaded and provides a path to high throughput imaging.
1. A method for determining damage to a photovoltaic cell, sub-string, module, string, or subarray in a photovoltaic array using electroluminescence, the method comprising:
using a device connected to a current generating photovoltaic cell, substring, module, string, subarray, or array, the device electrically, magnetically, or otherwise connected to the current generating photovoltaic cell, substring, module, string, subarray, or array to increase the voltage of the current generating photovoltaic cell, substring, module, string, subarray, or array with respect to a current sinking photovoltaic cell, substring, module, string, subarray, or array;
taking an equivalent voltage condition image of the current sinking photovoltaic cell, sub-string, module, string, subarray, or array with an imaging apparatus while connected to the current generating photovoltaic cell, substring, module, string, subarray, or array;
modifying the photovoltaic cell, sub-string, module, string, subarray, or array configuration to push current from one or more current sourcing cell, sub-string, module, string, subarray, or array into one or more current sinking cell, sub-string, module, string, subarray, or array;
taking an increased voltage condition image of the current sinking photovoltaic cell, sub-string, module, string, subarray, or array with an imaging apparatus; and
subtracting one of the equivalent voltage condition image from the increased voltage condition image to determine damage to the photovoltaic cell, substring, module, string, subarray, or array,
wherein the electroluminescence is performable in day light without an external energy source.
2. The method of claim 1 , wherein modifying string voltage comprises shortening one or more strings by one or more modules so that the one or more shortened strings consume current generated by unshortened strings in the array.
3. The method of claim 1 , wherein modifying string voltage comprises lengthening one or more strings by one or more modules so that the one or more lengthened strings force current into unlengthened strings in the array.
4. The method of claim 1 , wherein modifying string voltage comprises using a DC to DC converter to boost voltage of one or more current sourcing strings to allow current to flow to one or more current sinking strings.
5. The method of claim 1 , wherein the equivalent voltage image is taken before the modified voltage image.
6. The method of claim 1 , wherein the modified voltage image is taken before the equivalent voltage image.
7. The method of claim 1 , further comprising modulating current during at least one of the equivalent voltage image and the modified voltage image.
8. The method of claim 7 , wherein a band pass filter and/or a cut-off filter is used on the imaging apparatus to limit photons hitting an imaging detector of the imaging apparatus to improve the signal to noise ratio.
9. The method of claim 8 , wherein the equivalent voltage condition image comprises a single exposure image.
10. The method of claim 8 , wherein the modified voltage condition image comprises a single exposure image.
11. The method of claim 8 , wherein the equivalent voltage condition image comprises an averaged image from multiple exposure images.
12. The method of claim 8 , wherein the modified voltage condition image comprises an averaged image from multiple exposure images.
13. A method for determining damage to a photovoltaic cell, substring, module, string, or subarray, in a photovoltaic array using photoluminescence, the method comprising:
using an electronic module connected to the photovoltaic module, string, subarray, or array to change an operating point of the photovoltaic cell, substring, module, string, subarray, or array from an operating point to a near short circuit condition, the electronic module electrically, magnetically, optically or otherwise connected to the photovoltaic cell, substring, module, string, subarray, or array;
taking a near short circuit condition image of the photovoltaic cell, substring, module, string, subarray, or array with an imaging apparatus;
using the electronic module to change the operating point of the photovoltaic cell, substring, module, string, subarray, or array to a near open circuit condition;
taking a near open circuit condition image of the photovoltaic cell, substring, module, string, subarray, or array with the imaging apparatus; and
subtracting one of the near short circuit condition image and the near open circuit condition image from the other of the near short circuit condition image and the near open circuit condition image to determine damage to the photovoltaic cell, sub-string, module, string, subarray, or array,
wherein the photoluminescence is performable in day light without an external energy source and the electronic module can remain connected to the photovoltaic module, string, subarray, or array.
14. The method of claim 13 , wherein the near open circuit image is taken before the near short circuit image.
15. The method of claim 13 , wherein the short circuit image is taken before the near open circuit image.
16. The method of claim 13 , further comprising modulating current in preparation to image at least one of the near open circuit image or near short circuit image.
17. The method of claim 13 , wherein a regular bandpass filter about the emission wavelength of silicon is used on the imaging apparatus to improve the signal to noise ratio.
18. The method of claim 13 , wherein at least one of the near short circuit condition image and the near open circuit condition comprises a single exposure image.
19. The method of claim 13 , wherein at least one of the near short circuit condition image and the near open circuit condition comprises an averaged image from multiple exposure images.
20. A system for determining damage to a photovoltaic cell, sub-string, module, string, or subarray in a photovoltaic array using electroluminescence, the system comprising:
a device connected to a current generating photovoltaic cell, substring, module, string, subarray, or array, the device electrically, magnetically, or otherwise connected to the current generating photovoltaic cell, substring, module, string, subarray, or array to increase the voltage of the current generating photovoltaic cell, substring, module, string, subarray, or array with respect to a current sinking photovoltaic cell, substring, module, string, subarray, or array;
a device for modifying the photovoltaic cell, sub-string, module, string, subarray, or array configuration to push current from one or more current sourcing cell, sub-string, module, string, subarray, or array into one or more current sinking cell, sub-string, module, string, subarray, or array;
an imaging apparatus for taking an equivalent voltage condition image of the current sinking photovoltaic cell, sub-string, module, string, subarray, or array and for taking an increased voltage condition image of the current sinking photovoltaic cell, sub-string, module, string, subarray, or array with an imaging apparatus; and
an image processor for subtracting one of the equivalent voltage condition image from the increased voltage condition image to determine damage to the photovoltaic cell, substring, module, string, subarray, or array,
wherein the electroluminescence is performable in day light without an external energy source.