IP Library › Patent Application 18515593
Patent Application
App. No. 18/515,593

SHIELDED APPARATUS FOR ION ENERGY ANALYSIS OF PLASMA PROCESSES

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Quick Facts
Patent No.
US None
App. No.
18/515,593
Abstract

An apparatus for obtaining ion energy distribution measurements in a plasma processing system comprising a substrate, a plurality of ion energy sensors each having associated control circuitry disposed in the substrate, and a conductive enclosure disposed in the substrate and surrounding each ion energy sensor and associated control circuitry such that the substrate at least partially surrounds the conductive enclosure.

Claims (16)

1 . An apparatus for obtaining ion energy distribution measurements in a plasma processing system comprising:

a substrate;

a plurality of ion energy sensors each having associated control circuitry disposed in the substrate; and

a conductive enclosure disposed in the substrate and surrounding each ion energy sensor and associated control circuitry such that the substrate at least partially surrounds the conductive enclosure.

2 . The apparatus of claim 1 , wherein the substrate is non-conductive.

3 . The apparatus of claim 1 , wherein the substrate is conductive.

4 . The apparatus of claim 3 , further comprising an insulating layer between the substrate and the conductive enclosure.

5 . The apparatus of claim 1 , wherein the substrate is semi-conducting.

6 . The apparatus of claim 5 , wherein the substrate is silicon.

7 . The apparatus of claim 5 , further comprising a semi-conducting cover on a surface of the substrate.

8 . The apparatus of claim 7 , wherein the semi-conducting cover is silicon or Germanium.

9 . The apparatus of claim 7 , wherein the ion energy sensors measure energy distribution at a first surface of the substrate and a cover is provided at a second surface of the substrate opposite to the first surface.

10 . The apparatus of claim 2 , further comprising an RF antenna disposed in the substrate outside of the conductive enclosure.

11 . The apparatus of claim 10 , wherein the RF antenna is connected to the control circuitry.

12 . The apparatus of claim 10 , wherein the RF antenna is disposed in the non-conductive substrate.

13 . The apparatus of claim 12 , wherein each ion energy sensor and associated control circuitry are provided on a circuit board.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 12, 2025
From: IMPEDANS LTD
To: APPLIED MATERIALS, INC.
Reel/Frame 072242/0638 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 28, 2023
From: GAHAN, DAVID; SCULLIN, PAUL
To: IMPEDANS LTD
Reel/Frame 065686/0616 →