Systems and methods for analyzing electrical signals to identify and manage stress conditions, risk states or aging states associated with capacitors
Systems and methods identify and manage stress conditions, risk states or aging states associated with capacitors associated with electrical equipment in an electrical power system. In one aspect, the systems and methods analyze electrical signals associated with the at least one capacitor and/or information from or derived from the electrical signals to identify possible stress conditions, risk states or aging states associated with the at least one capacitor and associated components. In response to identifying possible stress conditions, risk states or aging states, probable impacts of the possible stress conditions, risk states or aging states on the at least one capacitor and associated components may be determined. At least one action to monitor, warn a user or system, or alert a user or system, or to reduce or eliminate the possible stress conditions, risk states or aging states may be taken based, at least in part, on the determined impacts.
1 . A method for identifying and managing stress conditions, risk state or aging state associated with at least one capacitor associated with an electrical device in an electrical power system, comprising:
measuring electrical signals associated with the at least one capacitor or information derived from the electrical signals, the electrical signals including at least one of voltage and current signals;
determining at least one characteristic of the electrical signals associated with the at least one capacitor or the information derived from the electrical signals;
analyzing the at least one characteristic of the electrical signals associated the at least one capacitor or information derived from the electrical signals by identifying at least one of a predictive pattern and abnormality indicative of a possible stress condition, risk state or aging state associated with the at least one capacitor or associated components;
identifying a possible stress condition, risk state or aging state associated with the at least one capacitor or associated components based on the analysis;
in response to identifying a possible stress condition, risk state or aging state, determining at least one probable impact of the possible stress condition, risk state or aging state on the at least one capacitor or associated components; and
taking at least one action based on the at least one determined impact, the at least one action including to discard or record the identification, to inform a user or a system of the identification, or to reduce or eliminate the possible stress condition, risk state or aging state.
2 . The method of claim 1 , wherein the electrical signals are measured by at least one electrical signal measuring device.
3 . The method of claim 2 , wherein the at least one electrical signal measuring device is positioned proximate to the at least one capacitor for measuring the electrical signals.
4 . The method of claim 2 , wherein the at least one electrical signal measuring device is positioned remote from the at least one capacitor for measuring the electrical signals.
5 . The method of claim 1 , wherein the at least one of the predictive pattern and the abnormality is used to identify the possible stress condition, risk state or aging state trends and probable impacts.
6 . The method of claim 1 , wherein the at least one characteristic of the electrical signals is analyzed for trends and steady state changes, including decreases in current over time, wherein the decreases in current signals over time are indicative of a possible stress condition, risk state or aging state.
7 . The method of claim 1 , wherein the at least one characteristic of the electrical signals is analyzed for at least one of a duration, an increase, a decrease or a shape of current signals or voltage during energizing of the at least one capacitor, wherein the duration, the increase or decrease or shape of the current or voltage are indicative of a possible stress condition, risk state or aging state.
8 . The method of claim 1 , wherein the at least one characteristic of the electrical signals is analyzed for an event start, wherein certain characteristics or features of the event start are indicative of a possible stress condition, risk state or aging state.
9 . The method of claim 1 , wherein the at least one characteristic of the electrical signals is analyzed for an event end, wherein certain characteristics or features of the event end are indicative of a possible stress condition, risk state or aging state.
10 . The method of claim 1 , wherein the at least one characteristic of the electrical signals is analyzed for an ongoing event, wherein certain characteristics or features of the ongoing event are indicative of a possible stress condition, risk state or aging state.
11 . The method of claim 1 , wherein the at least one characteristic of the electrical signals is analyzed for harmonics, wherein fluctuations in the harmonics are indicative of a possible stress condition, risk state or aging state.
12 . The method of claim 1 , wherein the at least one characteristic of the electrical signals is analyzed for occurrence of a breakdown event, wherein the occurrence of a breakdown event is indicative of a possible stress condition, risk state or aging state.
13 . The method of claim 1 , further comprising analyzing measured temperature(s) and/or pressure(s) associated with the at least one capacitor to identify a possible stress condition, risk state or aging state.
14 . The method of claim 13 , wherein the measured temperature(s) and/or pressure(s) is/are analyzed for increases over time, wherein the increases over time are indicative of a possible stress condition, risk state or aging state.
15 . The method of claim 13 , wherein the temperature(s) and/or pressure(s) is/are measured by at least one temperature or pressure sensing device proximate to the at least one capacitor.
16 . The method of claim 1 , wherein the at least one action further includes decoupling one or more capacitors of the at least one capacitor from an electrical system including the at least one capacitor.
17 . The method of claim 1 , wherein the at least one action further includes triggering at least one warning or alarm to indicate the possible stress condition, risk state or aging state.
18 . The method of claim 1 , wherein the at least one action further includes triggering at least one cooling device to reduce a temperature of the at least one capacitor.
19 . A computer-readable medium storing computer-readable instructions for causing a processing device to perform a method according to claim 1 .
20 . A system for identifying and managing stress conditions, risk state or aging state associated with at least one capacitor associated with electrical equipment in an electrical power system, comprising:
at least one electrical signal measuring device configured to measure electrical signals associated with the at least one capacitor, the electrical signals including at least one of voltage and current signals; and
at least one processing device coupled to the at least one electrical signal measuring device, the at least one processing device configured to:
determine at least one characteristic of the electrical signals associated with the at least one capacitor;
analyze the at least one characteristic of the electrical signals or information derived from the electrical signals by identifying at least one of a predictive pattern and abnormality indicative of a possible stress condition, risk state or aging state associated with the at least one capacitor or associated components;
identify a possible stress condition, risk state or aging state associated with the at least one capacitor or associated components based on the analysis;
in response to identifying a possible stress condition, risk state or aging state, determine at least one probable impact of the possible stress condition, risk state or aging state on the at least one capacitor or associated components; and
taking at least one action based on the at least one determined impact, the at least one action including to discard or record the identification, to inform a user or a system of the identification, or to reduce or eliminate the possible stress condition, risk state or aging state.
21 . The system of claim 20 , wherein the at least one processing device is configured to identify the possible stress condition, risk state or aging state by comparing the at least one of the predictive pattern and abnormality to at least one of a threshold, signature, shape of electrical signals, and known abnormality.
22 . The method of claim 21 , wherein the at least one electrical signal measuring device is positioned proximate to the at least one capacitor for measuring the electrical signals.
23 . The method of claim 21 , wherein the at least one electrical signal measuring device is positioned remote from to the at least one capacitor for measuring the electrical signals.
24 . The system of claim 20 , wherein the at least one of the predictive pattern and the abnormality is used to identify the possible stress condition, risk state or aging state trends and probable impacts.
25 . The system of claim 20 , wherein the at least one characteristic of the electrical signals is analyzed for trends and steady state changes such as decreases in current over time, wherein the decreases in current signals over time are indicative of a possible stress condition, risk state or aging state.
26 . The system of claim 20 , wherein the at least one characteristic of the electrical signals is analyzed for at least one of a duration, an increase, a decrease, or a shape of current signals or voltage during energizing of the at least one capacitor, wherein the duration, the increase, the decrease or the shape of the current or voltage are indicative of a possible stress condition, risk state or aging state.
27 . The system of claim 20 , wherein the at least one characteristic of the electrical signals is analyzed for an event start, wherein certain characteristics or features of the event start are indicative of a possible stress condition, risk state or aging state.
28 . The system of claim 20 , wherein the at least one characteristic of the electrical signals is analyzed for an event end, wherein certain characteristics or features of the event end are indicative of a possible stress condition, risk state or aging state.
29 . The system of claim 20 , wherein the at least one characteristic of the electrical signals is analyzed for an ongoing event, wherein certain characteristics or features of the ongoing event are indicative of a possible stress condition, risk state or aging state.
30 . The system of claim 20 , wherein the at least one characteristic of the electrical signals is analyzed for harmonics, wherein fluctuations in the harmonics are indicative of a possible stress condition, risk state or aging state.
31 . The system of claim 20 , wherein the at least one characteristic of the electrical signals is analyzed for occurrence of a breakdown event, wherein the occurrence of a breakdown event is indicative of a possible stress condition, risk state or aging state.
32 . The system of claim 20 , further comprising at least one temperature and/or pressure sensing device proximate to the at least one capacitor and configured to measure temperature(s) and/or pressure(s) associated with the at least one capacitor, wherein the at least one processing device is further configured to analyze measured the temperature(s) and/or pressure(s) associated with the at least one capacitor to identify the possible stress condition, risk state or aging state.
33 . The system of claim 32 , wherein the measured temperature(s) and/or pressure(s) is/are analyzed for increases over time, wherein the increases over time are indicative of a possible stress condition, risk state or aging state.
34 . The system of claim 20 , further comprising:
at least one control device coupled to the at least one processing device and the at least one capacitor, the at least one control device configured to:
receive at least one control signal from the processing device in response to the at least one processing device identifying the possible stress condition, risk state or aging state; and
take at least one action to warn or alert a user or a system, or to reduce or eliminate the possible stress condition, risk state or aging state in response to receiving the at least one control signal.
35 . The system of claim 34 , wherein the at least one action further includes decoupling one or more capacitors of the at least one capacitor from an electrical system including the at least one capacitor.
36 . The system of claim 34 , wherein the at least one action further includes triggering at least one alarm to indicate the possible stress condition, risk state or aging state.
37 . The system of claim 34 , wherein the at least one action further includes triggering at least one cooling device to reduce a temperature of the at least one capacitor in response to receiving the control signal.