Granted Patent B2

US 12,601,796 · App. 18/580,616 · Granted Apr 14, 2026

Inventors: Norikazu Mizuochi (Kyoto, JP); Ernst David Herbschleb (Kyoto, JP); Hiroki Morishita (Kyoto, JP); Hiroya Saito (Kyoto, JP); Hiroshige Deguchi (Kyoto, JP); Natsuo Tatsumi (Kyoto, JP); Tsukasa Hayashi (Kyoto, JP)

Assignees: Kyoto University; NISSIN ELECTRIC CO., LTD.

G01R33/1284G01R33/032G01R33/26

Abstract

Claims (35)

1 . A phase difference measurement device, comprising:

an electromagnetic irradiation unit, repeatedly irradiating a quantum sensor element with electromagnetic waves for manipulating an electron spin state of the quantum sensor element which changes via interaction with a first physical field or a second physical field generated by an alternating current (AC) signal; and

a phase difference measurement unit, acquiring a plurality of the electron spin states after the interaction with the first physical field or the second physical field, and measuring a phase difference between a plurality of physical fields based on the plurality of the electron spin states acquired, wherein

the phase difference measurement unit comprises

a first physical field phase calculation unit that calculates a phase of the first physical field based on the plurality of the electron spin states after the interaction with the first physical field, and

a second physical field phase calculation unit that calculates a phase of the second physical field based on the plurality of the electron spin states after the interaction with the second physical field, and

measures the phase difference based on the phase of the first physical field calculated and the phase of the second physical field calculated.

2 . The phase difference measurement device according to claim 1 , wherein

the first physical field phase calculation unit calculates the phase of the first physical field by fitting a plurality of time-series data corresponding to the plurality of the electron spin states after the interaction with the first physical field, and

the second physical field phase calculation unit calculates the phase of the second physical field by fitting a plurality of time-series data corresponding to the plurality of the electron spin states after the interaction with the second physical field.

3 . The phase difference measurement device according to claim 1 , wherein the electromagnetic irradiation unit is a pulse sequence for observing a free induction decay (FID) signal of the electron spin state, and repeatedly irradiates the quantum sensor element with the electromagnetic waves in a pulse sequence comprising a plurality of π/2 pulses.

4 . The phase difference measurement device according to claim 2 , wherein

the electromagnetic irradiation unit is a pulse sequence for observing a spin echo signal of the electron spin state, and repeatedly irradiates the quantum sensor element with the electromagnetic waves in a pulse sequence comprising a plurality of π/2 pulses and π pulses between the plurality of π/2 pulses, and

each of the first physical field phase calculation unit and the second physical field phase calculation unit fits the plurality of time-series data corresponding to curvature of the AC signal.

5 . The phase difference measurement device according to claim 1 , wherein

the phase difference measurement unit further comprises

a light irradiation unit that irradiates the quantum sensor element with light for reading phase information of the electron spin state after the interaction with the first physical field or the second physical field,

a change detection unit that detects a change that occurs in the quantum sensor element due to irradiation of the light, and

a data processing unit that reads phase information of the electron spin state from the change detected and

measures the phase difference between the phase of the first physical field and the phase of the second physical field based on the phase information of the electron spin state that is read.

6 . The phase difference measurement device according to claim 5 , further comprising:

a pulse pattern generator, outputting a pulse signal for operation timing to the electromagnetic irradiation unit and the light irradiation unit using a fluorescence intensity when initializing the electron spin state as a trigger, and correcting a deviation in a measurement cycle.

7 . The phase difference measurement device according to claim 6 , wherein the pulse signal for operation timing is connected in series between a plurality of the phase difference measurement devices.

8 . The phase difference measurement device according to claim 1 , wherein the AC signal is an AC signal passing through electrical equipment.

9 . A phase difference measurement method, comprising:

irradiating repeatedly a quantum sensor element with electromagnetic waves for manipulating an electron spin state of the quantum sensor element which changes via interaction with a first physical field or a second physical field generated by an alternating current (AC) signal; and

acquiring a plurality of the electron spin states after the interaction with the first physical field or the second physical field, and measuring a phase difference between a phase of the first physical field and a phase of the second physical field based on the plurality of the electron spin states acquired, wherein

measuring the phase difference comprises

calculating the phase of the first physical field based on the plurality of the electron spin states after the interaction with the first physical field, and

calculating the phase of the second physical field based on the plurality of the electron spin states after the interaction with the second physical field, and

measuring the phase difference based on the phase of the first physical field calculated and the phase of the second physical field calculated.

10 . The phase difference measurement method according to claim 9 , wherein

when calculating the phase of the first physical field, the phase of the first physical field is calculated by fitting a plurality of time-series data corresponding to the plurality of the electron spin states after the interaction with the first physical field, and

when calculating the phase of the second physical field, the phase of the second physical field is calculated by fitting a plurality of time-series data corresponding to the plurality of the electron spin states after the interaction with the second physical field.

11 . Electrical equipment, comprising the phase difference measurement device according to claim 1 .

Assignments (1)

Priority Claims (1)

Continuity (1)

References Cited (24)