Spectroscopic analysis apparatus comprising a multi-chamber cuvette for fluid or gas analysis and corresponding method
A spectroscopic analysis apparatus comprises a multi-chamber cuvette for fluid or gas analysis, wherein the multi-chamber cuvette comprises at least two measurement chambers into which fluid or gas can be introduced for analysis, wherein the at least two measurement chambers are optically separated from one another, wherein an illumination device is provided to generate light and to couple the light into the at least one first and second measurement chamber, and wherein a detection device is provided to measure an intensity of the light radiated by the fluid or gas in the first measurement chamber for a first wavelength and to generate a first measurement result and to measure an intensity of the light radiated by the fluid or gas in the second measurement chamber for a second wavelength and to generate a second measurement result, wherein the first wavelength and the second wavelength are different.
1 . A spectroscopic analysis apparatus comprising:
a multi-chamber cuvette for fluid or gas analysis, wherein the multi-chamber cuvette comprises at least two measurement chambers into which fluid or gas can be introduced for analysis, wherein the at least two measurement chambers comprise at least a first measurement chamber and a second measurement chamber, and wherein the multi-chamber cuvette is a single-piece extruded part,
wherein the at least two measurement chambers are optically separated from one another,
wherein an illumination device is provided that is configured to generate light and to couple the light into the at least one first and second measurement chamber,
wherein a detection device is provided that is configured to measure an intensity of the light radiated by the fluid or gas in the first measurement chamber for a first wavelength and to generate a first measurement result and that is further configured to measure an intensity of the light radiated by the fluid or gas in the second measurement chamber for a second wavelength and to generate a second measurement result, wherein the first wavelength and the second wavelength are different, and
wherein the first measurement chamber and the second measurement chamber are separated from one another by a single common partition wall, and wherein a first length of the first measurement chamber is equal to a second length of the second measurement chamber.
2 . The spectroscopic analysis apparatus according to claim 1 ,
wherein the detection device is configured to generate the first measurement result and the second measurement result in parallel.
3 . The spectroscopic analysis apparatus according to claim 1 ,
wherein the multi-chamber cuvette comprises at least a first reference measurement chamber and a second reference measurement chamber, wherein the illumination device is configured to couple light into the first and second reference measurement chambers, and wherein the detection device is configured to:
a) measure an intensity of the light radiated through the first reference measurement chamber for the first wavelength and to generate a first reference measurement result; and
b) measure an intensity of the light radiated through the second reference measurement chamber for the second wavelength and to generate a second reference measurement result.
4 . The spectroscopic analysis apparatus according to claim 3 ,
wherein the first and the second reference measurement chambers are optically separated from one another and optically separated from the first and the second measurement chambers.
5 . The spectroscopic analysis apparatus according to claim 3 ,
wherein the detection device is configured to compensate the first measurement result with the first reference measurement result, and wherein the detection device is configured to compensate the second measurement result with the second reference measurement result.
6 . The spectroscopic analysis apparatus according to claim 3 ,
wherein the detection device is configured to average the first measurement result over time and to average the second measurement result over time.
7 . The spectroscopic analysis apparatus according to claim 3 ,
wherein the first reference measurement chamber:
a) is free of the fluid or gas to be analyzed; or
b) comprises a reference fluid or a reference gas; and
wherein the second reference measurement chamber:
a) is free of the fluid or gas to be analyzed; or
b) comprises a reference fluid or a reference gas.
8 . The spectroscopic analysis apparatus according to claim 3 ,
wherein the first measurement chamber and the first reference measurement chamber are designed identically to one another and/or wherein the second measurement chamber and the second reference measurement chamber are designed identically to one another and/or wherein the at least one first measurement chamber and the second measurement chamber are designed identically to one another and/or wherein the at least one first reference measurement chamber and the second reference measurement chamber are designed identically to one another.
9 . The spectroscopic analysis apparatus according to claim 3 ,
wherein a first filter arrangement is provided and is configured to filter out wavelengths from the light generated by the illumination device so that the light that is radiated through the first measurement chamber and through the first reference measurement chamber only includes the first wavelength and/or wherein a second filter arrangement is provided and is configured to filter out wavelengths from the light generated by the illumination device so that the light that is radiated through the second measurement chamber and through the second reference measurement chamber only includes the second wavelength.
10 . The spectroscopic analysis apparatus according to claim 9 ,
wherein the illumination device is configured to generate a broadband light that at least includes light of the first and the second wavelengths.
11 . The spectroscopic analysis apparatus according to claim 3 ,
wherein the illumination device comprises at least a first light source and a second light source, wherein the first light source is configured to generate light with only the first wavelength, wherein the first light source is configured to couple the generated light into the first measurement chamber and into the first reference measurement chamber, and wherein the second light source is configured to generate light with only the second wavelength, wherein the second light source is configured to couple the generated light into the second measurement chamber and into the second reference measurement chamber.
12 . The spectroscopic analysis apparatus according to claim 3 , wherein the illumination device is configured to couple light with the first wavelength centrally into the first measurement chamber and into the first reference measurement chamber and to couple light with the second wavelength centrally into the second measurement chamber and into the second reference measurement chamber, wherein a first optical waveguide is arranged at a center of a first end face of the first measurement chamber or the first reference measurement chamber, and wherein a second optical waveguide is arranged at a center of a first end face of the second measurement chamber or the second reference measurement chamber.
13 . The spectroscopic analysis apparatus according to claim 3 ,
wherein the illumination device comprises at least a first light source that is configured to generate a first light with the first wavelength, and wherein the illumination device comprises at least a second light source that is configured to generate a second light with the second wavelength, wherein the first light source is arranged directly at the first measurement chamber and the first reference measurement chamber such that the generated first light radiates into both the first measurement chamber and the first reference measurement chamber or is arranged spaced apart from the first measurement chamber and the first reference measurement chamber so that the generated first light can be fed via a respective first optical waveguide to the first measurement chamber and the first reference measurement chamber, and wherein the second light source is arranged directly at the second measurement chamber and the second reference measurement chamber such that the generated second light radiates into both the second measurement chamber and the second reference measurement chamber or is arranged spaced apart from the second measurement chamber and the second reference measurement chamber so that the generated second light can be fed via a respective second optical waveguide to the second measurement chamber and the second reference measurement chamber.
14 . The spectroscopic analysis apparatus according to claim 3 ,
wherein the first measurement chamber and the first reference measurement chamber each comprise a photodiode, a pyroelectric detector, an image sensor or an optopneumatic detector, and/or
wherein the second measurement chamber and the second reference measurement chamber each comprise a photodiode, a pyroelectric detector, an image sensor or an optopneumatic detector.
15 . The spectroscopic analysis apparatus according to claim 1 ,
wherein the spectroscopic analysis apparatus is configured to:
a) feed the same fluid or the same gas to the first measurement chamber and the second measurement chamber; or
b) feed a different fluid or a different gas to the first measurement chamber and the second measurement chamber.
16 . The spectroscopic analysis apparatus according to claim 1 ,
wherein the spectroscopic analysis apparatus is free of a chopper wheel and/or a filter wheel.
17 . A method for the spectroscopic analysis of fluid or gas using a multi-chamber cuvette, wherein the multi-chamber cuvette comprises at least two measurement chambers into which fluid or gas can be introduced for analysis, wherein the at least two measurement chambers comprise at least a first measurement chamber and a second measurement chamber, wherein the first measurement chamber and the second measurement chamber are separated from one another by a single common partition wall, wherein a first length of the first measurement chamber is equal to a second length of the second measurement chamber, wherein the multi-chamber cuvette is a single-piece extruded part, wherein the at least two measurement chambers are optically separated from one another, wherein an illumination device and a detection device are provided, and wherein the method comprises:
generating light by the illumination device and coupling the light into the first and second measurement chambers;
measuring an intensity of the light radiated by the fluid or the gas in the first measurement chamber for a first wavelength and generating a first measurement result by the detection device; and
measuring an intensity of the light radiated by the fluid or the gas in the second measurement chamber for a second wavelength and generating a second measurement result by the detection device, wherein the first wavelength and the second wavelength are different.
18 . The spectroscopic analysis apparatus according to claim 3 , further comprising:
a common first image sensor configured to simultaneously receive the light radiated through the first measurement chamber and the light radiated through the first reference measurement chamber; and/or
a common second image sensor configured to simultaneously receive the light radiated through the second measurement chamber and the light radiated through the second reference measurement chamber.
19 . The spectroscopic analysis apparatus according to claim 3 , further comprising a common image sensor configured to simultaneously receive the light radiated through the first and second measurement chambers and the light radiated through the first and second reference measurement chambers.