IP Library Granted Patent US 12,423,201
Granted Patent B1
US 12,423,201 · App. 18/607,627 · Granted Sep 23, 2025

Machine learning model training to assist in system debug

Inventors: Uma Srinivasan (Poughkeepsie, NY); Akil Khamisi Sutton (Poughkeepsie, NY); Egduard Ramon Jauregui (Aurora, CO); Lisander Lopez (Poughkeepsie, NY)
Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
G06F11/2263G06F11/0766G06F11/261
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,423,201
App. No.
18/607,627
Granted
Sep 23, 2025
Kind
B1
Abstract

A process to train a machine learning model to predict fault location in a system includes generating a data set for training the machine learning model. The generating includes injecting, at a selected location of the system, a test fault into a simulation of the system using a workload, and recording a respective error syndrome generated by the simulation. Further, the generating includes repeating the injecting, at other selected location(s) of the system, of other test fault(s) into the simulation of the system, and the recording of respective, generated error syndromes. In addition, the process includes training, using the data set, the machine learning model, and providing the trained machine learning model for use in debugging the system, where the debugging includes predicting, using the trained machine learning model, a fault location within the system based on an error syndrome generated by the system due to the fault.

Claims (43)

1. A computer-implemented method of facilitating processing within a computing environment, the computer-implemented method comprising:

generating a data set for training a machine learning model to predict fault location in a system, the generating including:

injecting, at a selected location of the system, a test fault into a simulation of the system using a workload;

recording a respective error syndrome generated by the simulation resulting from injecting the test fault into the simulation at the selected location;

repeating injecting, at one or more other selected locations of the system, of one or more other test faults into the simulation of the system using the workload, and the recording of respective error syndromes generated by the simulation resulting from injecting the one or more other test faults into the simulation of the system to generate the data set; and

training, using the data set, the machine learning model to predict fault location within the system; and

providing the trained machine learning model for use in debugging the system, where the debugging includes predicting, using the trained machine learning model, the fault location within the system based on an error syndrome generated by the system due to the fault.

2. The computer-implemented method of claim 1 , wherein generating the data set further comprises generating, for the workload, a table of test faults injected into the simulation of the system, along with respective potential paths of error propagation within the system and respective recorded error syndromes.

3. The computer-implemented method of claim 2 , wherein test faults injected into the system include one or more test faults indicative of a hardware fault.

4. The computer-implemented method of claim 1 , wherein generating the training data set further comprises deterministically determining the selected location in the system for injecting the test fault into the simulation of the system, and deterministically determining the one or more other selected locations in the system for injecting the one or more other test faults into the simulation of the system.

5. The computer-implemented method of claim 1 , wherein generating the training data set further comprises semi-deterministically determining the selected location in the system for injecting the test fault into the simulation of the system, and semi-deterministically determining the one or more other selected locations in the system for injecting the one or more other test faults into the simulation of the system.

6. The computer-implemented method of claim 1 , wherein generating the training data set further comprises randomly selecting the selected location in the system for injecting the test fault into the simulation of the system, and randomly selecting the one or more other selected locations in the system for injecting the one or more other test faults into the simulation of the system.

7. The computer-implemented method of claim 1 , wherein generating the training data set further comprises exhausting training data set generation by obtaining a netlist of hierarchal nodes across the system, and for a given sub-block of the system, sequentially injecting test faults into all nodes of the given sub-block of the system, and recording respective error syndromes generated by the simulation resulting from injecting test faults into all nodes of the given sub-block of the system.

8. The computer-implemented method of claim 1 , further comprising obtaining a further data set from deploying the machine learning model to localize faults during system test, with a different workload, and refining the machine learning model using the further data set.

9. The computer-implemented method of claim 1 , wherein the machine learning model comprises a multi-class classifier to predict fault location within the system using the error syndrome generated by the system due to the fault.

10. A computer program product for facilitating processing within a computing environment, the computer program product comprising:

a set of one or more computer readable storage media; and

program instructions, collectively stored in the set of one or more computer readable storage media, for causing at least one processor set to perform computer operations comprising:

generating a data set for training a machine learning model to predict fault location in a system, the generating including:

injecting, at a selected location of the system, a test fault into a simulation of the system using a workload;

recording a respective error syndrome generated by the simulation resulting from injecting the test fault into the simulation at the selected location;

repeating injecting, at one or more other selected locations of the system, of one or more other test faults into the simulation of the system using the workload, and the recording of respective error syndromes generated by the simulation resulting from injecting the one or more other test faults into the simulation of the system to generate the data set; and

training, using the data set, the machine learning model to predict fault location within the system; and

providing the trained machine learning model for use in debugging the system, where the debugging includes predicting, using the trained machine learning model, the fault location within the system based on an error syndrome generated by the system due to the fault.

11. The computer program product of claim 10 , wherein generating the data set further comprises generating, for the workload, a table of test faults injected into the simulation of the system, along with respective potential paths of error propagation within the system and respective recorded error syndromes.

12. The computer program product of claim 11 , wherein test faults injected into the system include one or more test faults indicative of a hardware fault.

13. The computer program product of claim 10 , wherein generating the training data set further comprises deterministically determining the selected location in the system for injecting the test fault into the simulation of the system, and deterministically determining the one or more other selected locations in the system for injecting the one or more other test faults into the simulation of the system.

14. The computer program product of claim 10 , wherein generating the training data set further comprises semi-deterministically determining the selected location in the system for injecting the test fault into the simulation of the system, and semi-deterministically determining the one or more other selected locations in the system for injecting the one or more other test faults into the simulation of the system.

15. The computer program product of claim 10 , wherein generating the training data set further comprises randomly selecting the selected location in the system for injecting the test fault into the simulation of the system, and randomly selecting the one or more other selected locations in the system for injecting the one or more other test faults into the simulation of the system.

16. The computer program product of claim 10 , wherein generating the training data set further comprises exhausting training data set generation by obtaining a netlist of hierarchal nodes across the system, and for a given sub-block of the system, sequentially injecting test faults into all nodes of the given sub-block of the system, and recording respective error syndromes generated by the simulation resulting from injecting test faults into all nodes of the given sub-block of the system.

17. A computer system for facilitating processing within a computing environment, the computer system comprising:

at least one processor set;

a set of one or more computer readable storage media; and

program instructions, collectively stored in the set of one or more computer readable storage media, for causing the at least one processor set to perform computer operations comprising:

generating a data set for training a machine learning model to predict fault location in a system, the generating including:

injecting, at a selected location of the system, a test fault into a simulation of the system using a workload;

recording a respective error syndrome generated by the simulation resulting from injecting the test fault into the simulation at the selected location;

repeating injecting, at one or more other selected locations of the system, of one or more other test faults into the simulation of the system using the workload, and the recording of respective error syndromes generated by the simulation resulting from injecting the one or more other test faults into the simulation of the system to generate the data set; and

training, using the data set, the machine learning model to predict fault location within the system; and

providing the trained machine learning model for use in debugging the system, where the debugging includes predicting, using the trained machine learning model, the fault location within the system based on an error syndrome generated by the system due to the fault.

18. The computer system of claim 17 , wherein generating the data set further comprises generating, for the workload, a table of test faults injected into the simulation of the system, along with respective potential paths of error propagation within the system and respective recorded error syndromes.

19. The computer system of claim 18 , wherein test faults injected into the system include one or more test faults indicative of a hardware fault.

20. The computer system of claim 17 , further comprising obtaining a further data set from deploying the machine learning model to localize faults during system test, with a different workload, and refining the machine learning model using the further data set.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 18, 2024
From: SRINIVASAN, UMA; SUTTON, AKIL KHAMISI; JAUREGUI, EGDUARD RAMON; LOPEZ, LISANDER
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 066805/0009 →
References Cited (24)
US 7587639B2 · Marisetty et al. · 2009 [cited by applicant]
US 8645797B2 · Yigzaw et al. · 2014 [cited by applicant]
US 8650447B1 · Wortman et al. · 2014 [cited by applicant]
US 8873421B2 · Schulz et al. · 2014 [cited by applicant]
US 10733077B2 · Menon et al. · 2020 [cited by applicant]
US 11232016B1 · Huynh et al. · 2022 [cited by applicant]
US 20070174679A1 · Chelstrom et al. · 2007 [cited by applicant]
US 20080215925A1 · Degenaro · 2008 [cited by examiner]
US 20210089418A1 · Das Sharma · 2021 [cited by applicant]
US 20220129732A1 · Chakrabarty et al. · 2022 [cited by applicant]
US 20220197780A1 · Peck et al. · 2022 [cited by applicant]
US 20230034587A1 · Ranka et al. · 2023 [cited by applicant]
US 20230214311A1 · Bharti et al. · 2023 [cited by applicant]
US 20230229978A1 · Luk et al. · 2023 [cited by applicant]
US 20250217263A1 · Mokkapati · 2025 [cited by examiner]
Lopez, Carmen Torres et al., “Multiverse Debugging: Non-Deterministic Debugging for Non-Deterministic Programs.” ECOOP 2019, p. 27:1 to 27:30. [cited by applicant]
Barboza, Erick Carvajal et al., “Machine Learning for Microprocessor Performance Bug Localization.” Mar. 2023, pp. 1-12. [cited by applicant]
Khanfir, Ahmed et al., “IBIR: Bug-report-driven Fault Injection.” ACM Transactions on Software Engineering and Methodology, vol. 32, No. 2, Article 33. Mar. 2023, pp. 33:1-33:31. [cited by applicant]
Schiffel, Ute et al., “Slice Your Bug: Debugging Error Detection Mechanisms Using Error Injection Slicing”. Research Gate, May 2010, 11 pages. [cited by applicant]
Ziad, Mohamed Tared IBN, et al., “cuCatch: A Debugging Tool for Efficiently Catching Memory Safety Violations in CUDA Applications”. Proc. ACM Program Lang., vol. 7, No. PLDI, Article 111, Jun. 2023, pp. 111-111: 24. [cited by applicant]
Rocha Da Rosa, Feilipe et al., “Using Machine Learning Techniques to Evaluate Multicore Soft Error Reliability,” IEEE Transactions on Circuits and Systems-I: Regular Papers, vol. 66, No. 6, Jun. 2019, pp. 2151-2164. [cited by applicant]
Vieira, Marco et al., “Fault Injection for Failure Prediction Methods Validation,” Fifth Workshop on Hot Topics in System Dependability (HotDep 2009), Mar. 2009, pp. 1-6. [cited by applicant]
Wang, Qing et al., “Fault Injection Based Interventional Causal Learning for Distributed Applications,” The Thirty-Seventh AAAI Conference on Artificial Intelligence (AAAI-23), Article No. 1799, Feb. 2023, pp. 15738-157… [cited by applicant]
Artificial intelligence (AI) vs. machine learning (ML), Google Cloud, Jul. 21, 2025, 10 pages, https://cloud.google.com/learn/artificial-intelligence-vs-machine-learning?hl=en. [cited by applicant]