Granted Patent B2

US 12,618,723 · App. 18/644,127 · Granted May 5, 2026

Inventor: Wei-Fan Chen (Taoyuan City, TW)

Assignee: HTC Corporation

G01L1/04G06T7/80G06T2207/30244

Abstract

Claims (69)

1 . An electronic device, comprising:

a plurality of sensing circuits, configured to obtain a plurality of sensing values so as to obtain a pose of the electronic device within an environmental coordinate system of a real space;

a plurality of strain sensing circuits, configured to obtain a plurality of strain sensing values in correspondence to a deformation of the electronic device;

a memory, configured to store a linking database, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups of the plurality of strain sensing circuits and a plurality of testing external parameter groups of the plurality of sensing circuits in correspondence; and

a processor, coupled to the plurality of sensing circuits, the plurality of strain sensing circuits and the memory, configured to:

update a plurality of external parameters between the plurality of sensing circuits according to the plurality of strain sensing values and the linking database so as to obtain the pose of the electronic device within the environmental coordinate system accurately, wherein when obtaining the pose of the electronic device, the plurality of external parameters between the plurality of sensing circuits are considered.

2 . The electronic device of claim 1 , wherein the processor is further configured to:

obtain a first testing strain sensing value group of the plurality of testing strain sensing value groups corresponding to the plurality of strain sensing values;

obtain a first testing external parameter group of the plurality of testing external parameter groups in correspondence to the first testing strain sensing value group according to the linking database; and

update the plurality of external parameters between the plurality of sensing circuits according to the first testing external parameter group.

3 . The electronic device of claim 1 , wherein the processor is further configured to:

establish the linking database according to the plurality of testing strain sensing value groups and the plurality of testing external parameter groups in correspondence based on a plurality of loading cases.

4 . The electronic device of claim 3 , wherein the processor is further configured to:

obtain a first testing strain sensing value group based on a first loading case of the plurality of loading cases by the plurality of strain sensing circuits;

obtain a first testing external parameter group corresponding to the first loading case according to a plurality of images captured by a plurality of cameras of the plurality of sensing circuits when the electronic device is deformed based on the first loading case; and

establish the linking relationship between the first testing strain sensing value group and the first testing external parameter group based on the first loading case.

5 . The electronic device of claim 1 , wherein the processor is further configured to:

perform a structural stress analysis to the electronic device so as to obtain a plurality of representative positions of the electronic device;

wherein the plurality of strain sensing circuits are set at the plurality of representative positions.

6 . The electronic device of claim 1 , wherein the processor is further configured to:

update the plurality of external parameters according to the linking database when the deformation of the electronic device is within an elastic range; and

re-construct the linking database when the deformation of the electronic device is not within the elastic range.

7 . The electronic device of claim 6 , wherein the processor is further configured to:

determine whether the deformation of the electronic device is within the elastic range according to the linking database.

8 . A parameter calibration method, suitable for an electronic device, comprising:

obtaining a plurality of sensing values so as to obtain a pose of the electronic device within an environmental coordinate system of a real space by a plurality of sensing circuits of the electronic device;

obtaining a plurality of strain sensing values in correspondence to a deformation of the electronic device by a plurality of strain sensing circuits of the electronic device;

storing a linking database by a memory of the electronic device, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups of the plurality of strain sensing circuits and a plurality of testing external parameter groups of the plurality of sensing circuits in correspondence; and

updating a plurality of external parameters between the plurality of sensing circuits by a processor of the electronic device according to the plurality of strain sensing values and the linking database so as to obtain the pose of the electronic device within the environmental coordinate system accurately, wherein when obtaining the pose of the electronic device, the plurality of external parameters between the plurality of sensing circuits are considered.

9 . The parameter calibration method of claim 8 , further comprising:

obtaining a first testing strain sensing value group of the plurality of testing strain sensing value groups corresponding to the plurality of strain sensing values;

obtaining a first testing external parameter group of the plurality of testing external parameter groups in correspondence to the first testing strain sensing value group according to the linking database; and

updating the plurality of external parameters between the plurality of sensing circuits according to the first testing external parameter group.

10 . The parameter calibration method of claim 8 , further comprising:

establishing the linking database according to the plurality of testing strain sensing value groups and the plurality of testing external parameter groups in correspondence based on a plurality of loading cases.

11 . The parameter calibration method of claim 10 , further comprising:

obtaining a first testing strain sensing value group based on a first loading case of the plurality of loading cases by the plurality of strain sensing circuits;

obtaining a first testing external parameter group corresponding to the first loading case according to a plurality of images captured by a plurality of cameras of the plurality of sensing circuits when the electronic device is deformed based on the first loading case; and

establishing the linking relationship between the first testing strain sensing value group and the first testing external parameter group based on the first loading case.

12 . The parameter calibration method of claim 8 , further comprising:

performing a structural stress analysis to the electronic device so as to obtain a plurality of representative positions of the electronic device;

wherein the plurality of strain sensing circuits are set at the plurality of representative positions.

13 . The parameter calibration method of claim 8 , further comprising:

updating the plurality of external parameters according to the linking database when the deformation of the electronic device is within an elastic range; and

re-constructing the linking database when the deformation of the electronic device is not within the elastic range.

14 . The parameter calibration method of claim 13 , further comprising:

determining whether the deformation of the electronic device is within the elastic range according to the linking database.

15 . A non-transitory computer readable storage medium, wherein the non-transitory computer readable storage medium comprises one or more computer programs stored therein, and the one or more computer programs can be executed by one or more processors so as to be configured to operate a parameter calibration method, wherein the parameter calibration method comprises:

obtaining a plurality of sensing values so as to obtain a pose of an electronic device within an environmental coordinate system of a real space by a plurality of sensing circuits of the electronic device;

obtaining a plurality of strain sensing values in correspondence to a deformation of the electronic device by a plurality of strain sensing circuits of the electronic device;

storing a linking database by a memory of the electronic device, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups of the plurality of strain sensing circuits and a plurality of testing external parameter groups of the plurality of sensing circuits in correspondence; and

updating a plurality of external parameters between the plurality of sensing circuits by a processor of the electronic device according to the plurality of strain sensing values and the linking database so as to obtain the pose of the electronic device within the environmental coordinate system accurately, wherein when obtaining the pose of the electronic device, the plurality of external parameters between the plurality of sensing circuits are considered.

16 . The non-transitory computer readable storage medium of claim 15 , wherein the parameter calibration method further comprises:

obtaining a first testing strain sensing value group of the plurality of testing strain sensing value groups corresponding to the plurality of strain sensing values;

obtaining a first testing external parameter group of the plurality of testing external parameter groups in correspondence to the first testing strain sensing value group according to the linking database; and

updating the plurality of external parameters between the plurality of sensing circuits according to the first testing external parameter group.

17 . The non-transitory computer readable storage medium of claim 15 , wherein the parameter calibration method further comprises:

establishing the linking database according to the plurality of testing strain sensing value groups and the plurality of testing external parameter groups in correspondence based on a plurality of loading cases, comprising:

obtaining a first testing strain sensing value group based on a first loading case of the plurality of loading cases by the plurality of strain sensing circuits;

obtaining a first testing external parameter group corresponding to the first loading case according to a plurality of images captured by a plurality of cameras of the plurality of sensing circuits when the electronic device is deformed based on the first loading case; and

establishing the linking relationship between the first testing strain sensing value group and the first testing external parameter group based on the first loading case.

18 . The non-transitory computer readable storage medium of claim 15 , wherein the parameter calibration method further comprises:

performing a structural stress analysis to the electronic device so as to obtain a plurality of representative positions of the electronic device;

wherein the plurality of strain sensing circuits are set at the plurality of representative positions.

19 . The non-transitory computer readable storage medium of claim 15 , wherein the parameter calibration method further comprises:

updating the plurality of external parameters according to the linking database when the deformation of the electronic device is within an elastic range; and

re-constructing the linking database when the deformation of the electronic device is not within the elastic range.

20 . The non-transitory computer readable storage medium of claim 19 , wherein the parameter calibration method further comprises:

determining whether the deformation of the electronic device is within the elastic range according to the linking database.

Assignments (1)

Continuity (1)

References Cited (11)