IP Library › Granted Patent US 12,298,666
Granted Patent B2
US 12,298,666 · App. 18/654,160 · Granted May 13, 2025

Organotin patterning materials with ligands having silicon/germanium; precursor compositions; and synthesis methods

Inventors: Robert E. Jilek (Philomath, OR); Kai Jiang (Corvallis, OR); Amrit K. Narasimhan (Corvallis, OR)
Assignee: Inpria Corporation
G03F7/075G03F7/11G03F7/168
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Quick Facts
Patent No.
US 12,298,666
App. No.
18/654,160
Granted
May 13, 2025
Kind
B2
Abstract

As described herein, photosensitive composition comprises RSnL 3 , where R is a hydrocarbyl ligand with 1-20 carbon atoms and one or more silicon and/or germanium heteroatoms and L is an acetylide ligand (—C≡CA, where A is a silyl group with 0 to 6 carbon atoms or an organo group with 1 to 10 carbon atoms). Methods are described wherein photosensitive compositions are synthesized by reacting RX, where X is a halide, and MSnL 3 , where M is an alkali metal, alkali earth metal or a pseudo-alkali earth metal, L is an acetylide or a dialkylamide. The radiation sensitive compositions are effective for radiation based patterning, such as with EUV light.

Claims (14)

1. A method for patterning an organometallic compound comprising:

forming a coating on a substrate, wherein forming the coating comprises depositing RSnL 3 , wherein R is a hydrocarbyl group with 1-20 carbon atoms and one or more silicon or germanium heteroatoms, and L is a hydrolysable ligand;

irradiating the coating with radiation to form a latent image; and

developing the image to form a patterned coating with nanoscale features according to the latent image.

2. The method of claim 1 wherein the hydrolysable ligand comprises an alkoxide, a dialkylamide, or an alkyl/silyl acetylide.

3. The method of claim 1 wherein the substrate comprises silicon.

4. The method of claim 1 wherein the depositing comprises vapor deposition, spin coating, spray coating, or dip coating.

5. The method of claim 1 wherein the coating has an average thickness from 0.5 nm to 100 nm.

6. The method of claim 1 wherein the coating has a root-mean square surface roughness of less than 0.5 nm as measured by atomic force microscopy.

7. The method of claim 1 further comprising heating the coating to a temperature between about 30° C. and 300° C. for a period of time of about 10 seconds to about 10 minutes prior to irradiating the coating.

8. The method of claim 1 wherein the heating is performed under controlled partial pressures of gases, wherein the gases comprise H 2 O, CO 2 , CO, H 2 , N 2 , H 2 S, HCl, an inert gas, or a combination thereof.

9. The method of claim 1 wherein the irradiating comprises UV radiation or EUV radiation at a dose of about 1 mJ/cm 2 about 200 mJ/cm 2 or an electron beam at a dose equivalent to or not exceeding about 2 mC/cm 2 at 30 kV.

10. The method of claim 1 further comprising heating the coating to a temperature of 45° C. to about 300° C. for a period of time of at least about 0.1 minute to about 30 minutes after irradiating the coating the coating.

11. The method of claim 1 wherein the developing comprises an organic solvent or wherein the developing comprises a solvent-free process.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2024
From: JILEK, ROBERT E.; JIANG, KAI; NARASIMHAN, AMRIT K.
To: INPRIA CORPORATION
Reel/Frame 067358/0993 →
Continuity (3)
Continuation 17682639 · Feb 28, 2022
Provisional Application 63210769 · Jun 15, 2021
Related Publication 20240337941A1 · Oct 10, 2024
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