IP Library Granted Patent US 12,394,728
Granted Patent B2
US 12,394,728 · App. 18/673,099 · Granted Aug 19, 2025

Method of forming a region shielding within a package of a microelectronic device

Inventors: Patrick Variot (Los Gatos, CA); Hong Shen (Palo Alto, CA)
Assignee: Adeia Semiconductor Technologies LLC
H01L23/552H01L23/31H01L23/5226
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Quick Facts
Patent No.
US 12,394,728
App. No.
18/673,099
Granted
Aug 19, 2025
Kind
B2
Abstract

A microelectronic device may include a substrate, a first chip on the substrate, and a second chip on the substrate. A plurality of pillars may be located between the first chip and the second chip, wherein a first end of each pillar of the plurality of pillars is adjacent to the substrate. A spacing among the plurality of pillars is at least equal to a distance sufficient to block electromagnetic interference (EMI) and/or radio frequency interference (RFI) between the first chip and the second chip. The microelectronic device may also include a cover over at least the first chip, the second chip, and the plurality of pillars, wherein a second end of each pillar of the plurality of pillars is at least adjacent to a trench defined within the cover. The trench may include a conductive material therein.

Claims (27)

1. A method comprising:

providing a substrate comprising plurality of pillars and one of (i) a conductive trace or (ii) a plurality of conductive pads, wherein a first end of individual pillars of the plurality of pillars is coupled to one of (i) the conductive trace or (ii) a corresponding conductive pad of a plurality of conductive pads;

attaching a first chip to the substrate adjacent to a first side of the plurality of pillars;

attaching a second chip to the substrate adjacent to a second side of the plurality of pillars, wherein the second side is opposite to the first side;

disposing an epoxy molding compound over at least the first chip, the second chip, and the plurality of pillars to provide a cover;

forming a trench in the cover; and

filling the trench with a conductive material, wherein:

a second end of each pillar of the plurality of pillars is at least adjacent to the trench defined within the cover,

a spacing among the plurality of pillars is at least equal to a distance sufficient to block one or more of (i) electromagnetic interference (EMI) or (ii) radio frequency interference (RFI) between the first chip and the second chip,

the individual pillars of the plurality of pillars are arranged in a preselected manner for one or more frequencies associated with an interference between the first chip and the second chip; and

the plurality of pillars are positioned to substantially shield the interference at the one or more frequencies between the first chip and the second chip.

2. The method of claim 1 , wherein providing the substrate comprising the conductive trace and the plurality of pillars comprises:

providing the substrate; and

forming the plurality of pillars and the one of (i) the conductive trace or (ii) the plurality of conductive pads.

3. The method of claim 2 , wherein the first end of individual pillars is integral with the one of (i) the conductive trace or (ii) the corresponding conductive pad of a plurality of conductive pads.

4. The method of claim 1 , wherein forming the trench comprises:

placing a fin in the cover during the disposing the epoxy molding compound; and

removing the fin to provide the trench.

5. The method of claim 1 , wherein:

the second end of the individual pillars of the plurality of pillars engages a bottom surface of the conductive material.

6. The method of claim 5 , wherein an outer surface of the cover includes a layer of the conductive material.

7. The method of claim 1 , wherein the cover extends to the substrate.

8. The method of claim 1 , wherein the corresponding conductive pad of a plurality of conductive pads is exposed at a surface of the substrate.

9. The method of claim 8 , wherein the first end of the individual pillars is integral with the one of (i) the conductive trace or (ii) the corresponding conductive pad of the plurality of conductive pads.

10. The method of claim 1 , wherein a material of the cover extends between the plurality of pillars.

11. The method of claim 1 , wherein the individual pillars of the plurality of pillars are arranged linearly between the first chip and the second chip.

12. The method of claim 1 , wherein a spacing between the first chip and the second chip is in a range of 100 microns and 2000 microns.

Assignments (4)
SECURITY INTEREST Recorded May 28, 2025
From: ADEIA INC. (F/K/A XPERI HOLDING CORPORATION); ADEIA HOLDINGS INC.; ADEIA MEDIA HOLDINGS INC.; ADEIA IMAGING LLC; ADEIA MEDIA LLC; ADEIA MEDIA SOLUTIONS INC.; ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC.; ADEIA TECHNOLOGIES INC.; ADEIA GUIDES INC.; ADEIA SOLUTIONS LLC; ADEIA SEMICONDUCTOR ADVANCED TECHNOLOGIES INC.; ADEIA SEMICONDUCTOR SOLUTIONS LLC; ADEIA SEMICONDUCTOR INTELLECTUAL PROPERTY LLC; ADEIA SEMICONDUCTOR TECHNOLOGIES LLC; ADEIA PUBLISHING INC.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 071454/0343 →
CHANGE OF NAME Recorded Oct 2, 2024
From: INVENSAS LLC
To: ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
Reel/Frame 069087/0330 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 24, 2024
From: VARIOT, PATRICK; SHEN, HONG
To: INVENSAS CORPORATION
Reel/Frame 067518/0582 →
CHANGE OF NAME Recorded May 24, 2024
From: INVENSAS CORPORATION
To: INVENSAS LLC
Reel/Frame 067529/0526 →