White light interferometer for measuring radial growth in components experiencing rotating stresses
An apparatus measures clearances between a rotating structure within a fixed surrounding structure. A position detector determines when at least one portion of the rotating structure rotates past a hole defined in the fixed surrounding structure and generates an actuation signal responsive to rotation of the at least one portion of the rotating structure past the hole defined in the fixed surrounding structure. White light interferometer circuitry reflects a white light beam off of at least one portion of the rotating structure responsive to the actuation signal to determine a clearance between the at least one portion of the rotating structure and an inner surface of the fixed structure. The actuation signal actuates the white light interferometer circuitry to reflect the white light beam off of the at least one portion of the rotating structure through the hole defined in the fixed surrounding structure.
1 . An apparatus for measuring clearances between a rotating structure within a fixed surrounding structure, comprising:
a position detector for determining when at least one portion of the rotating structure rotates past a hole defined in the fixed surrounding structure and generating an actuation signal responsive to rotation of the at least one portion of the rotating structure past the hole defined in the fixed surrounding structure; and
white light interferometer circuitry, initiated responsive to the actuation signal, for reflecting a white light beam off of at least one portion of the rotating structure to determine a clearance between the at least one portion of the rotating structure and an inner surface of the fixed surrounding structure, wherein the actuation signal actuates the white light interferometer circuitry to reflect the white light beam off of the at least one portion of the rotating structure through the hole defined in the fixed surrounding structure.
2 . The apparatus of claim 1 further comprising a processor for determining changes in the clearance between the at least one portion of the rotating structure and the fixed surrounding structure responsive to the clearance determined by the white light interferometer circuitry and a clearance determined when the rotating structure is not moving.
3 . The apparatus of claim 1 , wherein the position detector further comprises:
a reflector mounted on the rotating structure;
a laser for projecting a laser beam toward the rotating structure in a fixed position;
a detector for detecting a reflection of the laser beam from the reflector when the reflector reflects the laser beam responsive to rotation of the reflector past the fixed position of the laser beam; and
a controller for determining when the at least one portion of the rotating structure rotates past the hole defined in the fixed surrounding structure responsive to the detected reflection of the laser beam and generating the actuation signal responsive to the determination.
4 . The apparatus of claim 1 , wherein the white light interferometer circuitry further comprises:
a white light emitter for generating a white light beam responsive to the actuation signal from the position detector;
a beam splitter for receiving the white light beam and generating a reference beam and a measurement beam responsive thereto;
a high-speed camera for comparing the reference beam and the measurement beam to determine the clearance between the at least one portion of the rotating structure and the inner surface of the fixed surrounding structure; and
wherein the reference beam is reflected by the beam splitter to the high-speed camera and the measurement beam is reflected by the beam splitter to the hole in the fixed surrounding structure and the at least one portion of the rotating structure reflects the measurement beam back to the beam splitter which reflects the measurement beam to the high-speed camera.
5 . The apparatus of claim 1 , wherein the white light beam is projected perpendicular to an axis of rotation of the rotating structure.
6 . The apparatus of claim 1 , wherein the white light beam is projected parallel to an axis of rotation of the rotating structure.
7 . The apparatus of claim 1 , wherein the rotating structure comprises a fan and further wherein the at least one portion of the rotating structure comprises a blade tip of a fan blade of the fan.
8 . An apparatus, comprising:
a fan having a plurality of blades made of a non-metallic structure rotating about a rotation axis of the fan;
a fixed structure surrounding the fan and having an inner surface separated from the blades by a clearance;
a position detector for determining when a tip of a blade of the fan rotates past a hole defined in the fixed structure and generating an actuation signal responsive to rotation of the tip of the blade of the fan past the hole defined in the fixed structure; and
white light interferometer circuitry, initiated responsive to the actuation signal, for reflecting a white light beam off of the tip of the blade of the fan to determine the clearance between the tip of the blade of the fan and the inner surface of the fixed structure, wherein the actuation signal actuates the white light interferometer circuitry to reflect the white light beam off of the tip of the blade of the fan through the hole defined in the fixed structure.
9 . The apparatus of claim 8 further comprising a processor for determining changes in the clearance between the tip of the blade of the fan and the fixed structure responsive to the clearance determined by the white light interferometer circuitry and a clearance determined when the fan is not moving.
10 . The apparatus of claim 8 , wherein the position detector further comprises:
a reflector mounted on the fan;
a laser for projecting a laser beam toward the fan in a fixed position;
a detector for detecting a reflection of the laser beam from the reflector when the reflector reflects the laser beam responsive to rotation of the reflector past the fixed position of the laser beam; and
a controller for determining when the tip of the blade of the fan rotates past the hole defined in the fixed surrounding structure responsive to the detected reflection of the laser beam and generating the actuation signal responsive to the determination.
11 . The apparatus of claim 8 , wherein the white light interferometer circuitry further comprises:
a white light emitter for generating a white light beam responsive to the actuation signal from the position detector;
a beam splitter for receiving the white light beam and generating a reference beam and a measurement beam responsive thereto;
a high-speed camera for comparing the reference beam and the measurement beam to determine the clearance between the tip of the blade of the fan and the inner surface of the fixed structure; and
wherein the reference beam is reflected by the beam splitter to the high-speed camera and the measurement beam is reflected by the beam splitter to the hole in the fixed structure and the tip of the blade of the fan reflects the measurement beam back to the beam splitter which reflects the measurement beam to the high-speed camera.
12 . The apparatus of claim 8 , wherein the white light beam is projected perpendicular to an axis of rotation of the fan.
13 . The apparatus of claim 8 , wherein the white light beam is projected parallel to an axis of rotation of the fan.
14 . A method for measuring clearances between a rotating structure within a fixed surrounding structure, comprising:
determining when at least one portion of the rotating structure rotates past a hole defined in the fixed surrounding structure using a position detector;
generating an actuation signal responsive to rotation of the at least one portion of the rotating structure past the hole defined in the fixed surrounding structure using the position detector;
reflecting a white light beam off of at least one portion of the rotating structure through the hole defined in the fixed surrounding structure using white light interferometer circuitry responsive to the actuation signal; and
determining a clearance between the at least one portion of the rotating structure and an inner surface of the fixed surrounding structure using the white light interferometer circuitry.
15 . The method of claim 14 further comprising determining changes in the clearance between the at least one portion of the rotating structure and the fixed surrounding structure responsive to the clearance determined by the white light interferometer circuitry and a clearance determined when the rotating structure is not moving using a processor.
16 . The method of claim 14 , wherein the step of determining further comprises:
projecting a laser beam from a laser toward the rotating structure in a fixed position;
reflecting the laser beam back using a reflector mounted on the rotating structure;
detecting using a detector a reflection of the laser beam from the reflector when the reflector reflects the laser beam responsive to rotation of the reflector past the fixed position of the laser beam; and
determining using a controller when the at least one portion of the rotating structure rotates past the hole defined in the fixed surrounding structure responsive to the detected reflection of the laser beam.
17 . The method of claim 16 , wherein the step of generating further comprises generating the actuation signal responsive to the determination.
18 . The method of claim 14 , wherein the step of reflecting further comprises:
generating a white light beam using a white light emitter responsive to the actuation signal from the position detector;
receiving the white light beam at a beam splitter; and
generating a reference beam and a measurement beam responsive to the received white light beam.
19 . The method of claim 18 , wherein the step of determining the clearance further comprises comparing using a high-speed camera the reference beam and the measurement beam to determine the clearance between the at least one portion of the rotating structure and the inner surface of the fixed surrounding structure.
20 . The method of claim 18 , wherein the step of generating the reference beam and the measurement beam further comprises:
splitting the white light beam into the reference beam and the measurement beam at the beam splitter;
reflecting the reference beam by the beam splitter to a high-speed camera;
reflecting the measurement beam to the hole in the fixed surrounding structure;
reflecting the measurement beam from the at least one portion of the rotating structure back to the beam splitter; and
reflecting the measurement beam to the high-speed camera.