Optical Inspection Circuit and Method of Manufacturing an Optical Circuit Chip
The present invention is intended to provide an inspection optical circuit that can input and output inspection light to and from a circuit to be inspected with low loss, and can minimize a space for disposing the inspection optical circuit. Provided is an inspection optical circuit for inspecting a tested circuit formed on an optical circuit chip on a wafer by inputting and outputting light through a grating coupler, wherein the grating coupler is formed on the same optical circuit chip as the tested circuit, and a folded waveguide for connecting an input/output waveguide of the tested circuit and the grating coupler is formed in a region provided on a dicing line for cutting out the optical circuit chip.
1 . An inspection optical circuit for inspecting a tested circuit formed on an optical circuit chip on a wafer by inputting and outputting light through an optical path converter, wherein
the optical path converter is formed on the same optical circuit chip as the tested circuit, and
a folded waveguide for connecting an input/output waveguide of the tested circuit and the optical path converter is formed in a region provided on a dicing line for cutting out the optical circuit chip.
2 . The inspection optical circuit according to claim 1 , wherein the optical path converter is formed in a region to be polished and reduced by polishing after being cut off by dicing along the dicing line.
3 . The inspection optical circuit according to claim 1 , wherein the dicing line is a groove formed on the wafer, and the region is a region where the groove is not dug.
4 . The inspection optical circuit according to claim 1 , wherein the input/output waveguide of the tested circuit and the folded waveguide are connected via a spot-size converter including a tapered waveguide.
5 . The inspection optical circuit according to claim 1 , wherein the dicing line is a groove formed on the wafer, and the region is separated from the optical circuit chip by the groove.
6 . A method for manufacturing a plurality of optical circuit chips including a tested circuit on a wafer, the method comprising:
forming an optical path converter on the same optical circuit chip as the tested circuit;
forming a folded waveguide for connecting an input/output waveguide of the tested circuit and the optical path converter in a region provided on a dicing line for cutting out the optical circuit chip; and
removing the region by dicing along the dicing line after the tested circuit is inspected.
7 . The method according to claim 6 , wherein the optical path converter is formed in a region to be polished and reduced by polishing after being cut off by dicing along the dicing line.
8 . The method according to claim 6 , wherein the dicing line is a groove formed on the wafer, and the region is a region where the groove is not dug.
9 . The inspection optical circuit according to claim 2 , wherein the dicing line is a groove formed on the wafer, and the region is a region where the groove is not dug.
10 . The inspection optical circuit according to claim 2 , wherein the input/output waveguide of the tested circuit and the folded waveguide are connected via a spot-size converter including a tapered waveguide.
11 . The inspection optical circuit according to claim 3 , wherein the input/output waveguide of the tested circuit and the folded waveguide are connected via a spot-size converter including a tapered waveguide.
12 . The inspection optical circuit according to claim 9 , wherein the input/output waveguide of the tested circuit and the folded waveguide are connected via a spot-size converter including a tapered waveguide.
13 . The inspection optical circuit according to claim 2 , wherein the dicing line is a groove formed on the wafer, and the region is separated from the optical circuit chip by the groove.
14 . The method according to claim 7 , wherein the dicing line is a groove formed on the wafer, and the region is a region where the groove is not dug.