IP Library › Granted Patent US 12,625,761
Granted Patent B2
US 12,625,761 · App. 18/693,179 · Granted May 12, 2026

Fault repair method and apparatus, electronic device and storage medium

Inventors: Senyang Deng (Shenzhen, CN); Lei Shan (Shenzhen, CN); Dongfang Ning (Shenzhen, CN); Zuofeng Zhang (Shenzhen, CN)
Assignee: ZTE CORPORATION
G06F11/0793G06F11/0709G06F11/079H04L41/0631
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Quick Facts
Patent No.
US 12,625,761
App. No.
18/693,179
Granted
May 12, 2026
Kind
B2
Abstract

Embodiments of the present application relate to the field of communications, and discloses a fault repair method and apparatus, an electronic device and a storage medium. The method includes: acquiring a fault feature of a fault; determining whether a fault cause corresponding to the fault feature exists; when a corresponding fault cause does exist, determining whether a repair rule corresponding to the fault cause exists; when a corresponding repair rule does exist, repairing the fault according to the repair rule; and when no corresponding repair rule exists, reporting the fault cause, and after acquiring a repair instruction, repairing the fault according to the repair instruction, and updating a repair rule library.

Claims (41)

1 . A fault repair method, comprising:

acquiring a fault feature of a fault;

determining whether a fault cause corresponding to the fault feature exists, comprising:

acquiring a device function module in which the fault is located; and

acquiring, according to a diagnostic rule corresponding to the device function module in a preset diagnostic rule library, the fault cause corresponding to the fault feature,

the diagnostic rule being a correspondence between the fault feature and the fault cause;

determining, upon a condition that a corresponding fault cause does exist, whether a repair rule corresponding to the fault cause exists;

repairing, upon a condition that the corresponding repair rule does exist, the fault according to the repair rule;

upon a condition that no corresponding repair rule exists:

reporting the fault cause;

after acquiring a repair instruction, repairing the fault according to the repair instruction; and

updating a repair rule library.

2 . The fault repair method of claim 1 , further comprising:

obtaining, upon a condition that no corresponding fault cause exists, the fault cause by self-learning and reasoning according to an existing correspondence between a fault feature and the fault cause.

3 . The fault repair method of claim 2 , wherein the self-learning is implemented by a decision tree algorithm.

4 . The fault repair method of claim 2 , wherein the self-learning is implemented by a support vector machine algorithm.

5 . The fault repair method of claim 1 , wherein updating the repair rule library comprises:

performing, according to the repair instruction, self-learning to generate a new repair rule;

detecting, according to the fault, the fault cause and the new repair rule, correctness of the new repair rule;

updating, upon a condition that the new repair rule is correct, the repair rule library with the new repair rule; and

adjusting, upon a condition that the new repair rule is incorrect, a self-learning algorithm parameter, regenerating a new repair rule, and detecting correctness of the regenerated new repair rule.

6 . The fault repair method of claim 1 , wherein the fault feature comprises a function fault feature;

wherein the function fault feature is configured to represent a hardware state of each device function module; and the function fault feature is obtained by being reported by each device function module.

7 . The fault repair method of claim 1 , wherein the fault feature comprises a performance fault feature;

wherein the performance fault feature is configured to represent a signal processing performance of each device function module; and the performance fault feature is obtained according to a signal processing performance parameter of each device function module.

8 . The fault repair method of claim 1 , wherein the fault feature comprises:

a function fault feature and a performance fault feature;

wherein the function fault feature is configured to represent a hardware state of each device function module;

the performance fault feature is configured to represent a signal processing performance of each device function module;

the function fault feature is obtained by being reported by each device function module; and

the performance fault feature is obtained according to a signal processing performance parameter of each device function module.

9 . The fault repair method of claim 8 , wherein the performance fault feature is acquired by:

acquiring a transceiving signal of the each device function module;

identifying a configuration parameter of the transceiving signal;

calculating a performance index of the each device function module according to the configuration parameter; and

obtaining the performance fault feature according to the performance index.

10 . An electronic device, comprising:

at least one processor; and

a memory communicatively connected with the at least one processor;

the memory storing instructions executable by the at least one processor, and the instructions being executed by the at least one processor to enable the at least one processor to execute a fault repair method of claim 1 .

11 . A non-transitory computer-readable storage medium storing a computer program which, when executed by a processor, implements a fault repair method of claim 1 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 19, 2024
From: DENG, SENYANG; SHAN, LEI; NING, DONGFANG; ZHANG, ZUOFENG
To: ZTE CORPORATION
Reel/Frame 066817/0658 →
Priority Claims (1)
CN 202111177755.5 · Oct 9, 2021 · national
Continuity (1)
Related Publication 20250217228A1 · Jul 3, 2025
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