IP Library › Granted Patent US 12,625,359
Granted Patent B2
US 12,625,359 · App. 18/705,602 · Granted May 12, 2026

Method for providing position information for retrieving a target position in a microscopic sample, method for examining and/or processing such a target position and means for implementing these methods

Inventors: Frank Sieckmann (Wetzlar, DE); Frank Hecht (Wetzlar, DE)
Assignee: LEICA MICROSYSTEMS CMS GMBH
G02B21/367G02B21/368
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Quick Facts
Patent No.
US 12,625,359
App. No.
18/705,602
Granted
May 12, 2026
Kind
B2
Abstract

A method for providing position information for retrieving a target position in a microscopic sample includes providing a first representation of the sample at a first resolution including the target position; specifying a first target position identifier indicating the target position at the first resolution; acquiring an image stack comprising the target position indicated by the first target position identifier; providing a second representation at a second resolution higher than the first resolution based on the image stack; specifying a second target position identifier indicating the target position at the second resolution; specifying a plurality of reference position identifiers in the second representation indicating positions of optically detectable reference markers at the second resolution; and determining a set of geometric descriptors describing spatial relations between the second target position identifier and the plurality of reference position identifiers to provide the position information.

Claims (24)

1 . A method for providing position information for retrieving a target position in a microscopic sample, the method comprising:

a) providing a first digital representation of the sample or a part of the sample at a first resolution comprising the target position;

b) specifying a first target position identifier in the first digital representation indicating the target position at the first resolution;

c) acquiring an image stack in a region of the sample comprising the target position indicated by the first target position identifier, the image stack comprising a plurality of images;

d) providing a second digital representation at a second resolution higher than the first resolution based on the image stack by performing a deconvolution between pixels of each respective image of the image stack and between pixels of different images of the image stack;

e) specifying a second target position identifier in the second digital representation indicating the target position at the second resolution;

f) specifying a plurality of reference position identifiers in the second digital representation indicating positions of optically detectable reference markers at the second resolution; and

g) determining a set of geometric descriptors describing spatial relations between the second target position identifier and the plurality of reference position identifiers to provide the position information.

2 . The method according to claim 1 , wherein the target position is a first target position, wherein the method is adapted for providing position information for retrieving one or more further target positions by performing steps b) to g) for each of the one or more further target positions, and wherein the regions of the sample in which the image stacks are acquired for the first and each of the one or more further target positions are disjoint regions.

3 . The method according to claim 1 , wherein in step f) the plurality of reference position identifiers in a distance larger than a lower distance threshold to the target position and/or in a distance smaller than an upper distance threshold to the target position are specified in the second digital representation.

4 . The method according to claim 1 , wherein a light microscopic device is used for acquiring the image stack and wherein the second resolution is a digital resolution exceeding an optical resolution of the light microscopic device.

5 . The method according to claim 4 , wherein providing the second digital representation includes interpolating image pixels within and/or between individual images of the image stack to yield the second resolution.

6 . The method according to claim 1 , wherein providing the first digital representation comprises computationally merging a plurality of light microscopic images, the plurality of light microscopic images being acquired at least in part at different lateral positions and/or different focus positions.

7 . The method according to claim 1 , wherein providing the first digital representation comprises displaying at least a part of the first digital representation in a first display region of a graphical user interface rendered by a computing device on a display.

8 . The method according to claim 7 , wherein specifying the first position identifier comprises receiving and processing a first user input of a user of the computing device, the first user input indicating a position in the first display region of the graphical user interface.

9 . The method according to claim 7 , wherein providing the second digital representation comprises obtaining a three-dimensional representation based on the image stack and displaying one or a plurality of two-dimensional views of the three-dimensional representation in a second display region of the graphical user interface.

10 . The method according to claim 9 , wherein specifying the second target position identifier includes receiving and processing a second user input of a user of the computing device, the second user input indicating a position in the second display region of the graphical user interface.

11 . The method according to claim 1 , further comprising specifying coarse reference position identifiers at the first resolution in the first digital representation indicating coarse positions of visible reference markers in the microscopic sample.

12 . The method according to claim 1 , wherein the set of geometric descriptors is determined as a vector set or a directed graph, and/or wherein the position information is provided in a form of coordinates relative to a reference point determined based on or relating to the vector set or the directed graph.

13 . The method according to claim 1 , wherein providing the position information comprises modifying the geometric descriptors based on an estimate of a shrinkage of the sample in a subsequent process.

14 . The method according to claim 1 , further comprising providing the position information to a processing device for further processing of the sample.

15 . A method for examining and/or processing the target position in a microscopic sample using a processing apparatus, wherein the position information for the target position is provided by a method according to claim 1 , and wherein the target position is retrieved in the processing apparatus on the basis thereof.

16 . A microscopic examination arrangement comprising a microscopic device and a computing device, the microscopic examination arrangement being adapted to perform the method according to claim 1 .

17 . A non-transitory computer readable medium comprising instructions thereon that, when executed by one or more processors, facilitate performing the method according to claim 1 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2026
From: SIECKMANN, FRANK; HECHT, FRANK
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 074174/0472 →
Continuity (1)
Related Publication 20240411123A1 · Dec 12, 2024
References Cited (11)
US 11676366B1 · Cooke · 2023 [cited by examiner]
US 20130279752A1 · Thomas et al. · 2013 [cited by applicant]
US 20140226003A1 · Phaneuf · 2014 [cited by examiner]
US 20150130921A1 · Ohashi · 2015 [cited by examiner]
US 20190137743A1 · Schumann · 2019 [cited by applicant]
US 20190294317A1 · Ward et al. · 2019 [cited by applicant]
US 20200218054A1 · Sase · 2020 [cited by examiner]
US 20210182531A1 · Chang et al. · 2021 [cited by applicant]
EP 2796917A1 · 2014 [cited by applicant]
Guo, Min et al.; “Rapid image deconvolution and multiview fusion for optical microscopy”; [cited by applicant]
Kizilyaprak, Caroline et al.; “Focused ion beam scanning electron microscopy in biology”; [cited by applicant]