IP Library Granted Patent US 12,343,548
Granted Patent B2
US 12,343,548 · App. 18/796,784 · Granted Jul 1, 2025

Anisotropic conductive electrical connection from a conductive pathway through a ceramic casing to a circuit board electronic component housed inside the casing

Inventors: Robert A. Stevenson (Canyon Country, CA); Christine A Frysz (Orchard Park, NY); Keith W. Seitz (Clarence Center, NY); Brian P Hohl (Clarence, NY); Marc Gregory Martino (Westlake Village, CA)
Assignee: Greatbatch Ltd.
A61N1/3754H01G4/008H01G4/1209H01G4/236H01G4/35
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,343,548
App. No.
18/796,784
Granted
Jul 1, 2025
Kind
B2
Abstract

An AIMD includes a ceramic base closed with a ceramic lid, both cooperatively separating body fluid and device sides. The lid and circuit board both have active and conductive pathways. A circuit board has active and ground conductive pathways. An anisotropic conductive layer disposed between the lid device side and the circuit board has a first thickness where a first conductive particle is in electrical contact with the lid and the circuit board active conductive pathways electrically connected to the active terminal of an electronic component on the circuit board, a second thickness where a second conductive particle is in electrical contact with the lid and the circuit board ground conductive pathways electrically connected to the ground terminal of the electronic component. The anisotropic conductive layer has a third, greater thickness where no conductive particles are in electrical contact with the lid and circuit board conductive active and ground pathways.

Claims (64)

1. An implantable medical device (IMD), the IMD comprising:

a) a ceramic base comprising a sidewall defining an open space and extending to a base annular edge surrounding a base open end;

b) a ceramic lid closing the open end of the ceramic base, the lid extending to a lid annular edge meeting a lid device side spaced from a lid body fluid side, wherein at least a lid first conductive pathway extends to spaced apart lid first conductive pathway device and body fluid side ends, and a lid second conductive pathway extends to spaced apart lid second conductive pathway device and body fluid side ends;

c) a circuit board residing in the interior space of the ceramic base closed by the lid, the circuit board extending to spaced apart circuit board first and second sides, wherein a circuit board first conductive pathway extends to spaced apart circuit board first conductive pathway first and second ends adjacent to the respective circuit board first and second sides, and a circuit board second conductive pathway extends to spaced apart circuit board second conductive pathway first and second ends adjacent to the respective circuit board first and second sides;

d) at least one electronic component supported by the circuit board, the electronic component having a first terminal spaced from a second terminal, wherein the circuit board first and second conductive pathway second ends are electrically connected to the respective first and second terminals of the at least one electronic component; and

e) an anisotropic conductive layer disposed between the circuit board first side and the device side of the ceramic lid, the anisotropic conductive layer comprising an electrically insulative matrix supporting a plurality of electrically conductive particles, wherein the anisotropic conductive layer comprises:

i) a first thickness that is longitudinally aligned with the lid first conductive pathway device side end and the circuit board first conductive pathway first end adjacent to the circuit board first side, wherein the electrically conductive matrix of the anisotropic conductive layer residing in the first thickness has at least a first one of the plurality of electrically conductive particles in electrical contact with the lid first conductive pathway device side end and the circuit board first conductive pathway first end to thereby provide electrical continuity from the lid first conductive pathway body fluid side end to the circuit board first conductive pathway second end electrically connected to the first terminal of the at least one electronic component;

ii) a second thickness that is longitudinally aligned with the lid second conductive pathway device side end and the circuit board second conductive pathway first end adjacent to the circuit board first side, wherein the electrically conductive matrix of the anisotropic conductive layer residing in the second thickness has at least a second one of the plurality of electrically conductive particles in electrical contact with the lid second conductive pathway device side end and the circuit board second conductive pathway first end to thereby provide electrical continuity from the lid second conductive pathway body fluid side end to the circuit board second conductive pathway second end electrically connected to the second terminal of the at least one electronic component; and

iii) a third thickness that is greater than the first and second thicknesses where the lid and circuit board first conductive pathways are not longitudinally aligned and where the lid and circuit board second conductive pathways are not longitudinally aligned, wherein, even though the electrically conductive matrix supporting the plurality of electrically conductive particles resides in the third thickness, a third one of the plurality of electrically conductive particles is not in electrical contact with either of the lid first conductive pathway and the circuit board first conductive pathway, and with either of the lid second conductive pathway and the circuit board second conductive pathway,

iv) wherein the third, greater thickness of the anisotropic conductive layer electrically isolates at least the first and second ones of the plurality of electrically conductive particles from each other.

2. The IMD of claim 1 , wherein at least one of the lid first conductive pathway device side end and the circuit board first conductive pathway first side end is proud of the respective lid device side and the circuit board first side, and wherein the first thickness of the anisotropic conductive layer is longitudinally aligned with the at least one proud lid first conductive pathway device side end and the circuit board first conductive pathway first side end, and wherein the third, greater thickness of the anisotropic conductive layer resides where the at least one proud lid first conductive pathway device side end and the circuit board first conductive pathway first side end are not longitudinally aligned.

3. The IMD of claim 1 , wherein the lid first and second conductive pathway device side ends and the circuit board first and second conductive pathways first and second side ends are proud of the respective lid device side end and the circuit board first side.

4. The IMD of claim 1 , wherein:

a) a first plurality of longitudinally aligned electrically conductive particles are in contact with each other and with the lid first conductive pathway device side end and the circuit board first conductive pathway first side end in the first thickness of the anisotropic conductive layer to thereby provide electrical continuity from the lid first conductive pathway body fluid side end to the circuit board first conductive pathway second side end electrically connected to the first terminal of the at least one electronic component;

b) a second plurality of longitudinally aligned electrically conductive particles are in contact with each other and with the lid second conductive pathway device side end and the circuit board second conductive pathway first side end in the second thickness of the anisotropic conductive layer to thereby provide electrical continuity from the lid second conductive pathway body fluid side end to the circuit board second conductive pathway second side end electrically connected to the second terminal of the at least one electronic component; and

c) a third plurality of electrically conductive particles reside in the third thickness of the anisotropic conductive layer, but they are not in electrical continuity with either the lid first conductive pathway device side end and the circuit board first conductive pathway first side end in the first thickness or with the lid second conductive pathway device side end and the circuit board second conductive pathway first end.

5. The IMD of claim 1 , wherein the electrically conductive particles are either compressible or rigid.

6. The IMD of claim 1 , wherein the anisotropic conductive layer is selected from the group of a film, a paste, a tape, and an adhesive.

7. The IMD of claim 1 , wherein the electrically conductive particles of the anisotropic conductive layer are selected from metallic particles, metal-coated particles, electrically conductive composite particles and electrically conductive coated polymer, glass, glass-ceramic, and ceramic particles.

8. The IMD of claim 1 , wherein the lid first and second conductive pathways, and the circuit board first and second conductive pathways are individually comprised of a leadwire, an eyelet, and a substantially pure platinum at least partially filling the respective lid and circuit board first and second passageways.

9. The IMD of claim 1 , wherein the lid first and second conductive pathways are individually a first and a second nail head leadwire that is proud of the lid device side.

10. The IMD of claim 1 , wherein the lid first and second conductive pathways, and the circuit board first and second conductive pathways are individually comprised of a leadwire, an eyelet, and a substantially pure platinum at least partially filling the respective lid and circuit board first and second passageways.

11. The IMD of claim 1 , wherein:

a) a base metallization is contacted the base annular edge and a base titanium ring is brazed to the base metallization opposite the ceramic base;

b) a lid metallization is contacted the lid annular edge and a lid titanium ring is brazed to the lid metallization opposite the lid; and

c) a weld secures the base titanium ring to the lid titanium ring to thereby connect the lid to the base to close the open end of the ceramic base.

12. The IMD of claim 11 , wherein the base and lid metallizations comprise a wetting layer contacted to the base annular edge and the lid annular edge, and a respective adhesion layer contacted to the wetting layer.

13. The IMD of claim 1 , wherein:

a) the ceramic lid comprises an alumina ceramic; and

b) the lid first and second conductive pathways individually comprise a composite fill characterized as having been co-sintered with the alumina ceramic or a substantially pure platinum fill characterized as having been co-sintered with the alumina ceramic.

14. The IMD of claim 13 , wherein the composite fill comprises a ceramic reinforced metal composite comprising a mixture of alumina and platinum surrounding a substantially pure platinum fill or a metallic wire.

15. The IMD of claim 1 , wherein the at least one electronic component supported by the circuit board is selected from a biological sensing circuit, a therapeutic delivery circuit, a memory circuit, a monitoring circuit, a programming circuit, and a telemetry circuit.

16. The IMD of claim 1 , wherein, in addition to the at least one electronic component, the circuit board supports an energy transfer module connected to a storage capacitor, the energy transfer module being configured to capture electromagnetic energy from an external RF power transmitting source to power the at least one electronic component.

17. The IMD of claim 1 , wherein, in addition to the at least one electronic component, the circuit board supports a primary or secondary battery which is configured to power the at least one electronic component.

18. The IMD of claim 1 , wherein the at least one electronic component is supported on the circuit board first side, the circuit board second side or it is embedded in the circuit board.

19. An implantable medical device (IMD), the IMD comprising:

a) a ceramic base comprising a sidewall defining an open space and extending to a base annular edge surrounding a base open end;

b) a feedthrough comprising:

i) a metallic ferrule having a ferrule opening extending to a ferrule device side spaced from a ferrule body fluid side;

ii) an insulator extending to an insulator device side spaced from an insulator body fluid side, wherein, with insulator hermetically sealed to the ferrule in the ferrule opening, the insulator device and body fluid sides reside adjacent to the ferrule device and body fluid sides;

iii) a first conductive pathway in the insulator extending to spaced apart insulator first conductive pathway device and body fluid side ends; and

iv) a second conductive pathway in the insulator extending to spaced apart insulator second conductive pathway device and body fluid side ends,

v) wherein the ferrule of the feedthrough is secured to the base annular edge to close the open end of the ceramic base; and

c) a circuit board residing in the interior space of the ceramic base closed by the feedthrough, the circuit board extending to spaced apart circuit board first and second sides, wherein a circuit board first conductive pathway extends to spaced apart circuit board first conductive pathway first and second ends adjacent to the respective circuit board first and second sides, and a circuit board second conductive pathway extends to spaced apart circuit board second conductive pathway first and second ends adjacent to the respective circuit board first and second sides;

d) at least one electronic component supported by the circuit board, the electronic component having a first terminal spaced from a second terminal, wherein the circuit board first and second conductive pathway second ends are electrically connected to the respective first and second terminals of the at least one electronic component;

e) an anisotropic conductive layer disposed between the circuit board and the device side of the insulator of the feedthrough, the anisotropic conductive layer comprising an electrically insulative matrix supporting a plurality of electrically conductive particles, wherein the anisotropic conductive layer comprises:

i) a first thickness that is longitudinally aligned with the insulator first conductive pathway device side end and the circuit board first conductive pathway first end adjacent to the circuit board first side, wherein the electrically conductive matrix of the anisotropic conductive layer residing in the first thickness has at least a first one of the plurality of electrically conductive particles in electrical contact with the insulator first conductive pathway device side end and the circuit board first conductive pathway first end to thereby provide electrical continuity from the insulator first conductive pathway body fluid side end to the circuit board first conductive pathway second end electrically connected to the first terminal of the at least one electronic component;

ii) a second thickness that is longitudinally aligned with the insulator second conductive pathway device side end and the circuit board second conductive pathway first end adjacent to the circuit board first side, wherein the electrically conductive matrix of the anisotropic conductive layer residing in the second thickness has at least a second one of the plurality of electrically conductive particles in electrical contact with the insulator second conductive pathway device side end and the circuit board second conductive pathway first end to thereby provide electrical continuity from the insulator second conductive pathway body fluid side end to the circuit board second conductive pathway second end electrically connected to the second terminal of the at least one electronic component; and

iii) a third thickness that is greater than the first and second thicknesses where the insulator and circuit board first conductive pathways are not longitudinally aligned and where insulator and circuit board second conductive pathways are not longitudinally aligned, wherein, even though the electrically conductive matrix supporting the plurality of electrically conductive particles resides in the third thickness, a third one of the plurality of electrically conductive particles is not in electrical contact with either of the insulator first conductive pathway and the circuit board first conductive pathway, and with either the insulator second conductive pathway and the circuit board second conductive pathway,

iv) wherein the third, greater thickness of the anisotropic conductive layer electrically isolates at least the first and second ones of the plurality of electrically conductive particles from each other.

20. The IMD of claim 19 , wherein at least one of the insulator first conductive pathway device side end and the circuit board first conductive pathway first side end is proud of the respective insulator device side and the circuit board first side, and wherein the first thickness of the anisotropic conductive layer is longitudinally aligned with the at least one proud insulator first conductive pathway device side end and the circuit board first conductive pathway first side end, and wherein the third, greater thickness of the anisotropic conductive layer resides where the at least one proud insulator first conductive pathway device side end and the circuit board first conductive pathway first side end are not longitudinally aligned.

21. The IMD of claim 19 , wherein the insulator first and second conductive pathways, and the circuit board first and second conductive pathways are individually comprised of a leadwire, an eyelet, and a substantially pure platinum at least partially filling the respective insulator and circuit board first and second passageways.

22. An implantable medical device (IMD), the IMD comprising:

a) a ceramic base comprising a sidewall defining an open space and extending to a base annular edge surrounding a base open end;

b) a ceramic lid closing the open end of the ceramic base, the lid extending to a lid annular edge meeting a lid device side spaced from a lid body fluid side, wherein at least a lid first conductive pathway extends to spaced apart lid first conductive pathway device and body fluid side ends, and a lid second conductive pathway extends to spaced apart lid second conductive pathway device and body fluid side ends;

c) a circuit board residing in the interior space of the ceramic base closed by the lid, the circuit board extending to spaced apart circuit board first and second sides, wherein a circuit board first conductive pathway extends to spaced apart circuit board first conductive pathway first and second ends adjacent to the respective circuit board first and second sides, and a circuit board second conductive pathway extends to spaced apart circuit board second conductive pathway first and second ends adjacent to the respective circuit board first and second sides;

d) a first electronic component supported by the circuit board, the first electronic component having at least a first terminal, wherein first conductive pathway second end is electrically connected to the first terminal of the first electronic component;

e) at least a second electronic component supported by the circuit board, the second electronic component having at least a second terminal, wherein second conductive pathway second end is electrically connected to the second terminal of the second electronic component; and

f) an anisotropic conductive layer disposed between the circuit board first side and the device side of the ceramic lid, the anisotropic conductive layer comprising an electrically insulative matrix supporting a plurality of electrically conductive particles, wherein the anisotropic conductive layer comprises:

i) a first thickness that is longitudinally aligned with the lid first conductive pathway device side end and the circuit board first conductive pathway first end adjacent to the circuit board first ide, wherein the electrically conductive matrix of the anisotropic conductive layer residing in the first thickness has at least a first one of the plurality of electrically conductive particles in electrical contact with the lid first conductive pathway device side end and the circuit board first conductive pathway first end to thereby provide electrical continuity from the lid first conductive pathway body fluid side end to the circuit board first conductive pathway second end electrically connected to the first terminal of the first electronic component;

ii) a second thickness that is longitudinally aligned with the lid second conductive pathway device side end and the circuit board second conductive pathway first end adjacent to the circuit board first side, wherein the electrically conductive matrix of the anisotropic conductive layer residing in the second thickness has at least a second one of the plurality of electrically conductive particles in electrical contact with the lid second conductive pathway device side end and the circuit board second conductive pathway first end to thereby provide electrical continuity from the lid second conductive pathway body fluid side end to the circuit board second conductive pathway second end electrically connected to the second terminal of at least the second electronic component; and

iii) a third thickness that is greater than the first and second thicknesses where the lid and circuit board first conductive pathways are not longitudinally aligned and where the lid and circuit board second conductive pathways are not longitudinally aligned, wherein, even though the electrically conductive matrix supporting the plurality of electrically conductive particles resides in the third thickness, a third one of the plurality of electrically conductive particles is not in electrical contact with either of the lid first conductive pathway and the circuit board first conductive pathway, and with either of the lid second conductive pathway and the circuit board second conductive pathway,

iv) wherein the third, greater thickness of the anisotropic conductive layer electrically isolates at least the first and second ones of the plurality of electrically conductive particles from each other.

23. The IMD of claim 22 , wherein the lid first and second conductive pathway device side ends and the circuit board first and second conductive pathways first and second side ends are proud of the respective lid device side end and the circuit board first side.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2024
From: STEVENSON, ROBERT A.; FRYSZ, CHRISTINE A.; SEITZ, KEITH W.; HOHL, BRIAN P.; MARTINO, MARC GREGORY
To: GREATBATCH LTD.
Reel/Frame 068295/0865 →
Continuity (6)
Continuation 17165500 · Feb 2, 2021
Continuation 16362043 · Mar 22, 2019
Continuation In Part 16121716 · Sep 5, 2018
Continuation In Part 15943998 · Apr 3, 2018
Provisional Application 62646522 · Mar 22, 2018
Related Publication 20240390688A1 · Nov 28, 2024
References Cited (400)
US 3681612A · Kinzler et al. · 1972 [cited by applicant]
US 3745430A · Kerr et al. · 1973 [cited by applicant]
US 3871382A · Mann · 1975 [cited by applicant]
US 3961294A · Hollyday · 1976 [cited by applicant]
US 3968802A · Ballis · 1976 [cited by applicant]
US 3980975A · Maxon et al. · 1976 [cited by applicant]
US 4188598A · Hunt · 1980 [cited by applicant]
US 4236127A · Scherba · 1980 [cited by applicant]
US 4295467A · Mann et al. · 1981 [cited by applicant]
US 4320763A · Money · 1982 [cited by applicant]
US 4424551A · Stevenson et al. · 1984 [cited by applicant]
US 4431005A · McCormick · 1984 [cited by applicant]
US 4437474A · Peers-Trevarton et al. · 1984 [cited by applicant]
US 4445501A · Bresler · 1984 [cited by applicant]
US 4572198A · Codrington · 1986 [cited by applicant]
US 4585001A · Belt · 1986 [cited by applicant]
US 4633181A · Murphy-Boesch et al. · 1986 [cited by applicant]
US 4643186A · Rosen et al. · 1987 [cited by applicant]
US 4654880A · Sontag · 1987 [cited by applicant]
US 4672972A · Berke · 1987 [cited by applicant]
US 4689621A · Kleinberg · 1987 [cited by applicant]
US 4712555A · Thornander et al. · 1987 [cited by applicant]
US 4746864A · Satoh et al. · 1988 [cited by applicant]
US 4754752A · Ginsburg et al. · 1988 [cited by applicant]
US 4757820A · Itoh · 1988 [cited by applicant]
US 4766381A · Conturo et al. · 1988 [cited by applicant]
US 4788980A · Mann et al. · 1988 [cited by applicant]
US 4799499A · Bisping · 1989 [cited by applicant]
US 4813429A · Eshel et al. · 1989 [cited by applicant]
US 4823812A · Eshel et al. · 1989 [cited by applicant]
US 4832023A · Murphy-Chutorian et al. · 1989 [cited by applicant]
US 4858064A · Segawa et al. · 1989 [cited by applicant]
US 4858623A · Bradshaw et al. · 1989 [cited by applicant]
US 4859950A · Keren · 1989 [cited by applicant]
US 4932411A · Fritschy et al. · 1990 [cited by applicant]
US 4940052A · Mann et al. · 1990 [cited by applicant]
US 4944298A · Sholder · 1990 [cited by applicant]
US 4960106A · Kubokawa et al. · 1990 [cited by applicant]
US 4989608A · Ratner · 1991 [cited by applicant]
US 4991580A · Moore · 1991 [cited by applicant]
US 5019075A · Spears et al. · 1991 [cited by applicant]
US 5039965A · Higgins · 1991 [cited by applicant]
US 5044375A · Bach et al. · 1991 [cited by applicant]
US 5052404A · Hodgson et al. · 1991 [cited by applicant]
US 5063348A · Kuhara et al. · 1991 [cited by applicant]
US 5095911A · Pomeranz · 1992 [cited by applicant]
US 5099208A · Fitzpatrick et al. · 1992 [cited by applicant]
US 5167233A · Eberle et al. · 1992 [cited by applicant]
US 5178618A · Kandarpa · 1993 [cited by applicant]
US 5190046A · Shturman · 1993 [cited by applicant]
US 5197468A · Proctor et al. · 1993 [cited by applicant]
US 5209233A · Holland et al. · 1993 [cited by applicant]
US 5211165A · Dumoulin et al. · 1993 [cited by applicant]
US 5217010A · Tsitlik et al. · 1993 [cited by applicant]
US 5222506A · Patrick et al. · 1993 [cited by applicant]
US 5246438A · Langberg · 1993 [cited by applicant]
US 5251120A · Smith · 1993 [cited by applicant]
US 5268810A · DiMarco et al. · 1993 [cited by applicant]
US 5271400A · Dumoulin et al. · 1993 [cited by applicant]
US 5300108A · Rebell et al. · 1994 [cited by applicant]
US 5306291A · Kroll et al. · 1994 [cited by applicant]
US 5307808A · Dumoulin et al. · 1994 [cited by applicant]
US 5307814A · Kressel et al. · 1994 [cited by applicant]
US 5318025A · Dumoulin et al. · 1994 [cited by applicant]
US 5323776A · Blakeley et al. · 1994 [cited by applicant]
US 5323778A · Kandarpa et al. · 1994 [cited by applicant]
US 5331505A · Wilheim · 1994 [cited by applicant]
US 5333095A · Stevenson · 1994 [cited by examiner]
US 5334045A · Cappa et al. · 1994 [cited by applicant]
US 5334193A · Nardella · 1994 [cited by applicant]
US 5348010A · Schnall et al. · 1994 [cited by applicant]
US 5352979A · Conturo · 1994 [cited by applicant]
US 5358515A · Hurter et al. · 1994 [cited by applicant]
US 5363845A · Chowdhury et al. · 1994 [cited by applicant]
US 5365928A · Rhinehart et al. · 1994 [cited by applicant]
US 5370644A · Langberg · 1994 [cited by applicant]
US 5398683A · Edwards et al. · 1995 [cited by applicant]
US 5400787A · Marandos · 1995 [cited by applicant]
US 5404880A · Throne · 1995 [cited by applicant]
US 5413104A · Buijs et al. · 1995 [cited by applicant]
US 5419325A · Dumoulin et al. · 1995 [cited by applicant]
US 5428337A · Mnclarelli et al. · 1995 [cited by applicant]
US 5433717A · Rubinsky et al. · 1995 [cited by applicant]
US 5437277A · Dumoulin et al. · 1995 [cited by applicant]
US 5443066A · Dumoulin et al. · 1995 [cited by applicant]
US 5443489A · Ben-Haim · 1995 [cited by applicant]
US 5447156A · Dumoulin et al. · 1995 [cited by applicant]
US 5450090A · Gels et al. · 1995 [cited by applicant]
US 5451232A · Rhinehart et al. · 1995 [cited by applicant]
US 5462055A · Casey et al. · 1995 [cited by applicant]
US 5466254A · Helland · 1995 [cited by applicant]
US 5476095A · Schnall et al. · 1995 [cited by applicant]
US 5476483A · Bornzin et al. · 1995 [cited by applicant]
US 5491300A · Huppenthal et al. · 1996 [cited by applicant]
US 5493259A · Blalock et al. · 1996 [cited by applicant]
US 5498261A · Strul · 1996 [cited by applicant]
US 5507743A · Edwards et al. · 1996 [cited by applicant]
US 5512825A · Atalar et al. · 1996 [cited by applicant]
US 5514173A · Rebell et al. · 1996 [cited by applicant]
US 5540679A · Fram et al. · 1996 [cited by applicant]
US 5545201A · Helland et al. · 1996 [cited by applicant]
US 5558093A · Pomeranz · 1996 [cited by applicant]
US 5578008A · Hara · 1996 [cited by applicant]
US 5588432A · Crowley · 1996 [cited by applicant]
US 5590657A · Cain et al. · 1997 [cited by applicant]
US 5591218A · Jacobson · 1997 [cited by applicant]
US 5620476A · Truex et al. · 1997 [cited by applicant]
US 5623241A · Minkoff · 1997 [cited by applicant]
US 5623724A · Gurkovich et al. · 1997 [cited by applicant]
US 5629622A · Scampini · 1997 [cited by applicant]
US 5650759A · Hittman et al. · 1997 [cited by applicant]
US 5662108A · Budd et al. · 1997 [cited by applicant]
US 5682897A · Pomeranz · 1997 [cited by applicant]
US 5683435A · Truex et al. · 1997 [cited by applicant]
US 5685878A · Falwell et al. · 1997 [cited by applicant]
US 5697958A · Paul et al. · 1997 [cited by applicant]
US 5699801A · Atalar et al. · 1997 [cited by applicant]
US 5700548A · Warnier et al. · 1997 [cited by applicant]
US 5706810A · Rubinsky et al. · 1998 [cited by applicant]
US 5715825A · Crowley · 1998 [cited by applicant]
US 5716390A · Li · 1998 [cited by applicant]
US 5722998A · Prutchi et al. · 1998 [cited by applicant]
US 5735884A · Thompson et al. · 1998 [cited by applicant]
US 5735887A · Barreras et al. · 1998 [cited by applicant]
US 5741321A · Brennen · 1998 [cited by applicant]
US 5751539A · Stevenson et al. · 1998 [cited by applicant]
US 5757252A · Cho et al. · 1998 [cited by applicant]
US 5759202A · Schroeppel · 1998 [cited by applicant]
US 5765779A · Hancock et al. · 1998 [cited by applicant]
US 5769800A · Gelfand et al. · 1998 [cited by applicant]
US 5772693A · Brownlee · 1998 [cited by applicant]
US 5775338A · Hastings · 1998 [cited by applicant]
US 5779669A · Haissaguerre et al. · 1998 [cited by applicant]
US 5782891A · Hassler et al. · 1998 [cited by applicant]
US 5792055A · McKinnon · 1998 [cited by applicant]
US 5800467A · Park et al. · 1998 [cited by applicant]
US 5822174A · Yamate et al. · 1998 [cited by applicant]
US 5824026A · Diaz et al. · 1998 [cited by applicant]
US 5824029A · Weijand et al. · 1998 [cited by applicant]
US 5833608A · Acker · 1998 [cited by applicant]
US 5836992A · Thompson et al. · 1998 [cited by applicant]
US 5840031A · Crowley · 1998 [cited by applicant]
US 5851226A · Skubitz et al. · 1998 [cited by applicant]
US 5855995A · Haq et al. · 1999 [cited by applicant]
US 5864234A · Luedeke · 1999 [cited by applicant]
US 5867361A · Seifried et al. · 1999 [cited by applicant]
US 5868674A · Glowinski et al. · 1999 [cited by applicant]
US 5879347A · Saadat · 1999 [cited by applicant]
US 5891134A · Goble et al. · 1999 [cited by applicant]
US 5896267A · Hittman et al. · 1999 [cited by applicant]
US 5905627A · Brendel et al. · 1999 [cited by applicant]
US 5916162A · Snelten et al. · 1999 [cited by applicant]
US 5928145A · Ocali et al. · 1999 [cited by applicant]
US 5928159A · Eggers et al. · 1999 [cited by applicant]
US 5929729A · Swarup · 1999 [cited by applicant]
US 5938609A · Pomeranz · 1999 [cited by applicant]
US 5938692A · Rudie · 1999 [cited by applicant]
US 5959336A · Barsan · 1999 [cited by applicant]
US 5959829A · Stevenson et al. · 1999 [cited by applicant]
US 5964705A · Truwit et al. · 1999 [cited by applicant]
US 5973906A · Stevenson et al. · 1999 [cited by applicant]
US 5973907A · Reed · 1999 [cited by applicant]
US 5978204A · Stevenson · 1999 [cited by applicant]
US 6004269A · Crowley et al. · 1999 [cited by applicant]
US 6008980A · Stevenson et al. · 1999 [cited by applicant]
US 6011995A · Guglielmi et al. · 2000 [cited by applicant]
US 6026316A · Kucharczyk et al. · 2000 [cited by applicant]
US 6027500A · Buckles et al. · 2000 [cited by applicant]
US 6031375A · Atalar et al. · 2000 [cited by applicant]
US 6031710A · Wolf et al. · 2000 [cited by applicant]
US 6041496A · Haq et al. · 2000 [cited by applicant]
US 6045532A · Eggers et al. · 2000 [cited by applicant]
US 6052614A · Morris et al. · 2000 [cited by applicant]
US 6055457A · Bonner · 2000 [cited by applicant]
US 6066136A · Geistert · 2000 [cited by applicant]
US 6099524A · Lipson et al. · 2000 [cited by applicant]
US 6101417A · Vogel et al. · 2000 [cited by applicant]
US 6128522A · Acker et al. · 2000 [cited by applicant]
US 6129670A · Burdette et al. · 2000 [cited by applicant]
US 6137161A · Gilliland et al. · 2000 [cited by applicant]
US 6141594A · Flynn et al. · 2000 [cited by applicant]
US 6146743A · Haq et al. · 2000 [cited by applicant]
US 6159560A · Stevenson et al. · 2000 [cited by applicant]
US 6171240B1 · Young et al. · 2001 [cited by applicant]
US 6171241B1 · McVeigh et al. · 2001 [cited by applicant]
US 6188219B1 · Reeder et al. · 2001 [cited by applicant]
US 6198972B1 · Hartlaub et al. · 2001 [cited by applicant]
US 6209764B1 · Hartlaub et al. · 2001 [cited by applicant]
US 6226545B1 · Gilderdale · 2001 [cited by applicant]
US 6236205B1 · Lüdeke et al. · 2001 [cited by applicant]
US 6238390B1 · Tu et al. · 2001 [cited by applicant]
US 6252761B1 · Branchevsky · 2001 [cited by applicant]
US 6263229B1 · Atalar et al. · 2001 [cited by applicant]
US 6272370B1 · Gillies et al. · 2001 [cited by applicant]
US 6275369B1 · Stevenson et al. · 2001 [cited by applicant]
US 6275379B1 · Sleboda et al. · 2001 [cited by applicant]
US 6280385B1 · Melzer et al. · 2001 [cited by applicant]
US 6284080B1 · Haq et al. · 2001 [cited by applicant]
US 6284971B1 · Atalar et al. · 2001 [cited by applicant]
US 6332089B1 · Acker et al. · 2001 [cited by applicant]
US 6370427B1 · Alt et al. · 2002 [cited by applicant]
US 6373673B1 · Anthony · 2002 [cited by applicant]
US 6390996B1 · Halperin et al. · 2002 [cited by applicant]
US 6395637B1 · Park et al. · 2002 [cited by applicant]
US 6408202B1 · Lima et al. · 2002 [cited by applicant]
US 6414835B1 · Wolf et al. · 2002 [cited by applicant]
US 6424234B1 · Stevenson · 2002 [cited by applicant]
US 6428537B1 · Swanson et al. · 2002 [cited by applicant]
US 6433653B1 · Matsumura et al. · 2002 [cited by applicant]
US 6456481B1 · Stevenson · 2002 [cited by applicant]
US 6459935B1 · Piersma · 2002 [cited by applicant]
US 6470545B1 · Branchevsky · 2002 [cited by applicant]
US 6473291B1 · Stevenson · 2002 [cited by applicant]
US 6473314B1 · Custer et al. · 2002 [cited by applicant]
US 6486529B2 · Chi et al. · 2002 [cited by applicant]
US 6493591B1 · Stokes · 2002 [cited by applicant]
US 6512666B1 · Duva · 2003 [cited by applicant]
US 6529103B1 · Brendel et al. · 2003 [cited by applicant]
US 6535766B1 · Thompson et al. · 2003 [cited by applicant]
US 6539253B2 · Thompson et al. · 2003 [cited by applicant]
US 6539261B2 · Dal Molin · 2003 [cited by applicant]
US 6549800B1 · Atalar et al. · 2003 [cited by applicant]
US 6556009B2 · Kellman et al. · 2003 [cited by applicant]
US 6566978B2 · Stevenson et al. · 2003 [cited by applicant]
US 6567259B2 · Stevenson et al. · 2003 [cited by applicant]
US 6567703B1 · Thompson et al. · 2003 [cited by applicant]
US 6593884B1 · Gilboa et al. · 2003 [cited by applicant]
US 6606513B2 · Lardo et al. · 2003 [cited by applicant]
US 6615483B2 · Lindegren · 2003 [cited by applicant]
US 6628980B2 · Atalar et al. · 2003 [cited by applicant]
US 6633780B1 · Berger · 2003 [cited by applicant]
US 6643903B2 · Stevenson et al. · 2003 [cited by applicant]
US 6654628B1 · Silber et al. · 2003 [cited by applicant]
US 6660116B2 · Wolf · 2003 [cited by applicant]
US 6675033B1 · Lardo et al. · 2004 [cited by applicant]
US 6675036B2 · Kreger et al. · 2004 [cited by applicant]
US 6675779B2 · King et al. · 2004 [cited by applicant]
US 6675780B1 · Wendels et al. · 2004 [cited by applicant]
US 6687550B1 · Doan · 2004 [cited by applicant]
US 6690963B2 · Ben-Haim et al. · 2004 [cited by applicant]
US 6694583B2 · Branchevsky · 2004 [cited by applicant]
US 6697675B1 · Safarevich et al. · 2004 [cited by applicant]
US 6701176B1 · Halperin et al. · 2004 [cited by applicant]
US 6714809B2 · Lee et al. · 2004 [cited by applicant]
US 6728575B2 · Hedberg · 2004 [cited by applicant]
US 6728579B1 · Lindgren et al. · 2004 [cited by applicant]
US 6759388B1 · Marchant et al. · 2004 [cited by applicant]
US 6765779B2 · Stevenson et al. · 2004 [cited by applicant]
US 6765780B2 · Brendel et al. · 2004 [cited by applicant]
US 6768630B2 · Togashi · 2004 [cited by applicant]
US 6771067B2 · Kellman et al. · 2004 [cited by applicant]
US 6795730B2 · Connelly et al. · 2004 [cited by applicant]
US 6806806B2 · Anthony · 2004 [cited by applicant]
US 6823215B2 · Obel et al. · 2004 [cited by applicant]
US 6829509B1 · MacDonald et al. · 2004 [cited by applicant]
US 6847837B1 · Melzer et al. · 2005 [cited by applicant]
US 6868288B2 · Thompson · 2005 [cited by applicant]
US 6871091B2 · Wilkinson et al. · 2005 [cited by applicant]
US 6876885B2 · Swoyer et al. · 2005 [cited by applicant]
US 6882248B2 · Stevenson et al. · 2005 [cited by applicant]
US 6888715B2 · Stevenson et al. · 2005 [cited by applicant]
US 6898454B2 · Atalar et al. · 2005 [cited by applicant]
US 6901292B2 · Hrdlicka et al. · 2005 [cited by applicant]
US 6904307B2 · Karmarkar et al. · 2005 [cited by applicant]
US 6925328B2 · Foster et al. · 2005 [cited by applicant]
US 6930242B1 · Helfer et al. · 2005 [cited by applicant]
US 6931283B1 · Magnusson · 2005 [cited by applicant]
US 6931286B2 · Sigg et al. · 2005 [cited by applicant]
US 6934588B1 · Brand et al. · 2005 [cited by applicant]
US 6944489B2 · Zeijlemaker et al. · 2005 [cited by applicant]
US 6944507B2 · Fröberg et al. · 2005 [cited by applicant]
US 6949929B2 · Gray et al. · 2005 [cited by applicant]
US 6950696B2 · Björling et al. · 2005 [cited by applicant]
US 6952613B2 · Swoyer et al. · 2005 [cited by applicant]
US 6971391B1 · Wang et al. · 2005 [cited by applicant]
US 6985347B2 · Stevenson et al. · 2006 [cited by applicant]
US 6985775B2 · Reinke et al. · 2006 [cited by applicant]
US 6987660B2 · Stevenson et al. · 2006 [cited by applicant]
US 6999818B2 · Stevenson et al. · 2006 [cited by applicant]
US 7012192B2 · Stevenson et al. · 2006 [cited by applicant]
US 7013180B2 · Dougherty et al. · 2006 [cited by applicant]
US 7015393B2 · Weiner et al. · 2006 [cited by applicant]
US 7035076B1 · Stevenson · 2006 [cited by applicant]
US 7038900B2 · Stevenson et al. · 2006 [cited by applicant]
US 7039455B1 · Brosovich et al. · 2006 [cited by applicant]
US 7046499B1 · Imani et al. · 2006 [cited by applicant]
US 7047073B2 · Höijer et al. · 2006 [cited by applicant]
US 7050855B2 · Zeijlemaker et al. · 2006 [cited by applicant]
US 7068491B1 · Burdon et al. · 2006 [cited by applicant]
US 7091412B2 · Wang et al. · 2006 [cited by applicant]
US 7092766B1 · Salys et al. · 2006 [cited by applicant]
US 7110227B2 · Anthony et al. · 2006 [cited by applicant]
US 7113387B2 · Stevenson et al. · 2006 [cited by applicant]
US 7123013B2 · Gray · 2006 [cited by applicant]
US 7127294B1 · Wang et al. · 2006 [cited by applicant]
US 7136273B2 · Stevenson et al. · 2006 [cited by applicant]
US 7148783B2 · Parsche et al. · 2006 [cited by applicant]
US 7149578B2 · Edvardsson · 2006 [cited by applicant]
US 7149773B2 · Haller et al. · 2006 [cited by applicant]
US 7155271B2 · Halperin et al. · 2006 [cited by applicant]
US 7162302B2 · Wang et al. · 2007 [cited by applicant]
US 7164572B1 · Burdon et al. · 2007 [cited by applicant]
US 7164950B2 · Kroll et al. · 2007 [cited by applicant]
US 7174219B2 · Wahlstrand et al. · 2007 [cited by applicant]
US 7174223B2 · Money et al. · 2007 [cited by applicant]
US 7199995B2 · Stevenson · 2007 [cited by applicant]
US 7211103B2 · Greenberg et al. · 2007 [cited by applicant]
US 7236816B2 · Kumar et al. · 2007 [cited by applicant]
US 7236834B2 · Christopherson et al. · 2007 [cited by applicant]
US 7276474B2 · Marchant et al. · 2007 [cited by applicant]
US 7301748B2 · Anthony et al. · 2007 [cited by applicant]
US 7310216B2 · Stevenson et al. · 2007 [cited by applicant]
US 7319905B1 · Morgan et al. · 2008 [cited by applicant]
US 7322832B2 · Kronich et al. · 2008 [cited by applicant]
US 7327553B2 · Brendel · 2008 [cited by applicant]
US 7363090B2 · Halperin et al. · 2008 [cited by applicant]
US 7369898B1 · Kroll et al. · 2008 [cited by applicant]
US 7387928B2 · Cheung · 2008 [cited by applicant]
US 7388378B2 · Gray et al. · 2008 [cited by applicant]
US 7422568B2 · Yang et al. · 2008 [cited by applicant]
US 7423860B2 · Anthony et al. · 2008 [cited by applicant]
US 7428136B2 · Barnett · 2008 [cited by applicant]
US 7433168B2 · Anthony · 2008 [cited by applicant]
US 7436672B2 · Ushijima et al. · 2008 [cited by applicant]
US 7439449B1 · Kumar et al. · 2008 [cited by applicant]
US 7446996B2 · Togashi · 2008 [cited by applicant]
US 7450396B2 · Ye et al. · 2008 [cited by applicant]
US 7480988B2 · Ok et al. · 2009 [cited by applicant]
US 7489495B2 · Stevenson · 2009 [cited by applicant]
US 7495884B2 · Togashi · 2009 [cited by applicant]
US 7517769B2 · Van Schuylenbergh et al. · 2009 [cited by applicant]
US 7529590B2 · MacDonald · 2009 [cited by applicant]
US 7535693B2 · Stevenson et al. · 2009 [cited by applicant]
US 7551963B2 · Rusin et al. · 2009 [cited by applicant]
US 7561906B2 · Atalar et al. · 2009 [cited by applicant]
US 7586728B2 · Anthony · 2009 [cited by applicant]
US 7593208B2 · Anthony et al. · 2009 [cited by applicant]
US 7623335B2 · Stevenson et al. · 2009 [cited by applicant]
US 7675729B2 · Anthony et al. · 2010 [cited by applicant]
US 7679926B2 · Hsu et al. · 2010 [cited by applicant]
US 7689288B2 · Stevenson et al. · 2010 [cited by applicant]
US 7693576B1 · Lavie et al. · 2010 [cited by applicant]
US 7702387B2 · Stevenson et al. · 2010 [cited by applicant]
US 7719854B2 · Youker et al. · 2010 [cited by applicant]
US 7729770B2 · Cabelka et al. · 2010 [cited by applicant]
US 7733621B2 · Anthony et al. · 2010 [cited by applicant]
US 7797048B2 · Stevenson et al. · 2010 [cited by applicant]
US 7812691B1 · Fisk et al. · 2010 [cited by applicant]
US 7839146B2 · Gray · 2010 [cited by applicant]
US 7844319B2 · Susil et al. · 2010 [cited by applicant]
US 7844343B2 · Wahlstrand et al. · 2010 [cited by applicant]
US 7853324B2 · Stevenson et al. · 2010 [cited by applicant]
US 7899551B2 · Westlund et al. · 2011 [cited by applicant]
US 7901761B1 · Jiang et al. · 2011 [cited by applicant]
US 7957806B2 · Stevenson et al. · 2011 [cited by applicant]
US 7989080B2 · Greenberg et al. · 2011 [cited by applicant]
US 8000804B1 · Wessendorf et al. · 2011 [cited by applicant]
US 8043454B1 · Jiang et al. · 2011 [cited by applicant]
US 8095224B2 · Truex et al. · 2012 [cited by applicant]
US 8131376B1 · Greenberg et al. · 2012 [cited by applicant]
US 8163397B2 · Ok et al. · 2012 [cited by applicant]
US 8179658B2 · Stevenson et al. · 2012 [cited by applicant]
US 8219208B2 · Stevenson et al. · 2012 [cited by applicant]
US 8301249B2 · Min · 2012 [cited by applicant]
US 8494635B2 · Guebler et al. · 2013 [cited by applicant]
US 8528201B2 · Guebler et al. · 2013 [cited by applicant]
US 8588916B2 · Satou et al. · 2013 [cited by applicant]
US 8604341B2 · Barry et al. · 2013 [cited by applicant]
US 8653384B2 · Tang et al. · 2014 [cited by applicant]
US 8659870B2 · Brendel et al. · 2014 [cited by applicant]
US 8670829B2 · Morioka et al. · 2014 [cited by applicant]
US 8755887B2 · Troetzschel et al. · 2014 [cited by applicant]
US 8763245B1 · Lucisano et al. · 2014 [cited by applicant]
US 8841558B2 · Satou et al. · 2014 [cited by applicant]
US 8855768B1 · Dabney et al. · 2014 [cited by applicant]
US 8872035B2 · Satou et al. · 2014 [cited by applicant]
US 8874206B2 · Malinowski et al. · 2014 [cited by applicant]
US 8886320B2 · Wollenberg et al. · 2014 [cited by applicant]
US 8927862B2 · Barry et al. · 2015 [cited by applicant]
US 8929987B2 · Troetzschel et al. · 2015 [cited by applicant]
US 8938309B2 · Marzano et al. · 2015 [cited by applicant]
US 9008779B2 · Satou et al. · 2015 [cited by applicant]
US 9032614B2 · Specht · 2015 [cited by applicant]
US 9108066B2 · Woods et al. · 2015 [cited by applicant]
US 9233253B2 · Stevenson et al. · 2016 [cited by applicant]
US 9407076B2 · Troetzschel et al. · 2016 [cited by applicant]
US 9418778B2 · Makino et al. · 2016 [cited by applicant]
US 9427596B2 · Brendel et al. · 2016 [cited by applicant]
US 9431814B2 · Blilie et al. · 2016 [cited by applicant]
US 9480168B2 · Troetzschel et al. · 2016 [cited by applicant]
US 9492659B2 · Brendel et al. · 2016 [cited by applicant]
US 9552899B2 · Specht et al. · 2017 [cited by applicant]
US 9764129B2 · Stevenson et al. · 2017 [cited by applicant]
US 10350421B2 · Stevenson et al. · 2019 [cited by applicant]
US 10596369B2 · Stevenson et al. · 2020 [cited by applicant]
US 12064639B2 · Stevenson · 2024 [cited by examiner]
US 20020055678A1 · Scott et al. · 2002 [cited by applicant]
US 20020095197A1 · Lardo et al. · 2002 [cited by applicant]
US 20020177771A1 · Guttman et al. · 2002 [cited by applicant]
US 20020192688A1 · Yang et al. · 2002 [cited by applicant]