THERMAL ANALYSIS DEVICE
Disclosed is a thermal analysis device including a probe for applying a load to a sample S, a force generator for generating and applying a force to the probe, displacement detectors for detecting the displacement of the probe to measure the mechanical properties of the sample, a force signal generator for generating a force signal to activate the force generator, a load detector for detecting a load applied to the sample, and furnaces for heating the sample. The force signal generator includes a digital signal generator that generates a digital signal of the force signal, multiple D/A converters that convert the digital signals into analog signals, and multiple amplifiers that amplify each of the analog signals output from the respective D/A converters by different amplification factors. The force signal generator outputs the analog signal amplified by at least one of the multiple amplifiers as the force signal.
1 . A thermal analysis device comprising:
a probe that extends in an axial direction, one end side of the probe contacting a sample directly or indirectly to apply a load to the sample;
a force generator provided at another end side of the probe and configured to generate a force in the axial direction of the probe;
a displacement detector that detects a displacement in the axial direction of the probe to measure a mechanical property of the sample;
a force signal generator that generates a force signal to activate the force generator;
a load detector that detects a load applied to the sample; and
a furnace for heating the sample;
wherein the force signal generator comprises a digital signal generator that generates a digital signal of the force signal, a plurality of D/A converters that convert the digital signal into an analog signal, and a plurality of amplifiers that amplify the analog signal output from each of the plurality of D/A converters by different amplification factors, respectively; and
the force signal generator outputs the analog signal amplified by at least one of the plurality of amplifiers as the force signal.
2 . The thermal analysis device according to claim 1 , wherein a difference in the amplification factor of each of the plurality of amplifiers is greater than or equal to 2 times.
3 . The thermal analysis device according to claim 1 , wherein the thermal analysis device comprises a plurality of digital signal generators, each of which generating a different digital signal, and comprises a plurality of the D/A converters and a plurality of the amplifiers for each of the plurality of digital signal generators.
4 . The thermal analysis device according to claim 2 , wherein the thermal analysis device comprises a plurality of digital signal generators, each of which generating a different digital signal, and comprises a plurality of the D/A converters and a plurality of the amplifiers for each of the plurality of digital signal generators.
5 . thermal analysis device according to claim of 3 , wherein the different digital signals comprise an AC signal that oscillates over time and a DC signal that is constant over time.
6 . thermal analysis device according to claim of 4 , wherein the different digital signals comprise an AC signal that oscillates over time and a DC signal that is constant over time.