IP Library › Granted Patent US 12,596,610
Granted Patent B2
US 12,596,610 · App. 18/800,272 · Granted Apr 7, 2026

Parity data in dynamic random access memory (DRAM)

Inventors: Sai Krishna Mylavarapu (Folsom, CA); Todd A. Marquart (Boise, ID)
Assignee: Micron Technology, Inc.
G06F11/1004G06F11/1068G11C11/005G11C11/4074G11C11/4096
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Quick Facts
Patent No.
US 12,596,610
App. No.
18/800,272
Granted
Apr 7, 2026
Kind
B2
Abstract

Methods, devices, and systems related to storing parity data in dynamic random access memory (DRAM) are described. In an example, a method can include generating, at a controller, parity data based on user data queued for writing to a non-volatile memory device, receiving the parity data at a DRAM device from the controller and writing the parity data to the DRAM device, receiving the user data at a non-volatile memory device from the controller and writing the user data to the non-volatile memory device, reading the user data from the non-volatile memory device via the controller, and receiving the parity data at the controller from the DRAM device.

Claims (32)

1 . A method, comprising:

receiving user data from a non-volatile memory device at a controller of a dual in-line memory module (DIMM);

receiving parity data corresponding to the user data from a dynamic random access memory (DRAM) device at the controller; and

reconstructing the user data at the controller using the parity data.

2 . The method of claim 1 , further comprising regenerating the parity data in response to powering off and powering on the DRAM device.

3 . The method of claim 1 , further comprising receiving the parity data in response to a read failure.

4 . The method of claim 3 , further comprising reconstructing the user data in response to the read failure.

5 . The method of claim 4 , wherein the read failure is due to corrupted memory in the non-volatile memory device.

6 . The method of claim 1 , further comprising reading the user data and reconstructing the user data in one clock cycle.

7 . The method of claim 1 , further comprising generating the parity data at the controller by performing an error correction code (ECC) operation on the user data.

8 . The method of claim 1 , further comprising performing a RAID operation on the user data to generate the parity data at the controller.

9 . A dual in-line memory module (DIMM), comprising:

a dynamic random access memory (DRAM) device;

a non-volatile memory device coupled to the DRAM device, wherein the non-volatile memory device is configured to store user data; and

a controller coupled to the DRAM device and the non-volatile memory device, wherein the controller is configured to:

receive the user data from the non-volatile memory device; and

perform an error correction code (ECC) operation on the user data to regenerate parity data.

10 . The DIMM of claim 9 , wherein the controller is configured to perform the ECC operation on the user data to regenerate the parity data in response to powering on the DRAM device.

11 . The DIMM of claim 9 , wherein the controller comprises an error correction code (ECC) module configured to perform the ECC operation.

12 . The DIMM of claim 9 , wherein the ECC operation is an XOR operation.

13 . The DIMM of claim 9 , wherein the controller is configured to perform the ECC operation in one clock cycle.

14 . The DIMM of claim 9 , wherein the controller is configured to rewrite the parity data to the DRAM device in response to powering on the DRAM device.

15 . A dual in-line memory module (DIMM), comprising:

a controller configured to generate parity data based on user data;

a dynamic random access memory (DRAM) device configured to store the parity data; and

a non-volatile memory device configured to store the parity data prior to powering off the DRAM device; and

wherein the controller is configured to rewrite the parity data to the DRAM device in response to powering on the DRAM device.

16 . The DIMM of claim 15 , wherein the non-volatile memory device is configured to store the user data.

17 . The DIMM of claim 15 , wherein the non-volatile memory device is a 3D Cross-point device.

18 . The DIMM of claim 15 , wherein the controller is configured to generate the parity data based on the user data in response to receiving a write command.

19 . The DIMM of claim 18 , wherein the write command includes the user data.

20 . The DIMM of claim 15 , wherein the user data is queued for writing to the non-volatile memory device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 12, 2024
From: MYLAVARAPU, SAI KRISHNA; MARQUART, TODD A.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 068247/0291 →
Continuity (3)
Continuation 18108876 · Feb 13, 2023
Continuation 17130885 · Dec 22, 2020
Related Publication 20240403160A1 · Dec 5, 2024
References Cited (14)
US 8041989B2 · Lastras-Montano et al. · 2011 [cited by applicant]
US 8086783B2 · O'Connor et al. · 2011 [cited by applicant]
US 10459793B2 · Bandic et al. · 2019 [cited by applicant]
US 10606692B2 · Coteus et al. · 2020 [cited by applicant]
US 20150248329A1 · Kang et al. · 2015 [cited by applicant]
US 20160162359A1 · Kittner · 2016 [cited by applicant]
US 20180024897A1 · Cai et al. · 2018 [cited by applicant]
US 20180129600A1 · Ishiyama et al. · 2018 [cited by applicant]
US 20190065306A1 · Margetts · 2019 [cited by applicant]
US 20200042247A1 · Ryu · 2020 [cited by examiner]
US 20210055985A1 · Lee et al. · 2021 [cited by applicant]
US 20210374003A1 · Helmick et al. · 2021 [cited by applicant]
US 20220050604A1 · Kim · 2022 [cited by examiner]
US 20220108762A1 · Jang · 2022 [cited by applicant]