MONITORS FOR PRESSURIZED SYSTEMS
Monitors are for pressurized systems are described. These may include batteryless monitors that run on power harvested from their environments.
1 . A probe tip, comprising:
a first portion configured to connect to a sensing assembly, the first portion having a first width in a direction normal to a central axis of the probe tip, the first portion also having a first internal cavity that includes at least a portion of the central axis of the probe tip;
a second portion connected to the first portion, the second portion having a second width in a direction normal to the central axis of the probe tip, the second width being larger than the first width and defining an external surface of the second portion configured to engage with an external object; and
a temperature sensing element configured to generate a sensing signal representing a temperature of the external object, the temperature sensing element being secured to an internal surface of the second portion, the internal surface being opposite and in thermal communication with the external surface.
2 . The probe tip of claim 1 , wherein the temperature sensing element includes one or more of: a thermistor, a thermocouple, or a resistance temperature detector (RTD).
3 . The probe tip of claim 1 , wherein the temperature sensing element includes a resistance temperature detector (RTD) having a planar orientation, the probe tip further comprising one or more conductors.
4 . The probe tip of claim 3 , the one or more conductors extending from the RTD into the first internal cavity of the first portion in a direction substantially perpendicular to the planar orientation of the RTD.
5 . The probe tip of claim 3 , further comprising potting material in the first internal cavity of the first portion that encompasses the RTD and the one or more conductors.
6 . The probe tip of claim 1 , further comprising a third portion connected to the first portion, the third portion having a third width in a direction normal to the central axis of the probe tip, the third width being larger than the first width.
7 . The probe tip of claim 6 , wherein the third portion also has a second internal cavity adjacent to the first internal cavity of the first portion that includes at least a portion of the central axis of the probe tip.
8 . The probe tip of claim 7 , wherein the second internal cavity is configured to receive a spring configured to force the external surface of the second portion toward the external object.
9 . The probe tip of claim 1 , wherein the probe tip is formed of nickel-plated aluminum.
10 . The probe tip of claim 1 , wherein the probe tip has a surface area adapted to contact a conduit to capture a temperature reading without breaching the conduit.