IP Library › Granted Patent US 12,366,483
Granted Patent B2
US 12,366,483 · App. 18/938,201 · Granted Jul 22, 2025

Wavefront sensors with irregular aperture masks, diffusers, and cameras, and methods of making and using the same

Inventors: Peter Pilarz (San Diego, CA); Jason Kuhn (San Diego, CA); Brian Dunne (San Diego, CA); Jesse Melrose (San Diego, CA)
Assignee: Quartus Engineering Incorporated
G01J9/00G06T7/0002G06T7/66G06T7/70G06T7/80
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Quick Facts
Patent No.
US 12,366,483
App. No.
18/938,201
Filed
Nov 5, 2024
Granted
Jul 22, 2025
Kind
B2
Art Unit
2422
USPC
348/135
Abstract

A wavefront sensor for measuring a wavefront that includes an aperture mask configured to receive incident light, the aperture mask comprising a plurality of apertures irregularly spaced and arranged in a plurality of sub-windows that respectively transmit sub-beams of the incident light. A diffuser can receive the sub-beams transmitted by the plurality of apertures. A controller of the sensor is configured to identify measured sub-beams by convolving the sub-beams imaged on the diffuser with a map of the plurality of apertures; and measure the wavefront of the incident light based on changes in position of the sub-beams in a digital image of the diffuser relative to both reference positions and neighboring sub-beams.

Claims (30)

1. A wavefront sensor for measuring a wavefront, comprising:

an aperture mask configured to receive incident light, the aperture mask comprising a plurality of apertures irregularly spaced and arranged in a plurality of sub-windows that transmit sub-beams of the incident light;

a diffuser configured to receive the sub-beams transmitted by the plurality of apertures;

a controller configured to:

identify measured sub-beams by convolving the sub-beams imaged on the diffuser with a map of the plurality of apertures; and

measure the wavefront of the incident light based on changes in position of the sub-beams in a digital image of the diffuser relative to reference positions and neighboring sub-beams.

2. The wavefront sensor of claim 1 , wherein the controller is configured to identify respective sub-beams in the digital image by a unique code.

3. The wavefront sensor of claim 1 , further comprising: a source of collimated light having the wavefront.

4. The wavefront sensor of claim 3 , wherein the source of collimated light comprises a laser.

5. The wavefront sensor of claim 3 , further comprising:

a beamsplitter configured to reflect light from the source to a surface the wavefront from which is to be measured.

6. The wavefront sensor of claim 4 , further comprising:

a beamsplitter configured to receive light that is reflected, diffused, or diffracted by a surface the wavefront from which is to be measured.

7. The wavefront sensor of claim 4 , further comprising:

a beamsplitter configured to transmit such light which then is incident on the mask.

8. The wavefront sensor of claim 1 , wherein the controller is configured to determine a null position of each sub-beam and calculate a displacement of each sub-beam from the null position.

9. The wavefront sensor of claim 1 , further comprising:

a camera having a focal plane in which the diffuser is located, the camera being configured to obtain the digital image of the diffuser.

10. A method for measuring a wavefront using a wavefront sensor, comprising:

identifying measured sub-beams by convolving the sub-beams imaged on a diffuser of the wavefront sensor with a map of a plurality of apertures of an aperture mask of the wavefront sensor, the aperture mask configured to receive incident light and comprising the plurality of apertures that are irregularly spaced and arranged in a plurality of sub-windows that transmit sub-beams of the incident light, the diffuser configured to receive the sub-beams transmitted by the plurality of apertures; and

measuring the wavefront of the incident light based on changes in position of the sub-beams in a digital image of the diffuser relative to reference positions and neighboring sub-beams.

11. The method of claim 10 , further comprising: generating collimated light having the wavefront.

12. The method of claim 11 , wherein a source of collimated light comprises a laser.

13. The method of claim 10 , further comprising: using a beamsplitter to reflect light from a source to a surface the wavefront from which is to be measured.

14. The method of claim 10 , further comprising: using a beamsplitter to receive light that is reflected, diffused, or diffracted by the surface the wavefront from which is to be measured.

15. The method of claim 10 , wherein the measuring the wavefront comprises detecting sub-beam centroids in the digital image.

16. The method of claim 10 , wherein the measuring the wavefront comprises undistorting sub-beam centroids in the digital image using an intrinsic camera calibration.

17. The method of claim 10 , wherein measuring the wavefront comprises measuring a tilt of the incident light.

18. The method of claim 10 , wherein measuring the wavefront comprises measuring a wavefront error of the incident light.

19. The method of claim 10 , wherein measuring the wavefront comprises determining a null position of each sub-beam and calculating each a displacement of each sub-beam from its null position.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 8, 2024
From: PILARZ, PETER; KUHN, JASON; DUNNE, BRIAN; MELROSE, JESSE
To: QUARTUS ENGINEERING INCORPORATED
Reel/Frame 069209/0337 →
Continuity (3)
Continuation 18256413
Provisional Application 63125742 · Dec 15, 2020
Related Publication 20250060254A1 · Feb 20, 2025
References Cited (21)
US 5629765A · Schmutz · 1997 [cited by applicant]
US 5825476A · Abitol · 1998 [cited by applicant]
US 6300073B1 · Zhao et al. · 2001 [cited by applicant]
US 6548797B1 · Ai · 2003 [cited by examiner]
US 6563947B1 · Droste · 2003 [cited by applicant]
US 6570143B1 · Neil · 2003 [cited by applicant]
US 7365838B2 · Jones · 2008 [cited by applicant]
US 7414712B2 · Yoon · 2008 [cited by applicant]
US 7988290B2 · Campbell · 2011 [cited by examiner]
US 8558996B2 · Otaki · 2013 [cited by applicant]
US 9679360B2 · Fleischer · 2017 [cited by examiner]
US 10648919B2 · Witte · 2020 [cited by applicant]
US 20140125860A1 · Tofsted · 2014 [cited by applicant]
US 20180324359A1 · Pan · 2018 [cited by applicant]
US 20190265107A1 · Wang · 2019 [cited by applicant]
DE 19919020C1 · 2001 [cited by applicant]
JP H0915057A · 1997 [cited by applicant]
WO 2000017612A1 · 2000 [cited by applicant]
WO 2018083573A1 · 2019 [cited by applicant]
International Search Report and Written Opinion for PCT/US2022/063348 dated Mar. 16, 2022; 14 pages. [cited by applicant]
Kuhn et al., “Measurement and Analysis of Wavefront Deviations and Distortions by Freeform Optical See-Through Head Mounted Displays,” Retrieved from the Internet: URL:https://www.proquest.com/docview/1803563511?pq-orig… [cited by applicant]