Circuit arrangement and device with combinatorial circuit and memory circuit, system and method
In accordance with an embodiment, a circuit arrangement includes a combinatorial circuit having a group of inputs and a group of outputs, where the combinatorial circuit is configured, during error-free operation of the combinatorial circuit, to map a codeword, present at the group of inputs, of a first error code to a codeword of a second error code at the group of outputs, and to map a non-codeword, present at the group of inputs, of the first error code to a non-codeword of the second error code; and a memory circuit configured to store an output of the combinatorial circuit at the group of outputs, and configured to correct at least 1-bit errors occurring during storage.
1 . A circuit arrangement, comprising:
a combinatorial circuit having a group of inputs and a group of outputs, wherein the combinatorial circuit is configured, during error-free operation of the combinatorial circuit, to map a codeword, present at the group of inputs, of a first error code to a codeword of a second error code at the group of outputs, and to map a non-codeword, present at the group of inputs, of the first error code to a non-codeword of the second error code; and
a memory circuit configured to store an output of the combinatorial circuit at the group of outputs, and configured to correct at least 1-bit errors occurring during storage.
2 . The circuit arrangement as claimed in claim 1 , further comprising:
an error detection circuit coupled to an output of the memory circuit, wherein the error detection circuit is configured to detect an error at the group of inputs of the combinatorial circuit or at the group of outputs of the combinatorial circuit based on read out from the memory circuit.
3 . The circuit arrangement as claimed in claim 1 , wherein the group of inputs comprises a first subgroup of inputs and a second group of inputs, and the first error code refers only to the first subgroup.
4 . The circuit arrangement as claimed in claim 1 , wherein the group of inputs comprises a first subgroup of inputs and a second subgroup of inputs, wherein the first error code comprises a first partial error code for the first subgroup and a second partial error code for the second subgroup.
5 . The circuit arrangement as claimed in claim 3 , wherein the second error code refers to all outputs of the group of outputs.
6 . The circuit arrangement as claimed in claim 1 , wherein the combinatorial circuit comprises a further group of outputs, wherein the combinatorial circuit is configured to provide an output at the further group of outputs based on an input at the group of inputs.
7 . A system, comprising a plurality of circuit arrangements as claimed in claim 1 , wherein a group of outputs of the memory circuit of a first circuit arrangement of the plurality of circuit arrangements is connected to the group of inputs of the combinatorial circuit of a second circuit arrangement of the plurality of circuit arrangements.
8 . A device, comprising:
a combinatorial circuit configured to:
receive a first bit signal containing first data bits and at least one first check bit, and
output a second bit signal containing second data bits and at least one second check bit,
during error-free operation:
map a codeword of a first error code present at the first data bits and the at least one first check bit being a codeword of a first error code to a codeword of a second error code at the second data bits and at the at least one second check bit, and
map a first word present at the first data bits and the at least one first check bit to a second word at the second data bits and the at least one second check bit, wherein the first word is not the codeword of the first error code, and the second word is not the codeword of the second error code; and
an arrangement of memory cells configured to store the second bit signal, and configured to correct at least 1-bit errors occurring during storage.
9 . The device as claimed in claim 8 , further comprising an error detection circuit configured to detect an error in the first bit signal or an error in the second bit signal based on an output of the arrangement of memory cells.
10 . The device as claimed in claim 8 , wherein, the combinatorial circuit is further configured to:
determine the at least one first check bit by a first predefined logic combination of the first data bits in response to the at least one first check bit and the first data bits forming a codeword of the first error code; and
determine the at least one second check bit by a second predefined logic combination of the second data bits in response to the at least one second check bit and the second data bits forming a codeword of the second error code.
11 . The device as claimed in claim 8 , wherein the first data bits and the at least one first check bit are a real subset of the bits of the first bit signal.
12 . The device as claimed in claim 8 , wherein the first data bits and the at least one first check bit are all bits of the first bit signal.
13 . The device as claimed in claim 8 , wherein the second data bits and the at least one second check bit are all bits of the second bit signal.
14 . The device as claimed in claim 8 , wherein the second data bits and the at least one second check bit are a real subset of the bits of the second bit signal.
15 . A method, comprising:
processing a first bit signal containing first data bits and at least one first check bit in order to generate a second bit signal containing second data bits and at least one second check bit, processing comprising, during error-free processing:
mapping a codeword of a first error code present at the first data bits and the at least one first check bit being a codeword of a first error code to a codeword of a second error code at the second data bits and at the at least one second check bit, and
mapping a first word present at the first data bits and the at least one first check bit to a second word at the second data bits and at the at least one second check bit, wherein the first word is not the codeword of the first error code, and the second word is not the codeword of the second error code;
storing the second bit signal in a memory; and
correcting at least 1-bit errors occurring while the second bit signal is stored in the memory.
16 . The method as claimed in claim 15 , furthermore comprising:
reading out the stored second bit signal from the memory, and
detecting an error in the first bit signal or an error in the second bit signal based on the read-out second bit signal.
17 . The method as claimed in claim 15 , wherein the first data bits and the at least one first check bit are a real subset of the bits of the first bit signal.
18 . The method as claimed in claim 15 , wherein the first data bits and the at least one first check bit are all bits of the first bit signal.
19 . The method as claimed in claim 15 , wherein the second data bits and the at least one second check bit are all bits of the second bit signal.
20 . The method as claimed in claim 15 , wherein the second data bits and the at least one second check bit are a real subset of the bits of the second bit signal.