DEVICE FOR ELECTRODE PLATE TESTING

1 . A device for electrode plate testing, characterized in that the device comprises:

a radiation mechanism, the radiation mechanism being configured to emit a ray to an electrode plate, wherein the ray is set along a width direction of the electrode plate so as to cover the electrode plate, and scan the electrode plate along a length direction of the electrode plate; and

a probe mechanism, the probe mechanism and the radiation mechanism being disposed opposite on two sides of the electrode plate, wherein the probe mechanism is configured to monitor a signal transmitted through the electrode plate, and the signal is used to test areal density of a material applied on a surface of the electrode plate.

2 . The device according to claim 1 , characterized in that the device further comprises a support frame, wherein the support frame is provided with a window, the window being perpendicular to the length direction, and on two opposite edges of the window, the probe mechanism and the radiation mechanism being respectively fixed with a spacing therebetween, so that the electrode plate passes between the radiation mechanism and the probe mechanism through the spacing.

3 . The device according to claim 2 , characterized in that the support frame is made of marble.

4 . The device according to claim 1 , characterized in that the radiation mechanism comprises:

a radiation source configured to generate the ray; and

a first housing, the first housing being configured to accommodate the radiation source, wherein an open window is provided on a surface of the first housing facing towards the probe mechanism, and the open window is configured to transmit the ray.

5 . The device according to claim 4 , characterized in that the radiation mechanism further comprises:

a first collimator, the first collimator being disposed between the radiation source and the electrode plate to collimate the ray emitted by the radiation source.

6 . The device according to claim 5 , characterized in that the first collimator comprises a plurality of baffles, the plurality of baffles being arranged along the width direction and perpendicular to the surface of the electrode plate.

7 . The device according to claim 4 , characterized in that a beam cross-section of the radiation source has sizes W1 and L1 in the width direction and the length direction, respectively, wherein 20 mm≤L1≤50 mm, and/or 200 mm≤W1≤1500 mm.

8 . The device according to claim 4 , characterized in that each baffle of the plurality of baffles in the first collimator has sizes d and H1 in the width direction and a thickness direction of the electrode plate, respectively, wherein 0.2 mm≤d≤1 mm, and/or 1 mm≤H1≤5 mm.

9 . The device according to claim 8 , characterized in that in the width direction, both the first baffle and the last baffle among the plurality of baffles are spaced apart from an edge of the open window by d/2, and/or in the length direction, both two ends of the plurality of baffles are spaced apart from the edge of the open window by d/2.

10 . The device according to claim 4 , characterized in that the probe mechanism comprises:

a probe array, the probe array comprising M rows×N columns of probes, wherein the M rows of probes are arranged in the width direction, and the N columns of probes are arranged in the length direction, wherein M and N are positive integers; and

a second housing, wherein the probe array is disposed on a wall of the second housing facing towards the radiation mechanism.

11 . The device according to claim 10 , characterized in that 1≤N≤10, and/or 5≤M≤150.

12 . The device according to claim 10 , characterized in that a spacing between two adjacent probes in the probe array is d, wherein 0.2 mm≤d≤1 mm.

13 . The device according to claim 10 , characterized in that the probe mechanism further comprises:

a second collimator, the second collimator being disposed between the electrode plate and the probe array to collimate the signal transmitted through the electrode plate.

14 . The device according to claim 13 , characterized in that the second collimator comprises a plurality of baffles, the plurality of baffles being arranged along the width direction and perpendicular to the surface of the electrode plate.

15 . The device according to claim 14 , characterized in that a distance between two adjacent baffles of the plurality of baffles in the second collimator is twice the distance between two adjacent baffles of the plurality of baffles in the first collimator.

16 . The device according to claim 10 , characterized in that a signal receiving window of each probe in the probe array has sizes W2 and L2 in the width direction and the length direction, respectively, wherein 1 mm≤W2≤20 mm, and/or 1 mm≤L2≤40 mm.

17 . The device according to claim 10 , characterized in that each baffle of the plurality of baffles in the second collimator has sizes d and H2 in the width direction and the thickness direction of the electrode plate, respectively, wherein 0.2 mm≤d≤1 mm, and/or 1 mm≤H2≤5 mm.

18 . The device according to claim 1 , characterized in that in the thickness direction of the electrode plate, a distance between the probe mechanism and the radiation mechanism is less than or equal to 15 mm.

19 . The device according to claim 1 , characterized in that the device further comprises a coating mechanism, wherein the coating mechanism is configured to coat the surface of the electrode plate with the material.

20 . The device according to claim 19 , characterized in that the coating mechanism comprises:

a coating roller configured to support the electrode plate; and

M coating heads, wherein the M coating heads are arranged in the width direction and disposed on a side of the coating roller farther away from the support frame, and the M coating heads are respectively connected to M outlets, wherein the coating heads are configured to deliver the material to the corresponding outlets, so that the material is applied on the surface of the electrode plate through the outlets.