IP Library › Patent Application 19067305
Patent Application
App. No. 19/067,305

DEVICES AND SYSTEMS FOR EXPERIMENTAL FORWARD MODEL INDEXING OF ELECTRON BACKSCATTER DIFFRACTION PATTERNS

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Patent No.
US None
App. No.
19/067,305
Abstract

A system may obtain a first experimental diffraction pattern. A system may identify a crystallographic orientation of the first experimental diffraction pattern. A system may create an experimental master pattern including at least a portion of the first experimental diffraction pattern. A system may generate a plurality of experimental indexing patterns based at least partially on the experimental master pattern. A system may forward model indexing a second experimental diffraction pattern with at least one experimental indexing pattern of the plurality of experimental indexing patterns.

Claims (22)

1 . A method for characterizing a material, the method comprising:

obtaining a first experimental diffraction pattern;

identifying a crystallographic orientation of the first experimental diffraction pattern;

creating an experimental master pattern including at least a portion of the first experimental diffraction pattern;

generating a plurality of experimental indexing patterns based at least partially on the experimental master pattern; and

forward model indexing a second experimental diffraction pattern with at least one experimental indexing pattern of the plurality of experimental indexing patterns.

2 . A method for characterizing a material, the method comprising:

obtaining a first experimental diffraction pattern;

determining at least one point of symmetry based at least partially on the first experimental diffraction pattern;

determining a crystallographic orientation of the experimental diffraction pattern based on a location and type of the at least one point of symmetry;

creating an experimental master pattern including at least a portion of the first experimental diffraction pattern based at least partially on a determined crystallographic orientation;

generating a plurality of experimental indexing patterns based at least partially on the experimental master pattern; and

forward model indexing a second experimental diffraction pattern with at least one experimental indexing pattern of the plurality of experimental indexing patterns.

3 . The method of claim 2 , further comprising determining at least a second point of symmetry based at least partially on the experimental master pattern; and

refining the experimental master pattern based at least partially on the second point of symmetry, and

wherein generating a plurality of experimental indexing patterns is based at least partially on the refined experimental master pattern.

4 . A method for characterizing a material, the method comprising:

obtaining a first experimental diffraction pattern;

identifying a crystallographic orientation of the first experimental diffraction pattern;

creating an experimental master pattern including at least a portion of the first experimental diffraction pattern;

generating at least one experimental simulated pattern based at least partially on the experimental master pattern; and

displaying the experimental simulated pattern on a display device.