ALPHA DIFFRACTOMETER
A diffractometer system includes an X-ray beam projector that projects an X-ray micro-beam at an analysis target, an X-ray receiver including an X-ray detector array to detect the transmitted X-ray beam passed through the object and X-rays that the target diffracts, and a computer workstation for system control and data analysis. The X-ray beam projector may include a radiation source, a beam forming system including at least one of a monochromator, a collimator, and focusing device. The computer workstation may control the X-ray devices and positioning mechanisms and motors, may acquire, process, store, or display data received from diffractometric examination, and may also calculate parameters of the three-dimensional reciprocal lattice of the analyzed target.
1 . A diffractometer comprising:
an X-ray beam projector positioned and aligned to direct an X-ray beam at a target to be examined; and
an X-ray receiver comprising an X-ray detector array positioned to detect the X-ray beam passed through the target;
wherein the X-ray beam projector comprises a radiation source and an apparatus forming an X-ray micro-beam;
wherein the X-ray detector array comprises pixels having different values of maximum permissible power density of X-ray radiation incident on one pixel; and
wherein the maximum permissible power density of each pixel is inversely proportional to a distance between the pixel and a central pixel of the X-ray detector array.
2 . The diffractometer of claim 1 , wherein the X-ray detector array is in a protective container that is vacuumed or filled with an inert gas.
3 . The diffractometer of claim 2 , wherein the inert gas is neon or helium.
4 . The diffractometer of claim 1 , wherein the X-ray receiver comprises 1) a mechanism for moving the X-ray detector array along a direction of the X-ray micro-beam that provides approximately a same resolution of diffraction measurements at diffraction angles less than 1 degree and approximately about 90 degrees, and 2) a device designed for excitation of transverse vibrations of a two-dimensional detector array in relation to the X-ray beam.
5 . The diffractometer of claim 4 , wherein the device designed for excitation of transverse vibrations employs a piezoelectric effect.
6 . The diffractometer of claim 4 , wherein an amplitude of the transverse vibrations of the two-dimensional detector array is not less than a pixel's pitch.
7 . The diffractometer of claim 4 , wherein a frequency of the transverse vibrations of the two-dimensional detector array is not more than a frame rate.
8 . The diffractometer of claim 4 , wherein the transverse vibrations of the two-dimensional detector array are carried out due to the excitement of a longitudinal surface acoustic wave.
9 . The diffractometer of claim 1 , wherein the radiation source is selected from an X-ray tube or an X-ray laser.
10 . The diffractometer of claim 1 , wherein the X-ray beam projector and the X-ray receiver are located at opposite ends of a C-arc, and the diffractometer further comprises a housing containing mechanisms and motors that move and rotate the C-arc in three mutually perpendicular planes around the target.
11 . The diffractometer of claim 10 , further comprising:
a computer;
wherein the computer executes a process controlling program that performs 3-D diffractometric data collection at different angles of rotation of the C-arc sequentially, and for each angle of rotation of the C-arc, a series of diffraction measurements is carried out with a change in distance from the target to a two-dimensional detector array.
12 . The diffractometer of claim 1 , wherein the X-ray beam projector further includes a Kratki or Montel mirror collimator.
13 . The diffractometer of claim 1 , wherein the X-ray beam projector further comprises an X-ray collimating mirror with a pair of X-ray mirrors that are arranged orthogonally relative to each other, wherein the X-ray mirrors are multilayer film mirrors.
14 . The diffractometer of claim 1 , wherein the X-ray detector array includes a plurality of detector elements each of which provides a signal upon receiving an X-ray photon.
15 . The diffractometer of claim 1 , further comprising a laser of visible light configured to direct a visible beam to point the X-ray micro-beam at selected points on the target.
16 . The diffractometer of claim 1 , wherein the X-ray beam projector and the X-ray receiver are mounted on telescoping arms.
17 . The diffractometer of claim 1 , wherein the pixels of the X-ray detector array are located in a central region of the X-ray detector array having a highest maximum permissible power density compared to the pixels located on a periphery of the X-ray detector array.
18 . The diffractometer of claim 1 , further comprising a device designed for excitation of transverse vibrations of the X-ray beam projector so that the X-ray micro-beam moves on the target parallel to itself.
19 . The diffractometer of claim 1 , wherein the X-ray beam projector and the X-ray receiver are mechanically autonomous elements and are interconnected by means of a computer via electrical interconnections including only wireless communications.
20 . The diffractometer of claim 1 , further comprising:
a computer that is intended for controlling the X-ray beam projector, the X-ray receiver, and mechanisms and motors, and for processing, storing and displaying data received from 3-D diffractometric structural analysis, and also for calculation of parameters of a three-dimensional reciprocal lattice of the target to be examined;
wherein:
the radiation source operates in continuous mode; and
the apparatus forming the X-ray micro-beam comprises a monochromator and a collimating and focusing optical device.