Optical element, optical element monitoring system and method, active light emitting module, and terminal
An optical element, an optical element monitoring system, and a method monitor in real time whether an optical element such as a diffractive optical element or a diffuser in an active light emitting module is damaged or falls off, and turn off a laser when the optical element is damaged or falls off.
1 . An apparatus, comprising:
a first conductive pad;
a second conductive pad;
a substrate comprising:
a diffractive element (DOR) or a diffuser; and
a portion directly between the first conductive pad and the second conductive pad, separating the first conductive pad and the second conductive pad, and configured to:
be disposed in a light emission direction of a laser; and
pass light from the laser;
a detection line between the first conductive pad and the second conductive pad, disposed on the portion, configured to transmit an electrical signal, extending in a wave line shape, and comprising:
a transparent conductive material;
first adjacent portions in the light emission direction and comprising at least two parallel straight-line portions;
second adjacent portions in the light emission direction; and
a width extending in the wave line shape and ranging from 1 micrometer (μm) to 30 μm;
a first gap in a first direction between the first adjacent portions and comprising a first size ranging from 1 μm to 30 μm, wherein the first size is the same throughout lengths of the at least two parallel straight-line portions; and
a second gap in a second direction between the second adjacent portions and comprising a second size ranging from 1 μm to 30 μm,
wherein the first direction and the second direction are different directions.
2 . The apparatus of claim 1 , wherein the transparent conductive material comprises indium tin oxide, indium zinc oxide, indium gallium zinc oxide, or indium tin zinc oxide.
3 . The apparatus of claim 1 , further comprising a microstructure layer, wherein the microstructure layer and the detection line are disposed either on a same side of the substrate or on opposite sides of the substrate.
4 . The apparatus of claim 1 , wherein the detection line further comprises an end part, wherein the first conductive pad, the second conductive pad, and the detection line are disposed on a same side of the substrate, and wherein at least one of the first conductive pad or the second conductive pad is electrically coupled to the end part.
5 . The apparatus of claim 4 , wherein the first conductive pad, the second conductive pad, and the detection line comprise a same material.
6 . The apparatus of claim 4 , further comprising a protective layer covering the detection line, wherein the protective layer comprises an opening that is disposed at the protective layer and that exposes the first conductive pad and the second conductive pad.
7 . The apparatus of claim 1 , wherein the first conductive pad and the second conductive pad are configured to be coupled to a processor for detecting the electrical signal.
8 . The apparatus of claim 1 , wherein the first gap and the second gap are the same size.
9 . An apparatus, comprising:
a housing comprising:
a bottom substrate; and
a side wall;
a laser mounted on the bottom substrate;
an optical element that is a component of a terminal, mounted at one end of the side wall and away from the bottom substrate, and comprising:
a first conductive pad;
a second conductive pad;
a substrate comprising:
a diffractive element (DOR) or a diffuser; and
a portion directly between the first conductive pad and the second conductive pad, separating the first conductive pad and the second conductive pad, and configured to:
be disposed in a light emission direction of the laser; and
pass light from the laser;
a detection line between the first conductive pad and the second conductive pad, disposed on the portion, configured to transmit an electrical signal, extending in a wave line shape, and comprising: a transparent conductive material;
two ends;
first adjacent portions in the light emission direction and comprising at least two parallel straight-line portions;
second adjacent portions in the light emission direction; and
a width extending in the wave line shape and ranging from 1 micrometer (μm) to 30 μm;
a first gap in a first direction between the first adjacent portions and comprising a first size ranging from 1 μm to 30 μm, wherein the first size is the same throughout lengths of the at least two parallel straight-line portions; and
a second gap in a second direction between the second adjacent portions and comprising a second size ranging from 1 μm to 30 μm, wherein the first direction and the second direction are different directions; and
conducting wires configured to connect the two ends to a processor.
10 . The apparatus of claim 9 , wherein the side wall comprises an inner surface and an outer surface, and wherein the conducting wires are configured to extend from the two ends to the processor inside the side wall, on the inner surface, or on the outer surface.
11 . The apparatus of claim 9 , further comprising:
a joint between one of the two ends and one of the conducting wires; and
a conductive electrode disposed at the joint and configured to electrically connect the detection line and the one of the conducting wires.
12 . The apparatus of claim 11 , wherein a material of the conductive electrode is conductive silver paste or soldering tin.
13 . An apparatus, comprising:
a processor;
a power supply coupled to the processor;
a laser coupled to the power supply; and
an optical element comprising:
a first conductive pad;
a second conductive pad;
a substrate comprising a portion that is directly between the first conductive pad and the second conductive pad, that separates the first conductive pad and the second conductive pad, and that is configured to:
be disposed in a light emission direction of the laser; and
pass light from the laser;
a detection line between the first conductive pad and the second conductive pad, disposed on the portion, configured to transmit an electrical signal, extending in a wave line shape, and comprising:
a transparent conductive material;
first adjacent portions in the light emission direction and comprising at least two parallel straight-line portions;
second adjacent portions in the light emission direction; and
a width extending in the wave line shape and ranging from 1 micrometer (μm) to 30 μm;
a first gap in a first direction between the first adjacent portions and comprising a first size ranging from 1 μm to 30 μm, wherein the first size is the same throughout lengths of the at least two parallel straight-line portions;
a second gap in a second direction between the second adjacent portions and comprising a second size ranging from 1 μm to 30 μm; and
two ends connected to the processor.
14 . The apparatus of claim 13 , wherein the optical element further comprises a microstructure layer, and wherein the microstructure layer and the detection line are disposed on a same side of the substrate.
15 . The apparatus of claim 13 , wherein the optical element further comprises a microstructure layer, and wherein the microstructure layer and the detection line are disposed on opposite sides of the substrate.
16 . The apparatus of claim 13 , wherein the substrate further comprises a diffractive optical element (DOE) or a diffuser, and wherein the optical element is a component of a terminal.
17 . The apparatus of claim 16 , wherein the detection line is configured to detect whether the DOE or the diffuser is damaged or falls off.
18 . The apparatus of claim 13 , wherein the transparent conductive material comprises indium tin oxide, indium zinc oxide, indium gallium zinc oxide, or indium tin zinc oxide.
19 . The apparatus of claim 13 , wherein the width is the same on the portion.