IP Library › Granted Patent US 781,424
Granted Patent S1
US 781,424 · App. 29/529,941 · Granted Mar 14, 2017

Fluorescent X-ray coating thickness gauge

Inventors: Ai Masuda (Tokyo, JP); Hiroyuki Noda (Tokyo, JP); Toshiyuki Takahara (Tokyo, JP); Ryouei Nozawa (Tokyo, JP); Isao Yagi (Tokyo, JP)
Assignee: Hitachi High-Tech Science Corporation
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Quick Facts
Patent No.
US 781,424
App. No.
29/529,941
Granted
Mar 14, 2017
Kind
S1
Claims (1)

The ornamental design for a fluorescent x-ray coating thickness gauge, as shown and described.

Assignments (2)
CHANGE OF NAME Recorded Jun 6, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 071510/0296 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 17, 2015
From: MASUDA, AI; NODA, HIROYUKI; TAKAHARA, TOSHIYUKI; NOZAWA, RYOUEI; YAGI, ISAO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 036118/0485 →
Priority Claims (1)
JP 2014-027855 · Dec 12, 2014 · national