IP Library › Granted Patent US 872,603
Granted Patent S1
US 872,603 · App. 29/663,658 · Granted Jan 14, 2020

Analysis device

Inventor: Shinya Fushida (Tokyo, JP)
Assignee: Satake Corporation
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Quick Facts
Patent No.
US 872,603
App. No.
29/663,658
Granted
Jan 14, 2020
Kind
S1
Claims (1)

The ornamental design for an analysis device, as shown and described.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 7, 2025
From: SATAKE CORPORATION
To: TECHNOS MIHARA CORPORATION
Reel/Frame 072490/0783 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2018
From: FUSHIDA, SHINYA
To: SATAKE CORPORATION
Reel/Frame 047693/0978 →
Priority Claims (1)
JP 2018-006015 · Mar 22, 2018 · national