IP Library › Granted Patent US 1,033,673
Granted Patent S1
US 1,033,673 · App. 29/805,373 · Granted Jul 2, 2024

Sample testing apparatus

Inventors: Fumie Shibata (Tokyo, JP); Masayuki Seki (Kobe, JP); Noriyuki Nakanishi (Kobe, JP)
Assignee: SYSMEX CORPORATION
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Quick Facts
Patent No.
US 1,033,673
App. No.
29/805,373
Granted
Jul 2, 2024
Kind
S1
Claims (1)

The ornamental design for a sample testing apparatus, as shown and described.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2024
From: SHIBATA, FUMIE; SEKI, MASAYUKI; NAKANISHI, NORIYUKI
To: SYSMEX CORPORATION
Reel/Frame 067240/0587 →
Priority Claims (1)
JP 2021-003995 D · Feb 26, 2021 · national