IP Library › Granted Patent US 1,054,882
Granted Patent S1
US 1,054,882 · App. 29/834,611 · Granted Dec 24, 2024

Particle measurement device

Inventors: Young-Hoon Kim (Gyeonggi-do, KR); Su-Yeon Oh (Gyeonggi-do, KR); Min Ju Lee (Gyeonggi-do, KR); Seung Pil Han (Jeollabuk-do, KR)
Assignee: DONGWOO FINE-CHEM CO., LTD.
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Quick Facts
Patent No.
US 1,054,882
App. No.
29/834,611
Granted
Dec 24, 2024
Kind
S1
Claims (1)

The ornamental design for a particle measurement device, as shown and described herein.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 13, 2022
From: KIM, YOUNG-HOON; OH, SU-YEON; LEE, MIN JU; HAN, SEUNG PIL
To: DONGWOO FINE-CHEM CO., LTD.
Reel/Frame 059584/0608 →
Priority Claims (1)
KR 30-2021-0056224 · Nov 24, 2021 · national