IP Library › Granted Patent US 1,024,815
Granted Patent S1
US 1,024,815 · App. 29/836,243 · Granted Apr 30, 2024

Probe for measuring electrical characteristics

Inventor: Masafumi Okuma (Tokyo, JP)
Assignee: OKINS ELECTRONICS CO., LTD.
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Quick Facts
Patent No.
US 1,024,815
App. No.
29/836,243
Granted
Apr 30, 2024
Kind
S1
Claims (1)

The ornamental design for a probe for measuring electrical characteristics, as shown and described.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2022
From: OKUMA, MASAFUMI
To: OKINS ELECTRONICS CO., LTD.
Reel/Frame 059763/0012 →
Priority Claims (1)
JP 2021-024968 D · Nov 15, 2021 · national