IP Library › Granted Patent US 1,064,874
Granted Patent S1
US 1,064,874 · App. 29/875,281 · Granted Mar 4, 2025

Electrical test device

Inventor: Ginger M. Woo (Shoreline, WA)
Assignee: Fluke Corporation
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Quick Facts
Patent No.
US 1,064,874
App. No.
29/875,281
Granted
Mar 4, 2025
Kind
S1
Claims (1)

The ornamental design for an electrical test device as shown and described.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 17, 2023
From: WOO, GINGER M.
To: FLUKE CORPORATION
Reel/Frame 064627/0641 →
References Cited (11)
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