Granted Patent
S1
US 1,108,988 · App. 29/950,402 · Granted Jan 13, 2026
Apparatus for measuring light scattering of a sample
Inventors:
Sigrid C. Kuebler (Old Orchard Beach, ME); Ross E. Bryant (Cape Elizabeth, ME); Shiladitya Sen (Goleta, CA); Ryan Olson (Goleta, CA); Nicholas Wong (Santa Barbara, CA); Marco Vanella (Santa Barbara, CA); Ryan Thomas (Santa Barbara, CA); Patrick Tufts (Santa Barbara, CA); Jared Naito (Santa Barbara, CA)
Assignee:
Wyatt Technology, LLC
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Claims (1)
The ornamental design for an apparatus for measuring light scattering of a sample, as shown and described.
Assignments (2)
CHANGE OF NAME
Recorded Aug 1, 2024
From: WYATT TECHNOLOGY CORPORATION
To: WYATT TECHNOLOGY, LLC
Reel/Frame 068274/0450 →
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded Jul 30, 2024
From: KUEBLER, SIGRID C.; BRYANT, ROSS E.; SEN, SHILADITYA; OLSON, RYAN; WONG, NICHOLAS; VANELLA, MARCO; THOMAS, RYAN; TUFTS, PATRICK; NAITO, JARED
To: WYATT TECHNOLOGY CORPORATION
Reel/Frame 068129/0227 →
Continuity (2)
Division
29919639
· Dec 5, 2023
References Cited (11)
US 20040004717A1
· Reed
· 2004
[cited by applicant]
CN 2677970Y
· 2005
[cited by applicant]