IP Library › Patent Application 60278548
Patent Application Provisional
App. No. 60/278,548 · Confirmation No. 7153

Method of detecting ion implant dose of a semiconductor wafer

Provisional Application Expired
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 Code Description Pages PDF
2001-03-23 TRNA Transmittal of New Application 2 View
2001-03-23 SPEC Specification 8 View
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Quick Facts
App. No.
60/278,548
Filed
2001-03-23