Patent Application
Provisional
App. No. 60/312,793
· Confirmation No. 1458
System and method to screen defect related reliability failures in CMOS SRAMS
Provisional Application Expired
Inventors
Surya Bhattacharya
Irvine, CA
Vincent Chen
Newport Coast, CA
Jay Shiau
Irvine, CA
Liming Tsau
Irvine, CA
Henry Chen
Irvine, CA
Attorneys & Agents of Record
Prosecution
- Customer No.
- 26111
- Docket No.
- 1875.0330000
- Confirmation No.
- 1458
No recorded assignments were found for this patent.
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Quick Facts
- App. No.
- 60/312,793
- Filed
- 2001-08-17
External Links