IP Library › Patent Application 60353961
Patent Application Provisional Small
App. No. 60/353,961 · Confirmation No. 2679

Circuit and method for determining location of defect in an open circuit

Inventor: Stephen K. Sunter
Provisional Application Expired
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 Code Description Pages PDF
2002-02-05 TRNA Transmittal of New Application 1 View
2002-02-05 SPEC Specification 8 View
2002-02-05 ABST Abstract 1 View
2002-02-05 DRW Drawings-only black and white line drawings 5 View
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Quick Facts
App. No.
60/353,961
Filed
2002-02-05