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App. No. 10/162,916 · Confirmation No. 8197

CIRCUIT AND METHOD FOR DETERMINING THE LOCATION OF DEFECT IN A CIRCUIT

Inventor: Stephen K. Sunter
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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 Code Description Pages PDF
2010-04-22 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
2010-04-22 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
2004-01-26 A.NA Amendment after Notice of Allowance (Rule 312) 2 View
2004-01-26 SPEC Specification 1 View
2004-01-26 REM Applicant Arguments/Remarks Made in an Amendment 1 View
2003-11-28 IFEE Issue Fee Payment (PTO-85B) 2 View
2003-07-17 IDS Information Disclosure Statement (IDS) Form (SB08) 4 View
2002-06-06 TRNA Transmittal of New Application 2 View
2002-06-06 SPEC Specification 9 View
2002-06-06 CLM Claims 5 View
2002-06-06 ABST Abstract 1 View
2002-06-06 DRW Drawings-only black and white line drawings 5 View
2002-06-06 OATH Oath or Declaration filed 2 View
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Quick Facts
App. No.
10/162,916
Filed
2002-06-06
Granted
2004-04-06
Pub. No.
US20030146763A1
Art Unit
2133
PTA
-36 days