IP Library › Patent Application 60462312
Patent Application Provisional Small
App. No. 60/462,312 · Confirmation No. 1365

Wafer-level tester with magnet to test latching micro-magnetic switches

Inventors: Cheng Ping Wei, Jun Shen
Provisional Application Expired
⬇ PDF
 Code Description Pages PDF
2003-04-14 TRNA Transmittal of New Application 4 View
2003-04-14 ADS Application Data Sheet 1 View
2003-04-14 SPEC Specification 33 View
2003-04-14 CLM Claims 12 View
2003-04-14 ABST Abstract 1 View
2003-04-14 DRW Drawings-only black and white line drawings 16 View
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Quick Facts
App. No.
60/462,312
Filed
2003-04-14