IP Library Patent Application 61208782
Patent Application Provisional Small
App. No. 61/208,782 · Confirmation No. 4322

Systems for assessing and enhancing the performance of scanning probe microscopes by quantifying and enforcing periodicities and symmetries in two dimensions

Inventor: Peter Moeck
Provisional Application Expired
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Code Description Pages PDF
2009-04-13 APP.FILE.REC Filing Receipt 3 View
2009-02-27 TRNA Transmittal of New Application 4 View
2009-02-27 ADS Application Data Sheet 3 View
2009-02-27 SPEC Specification 19 View
2009-02-27 ABST Abstract 1 View
2009-02-27 APPENDIX Appendix to the specification 2 View
2009-02-27 APPENDIX Appendix to the specification 5 View
2009-02-27 APPENDIX Appendix to the specification 15 View
2009-02-27 DRW Drawings-only black and white line drawings 2 View
2009-02-27 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
61/208,782
Filed
2009-02-27