IP Library Patent Application 61869434
Patent Application Provisional
App. No. 61/869,434 · Confirmation No. 4707

Multi-Model Metrology High Number of Critical Parameter Determination Method for Semiconductor Devices

Provisional Application Expired
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Code Description Pages PDF
2013-11-13 APP.FILE.REC Filing Receipt 3 View
2013-10-31 PEFR Applicant Response to Pre-Exam Formalities Notice 1 View
2013-10-31 TR.PROV Provisional Cover Sheet (SB16) 4 View
2013-10-31 WFEE Fee Worksheet (SB06) 2 View
2013-10-31 N417 Electronic Filing System Acknowledgment Receipt 2 View
2013-08-30 NTC.MISS.PRT Notice to File Missing Parts 2 View
2013-08-30 APP.FILE.REC Filing Receipt 3 View
2013-08-23 TR.PROV Provisional Cover Sheet (SB16) 4 View
2013-08-23 SPEC Specification 13 View
2013-08-23 N417 Electronic Filing System Acknowledgment Receipt 2 View
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Quick Facts
App. No.
61/869,434
Filed
2013-08-23