IP Library › Patent Application 62311318
Patent Application Provisional Small
App. No. 62/311,318 · Confirmation No. 9655

LAYER-BASED DEFECT DETECTION USING NORMALIZED OFF-AXIS SENSOR DATA

Applicant: Sigma Labs, Inc.
Provisional Application Expired
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 Code Description Pages PDF
2024-03-07 N572 Response - Re: Informal Power of Attorney (PTOL-308) 1 View
2024-02-29 N417 Electronic Filing System Acknowledgment Receipt 2 View
2024-02-29 PA.. Power of Attorney 3 View
2024-02-29 R3.73 Assignee showing of ownership per 37 CFR 3.73 3 View
2024-02-15 N572 Response - Re: Informal Power of Attorney (PTOL-308) 1 View
2024-02-09 PA.. Power of Attorney 3 View
2024-02-09 N417 Electronic Filing System Acknowledgment Receipt 2 View
2016-04-06 APP.FILE.REC Filing Receipt 3 View
2016-03-21 SPEC Specification 15 View
2016-03-21 CLM Claims 1 View
2016-03-21 ABST Abstract 1 View
2016-03-21 DRW Drawings-only black and white line drawings 13 View
2016-03-21 ADS Application Data Sheet 8 View
2016-03-21 WFEE Fee Worksheet (SB06) 2 View
2016-03-21 N417 Electronic Filing System Acknowledgment Receipt 3 View
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Quick Facts
App. No.
62/311,318
Filed
2016-03-21