IP Library › Granted Patent US 637,098
Granted Patent S1
US 637,098 · App. 29/360,394 · Granted May 3, 2011

Semiconductor testing machine

Assignee: Hitachi High-Technologies Corporation
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Quick Facts
Patent No.
US 637,098
App. No.
29/360,394
Granted
May 3, 2011
Kind
S1
Claims (1)

The ornamental design for a semiconductor testing machine, as shown.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2010
From: OONUMA, MITSURU; OMACHI, AKIRA; NISHIYAMA, KAZUHIKO; SUZUKI, HIROYUKI; NARA, YASUHIKO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 024284/0749 →
Priority Claims (1)
JP 2009-025480 · Oct 30, 2009 · national