IP Library › Granted Patent US 644,258
Granted Patent S1
US 644,258 · App. 29/366,707 · Granted Aug 30, 2011

Electron microscope

Assignee: Hitachi High-Technologies Corporation
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Quick Facts
Patent No.
US 644,258
App. No.
29/366,707
Granted
Aug 30, 2011
Kind
S1
Claims (1)

We claim the ornamental design for an electron microscope, as shown and described.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 29, 2010
From: NODA, HIROYUKI; OONUMA, MITSURU; OMACHI, AKIRA; NEMOTO, MASAHIRO; SASAGAWA, KIYOSHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 024758/0459 →
Priority Claims (1)
JP 2010-004042 · Feb 22, 2010 · national