IP Library › Granted Patent US 684,274
Granted Patent S1
US 684,274 · App. 29/411,276 · Granted Jun 11, 2013

Sample holder for an electron microscope

Inventors: Kotaro Hosoya (Hitachinaka, JP); Yoshihiro Takahoko (Hitachinaka, JP)
Assignee: Hitachi High-Technologies Corporation
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Quick Facts
Patent No.
US 684,274
App. No.
29/411,276
Granted
Jun 11, 2013
Kind
S1
Claims (1)

The ornamental design for a sample holder for an electron microscope, as shown and described.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 19, 2012
From: HOSOYA, KOTARO; TAKAHOKO, YOSHIHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 027557/0091 →
Priority Claims (1)
JP 2011-022529 · Sep 30, 2011 · national