IP Library › Granted Patent US 687,475
Granted Patent S1
US 687,475 · App. 29/431,888 · Granted Aug 6, 2013

Electron microscope

Inventors: Mitsuru Oonuma (Tokyo, JP); Akira Omachi (Komae, JP); Junichi Katane (Naka, JP); Mitsuo Akatsu (Hitachinaka, JP); Hiroyuki Komuro (Hitachinaka, JP); Tomoyasu Hirashima (Yokohama, JP)
Assignee: Hitachi High-Technologies Corporation
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Quick Facts
Patent No.
US 687,475
App. No.
29/431,888
Granted
Aug 6, 2013
Kind
S1
Claims (1)

We claim the ornamental design for an electron microscope, as shown and described.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 12, 2012
From: OONUMA, MITSURU; OMACHI, AKIRA; KATANE, JUNICHI; AKATSU, MITSUO; KOMURO, HIROYUKI; HIRASHIMA, TOMOYASU
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 028940/0056 →
Priority Claims (1)
JP 2012-010805 · May 10, 2012 · national