IP Library Granted Patent US 6,888,674
Granted Patent B1
US 6,888,674 · App. 09/881,062 · Granted May 3, 2005

Arrangement for examining microscopic preparations with a scanning microscope, and illumination device for a scanning microscope

Assignee: Leica Microsystems Heidelberg GmbH
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Quick Facts
Patent No.
US 6,888,674
App. No.
09/881,062
Granted
May 3, 2005
Kind
B1
Abstract

The arrangement for examining microscope preparations with a scanning microscope comprises a laser ( 1 ) and an optical means ( 12 ) which images the light generated by the laser ( 1 ) onto a specimen ( 13 ) that is to be examined. Provided between the laser ( 1 ) and the optical means ( 12 ) is an optical component ( 3, 20 ) that spectrally spreads, with a single pass, the light generated by the laser ( 1 ). The optical component ( 3, 20 ) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber ( 20 ).

Claims (52)

1. A scanning microscope comprising:

a laser configured to generate light having a wavelength range;

an optical means for imaging light generated by the laser onto a specimen; and

an optical component positioned between the laser and the optical means,

wherein the light generated by the laser passes through the optical component, and

wherein the optical component is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range.

2. The scanning microscope as defined in claim 1 , wherein the optical component is photonic band-gap material.

3. The scanning microscope as defined in claim 2 , wherein the photonic band-gap material is configured as a light-guiding fiber.

4. The scanning microscope as defined in claim 1 , wherein the optical component is configured as a tapered light-guiding fiber.

5. The scanning microscope as defined in claim 1 , wherein the laser is a pulsed laser.

6. The scanning microscope as defined in claim 1 , wherein means for attenuating at least a portion of at least one wavelength of the light emerging from the optical component is arranged after the optical component.

7. The scanning microscope as defined in claim 6 , wherein the means for attenuating comprises at least one of a spectrally selective filter, a dichroic filter, an acoustooptical tunable filter (AOTF), acoustooptical deflector (AOD), and an LCD attenuator.

8. The scanning microscope as defined in claim 1 , further comprising:

means for light output stabilization configured as a control loop.

9. A confocal scanning microscope comprising:

a laser configured to generate light having a wavelength range;

an optical means for imaging light generated by the laser onto a specimen;

a detector configured to receive light from the specimen; and

an optical component positioned between the laser and the optical means,

wherein the light generated by the laser passes through the optical component,

wherein the optical component is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range, and

wherein the optical component comprises an illumination pinhole through which the specimen is illuminated by the light emerging from the optical component.

10. The confocal scanning microscope as defined in claim 9 , wherein the optical component is photonic band-gap material.

11. The scanning microscope as defined in claim 10 , wherein the photonic band-gap material is configured as a light-guiding fiber.

12. The confocal scanning microscope as defined in claim 11 , wherein the light-guiding fiber defines an exit end which serves as the illumination pinhole.

13. The confocal scanning microscope as defined in claim 9 , wherein the optical component is configured as a tapered light-guiding fiber.

14. The confocal scanning microscope as defined in claim 13 , wherein the tapered light-guiding fiber defines an exit end which serves as the illumination pinhole.

15. The confocal scanning microscope as defined in claim 9 , wherein the laser is a pulsed laser.

16. The confocal scanning microscope as defined in claim 9 , wherein means for attenuating at least a portion of at least one wavelength of the light emerging from the optical component is arranged after the optical component.

17. The confocal scanning microscope as defined in claim 16 , wherein the means for attenuating comprises at least one of a spectrally selective filter, a dichroic filter, an acoustooptical tunable filter (AOTF), acoustooptical deflector (AOD), and an LCD attenuator.

18. The confocal scanning microscope as defined in claim 9 , further comprising: means for light output stabilization configured as a control loop.

19. A scanning microscope comprising:

a pulsed laser configured to generate light having a wavelength range;

an optical means for imaging light generated by the pulsed laser onto a specimen; and

a light-guiding fiber, made of photonic band-gap material, positioned between the pulsed laser and the optical means,

wherein the light generated by the pulsed laser passes through the light-guiding fiber, and

wherein the light-guiding fiber is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range.

20. The scanning microscope as defined in claim 19 , wherein the scanning microscope is a confocal scanning microscope.

21. A scanning microscope comprising:

a pulsed laser configured to generate light having a wavelength range;

an optical means for imaging light generated by the pulsed laser onto a specimen;

an optical component positioned between the pulsed laser and the optical means, wherein the light generated by the pulsed laser passes through the optical component, and wherein the optical component is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range; and

means arranged after the optical component for attenuating at least a portion of at least one wavelength of the light emerging from the optical component.

22. The scanning microscope as defined in claim 21 , wherein the optical component is photonic band-gap material.

23. The scanning microscope as defined in claim 22 , wherein the photonic band-gap material is configured as a light-guiding fiber.

24. The scanning microscope as defined in claim 21 , wherein the optical component is configured as a tapered light-guiding fiber.

25. A scanning microscope comprising:

a laser configured to generate light having a wavelength range;

an imaging optics configured to image light generated by the laser onto a specimen; and

an optical component positioned between the laser and the imaging optics,

wherein the light generated by the laser passes through the optical component, and

wherein the optical component is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range.

Assignments (2)
CHANGE OF NAME Recorded Dec 13, 2011
From: LEICA MICROSYSTEMS HEIDELBERG GMBH
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 027375/0611 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 26, 2001
From: BIRK, HOLGER; STORZ, RAFAEL
To: LEICA MICROSYSTEMS HEIDELBERG GMBH
Reel/Frame 012206/0765 →
Priority Claims (2)
DE 100 30 013 · Jun 17, 2000 · national
DE 101 15 509 · Mar 29, 2001 · national